Various embodiments of methods and systems of proactive monitoring of LED lights are described herein. An LED light monitoring system may include a specification database of LED lamps and drivers, a usage database that records the usage of LED lamps and drivers, a data acquisition subsystem that obtains the identity and the usage data of LED lamps or drivers in use, and a data processing subsystem that calculates, for each LED lamp, its current lumen output statistically and, for each LED driver, its remaining lifetime, and provides replacement recommendations for LED lamps and drivers.

Various embodiments of methods and systems of proactive monitoring of LED lights are described herein. An LED light monitoring system may include a specification database of LED lamps and drivers, a usage database that records the usage of LED lamps and drivers, a data acquisition subsystem that obtains the identity and the usage data of LED lamps or drivers in use, and a data processing subsystem that calculates, for each LED lamp, its current lumen output statistically and, for each LED driver, its remaining lifetime, and provides replacement recommendations for LED lamps and drivers.

A test structure of a display panel is provided. The test structure is within a buffer display region which is between a display region and a non-display region of the display panel and includes a substrate, at least one signal line on the substrate, an insulation layer covering the signal line, a planar layer on the insulation layer, and an electrode layer on the planar layer. The planar layer has at least one opening exposing a portion of the insulation layer. The electrode layer has a display electrode portion on the planar layer, at least one test electrode portion connecting the insulation layer via the opening and electrically insulated from the signal line, and at least one ring-shaped trench surrounding the test electrode portion and exposing a portion of the planar layer. The display electrode portion surrounds the ring-shaped trench and is electrically insulated from the test electrode portion.

A test structure of a display panel is provided. The test structure is within a buffer display region which is between a display region and a non-display region of the display panel and includes a substrate, at least one signal line on the substrate, an insulation layer covering the signal line, a planar layer on the insulation layer, and an electrode layer on the planar layer. The planar layer has at least one opening exposing a portion of the insulation layer. The electrode layer has a display electrode portion on the planar layer, at least one test electrode portion connecting the insulation layer via the opening and electrically insulated from the signal line, and at least one ring-shaped trench surrounding the test electrode portion and exposing a portion of the planar layer. The display electrode portion surrounds the ring-shaped trench and is electrically insulated from the test electrode portion.

Provided is a non-destructive method for detecting lithium plating by which lithium plating can be detected in real time in an actual use environment of a secondary battery, a secondary battery charging method and apparatus for charging a secondary battery under the condition in which lithium plating does not occur by using this method, and a secondary battery system for detecting the state of a secondary battery by using this method. The method for detecting lithium plating according to the present disclosure is a method which detects lithium plating in a negative electrode in real time by observing a change in battery voltage as a function of SOC during charging a secondary battery, and determines a point at which a rise speed of the battery voltage slows down as a lithium plating occurrence point.

A testing apparatus includes a plate unit including at least one chip mounting unit on which a light emitting diode (LED) to be tested is mounted. The chip mounting unit has a first region in which the LED is overlaid and a second region surrounding the first region. The first and second electrode pads are disposed in the first region and include respective extension portions extended toward the second region. A probe portion is configured to connect to the extension portions of the first and second electrode pads. A power control unit is configured to selectively apply test power to the LED through the probe portion. A light measuring unit is configured to measure light properties of light emitted by the LED.

A testing apparatus includes a plate unit including at least one chip mounting unit on which a light emitting diode (LED) to be tested is mounted. The chip mounting unit has a first region in which the LED is overlaid and a second region surrounding the first region. The first and second electrode pads are disposed in the first region and include respective extension portions extended toward the second region. A probe portion is configured to connect to the extension portions of the first and second electrode pads. A power control unit is configured to selectively apply test power to the LED through the probe portion. A light measuring unit is configured to measure light properties of light emitted by the LED.

This specification relates to a method and a system for detecting light emitting diode (LED) short circuit in a plurality of LED strings or detecting matching among the plurality of LED strings, wherein one end of each of the plurality of LED strings is connected to a same output end of a power supply, and the other end is respectively connected to a corresponding switch. According to the present invention, first current of each of LED strings is obtained when the output end of the power supply outputs a first voltage; differences between the minimum of the first currents of LED strings and other first currents are calculated; the differences are compared with a comparing threshold; it is determined that the LED strings corresponding to the other currents for which differences are larger than the comparing threshold include short circuit or mismatch with the LED string corresponding to the minimum current. Accordingly, it is possible to reduce the number of pins and area of a control chip.

This specification relates to a method and a system for detecting light emitting diode (LED) short circuit in a plurality of LED strings or detecting matching among the plurality of LED strings, wherein one end of each of the plurality of LED strings is connected to a same output end of a power supply, and the other end is respectively connected to a corresponding switch. According to the present invention, first current of each of LED strings is obtained when the output end of the power supply outputs a first voltage; differences between the minimum of the first currents of LED strings and other first currents are calculated; the differences are compared with a comparing threshold; it is determined that the LED strings corresponding to the other currents for which differences are larger than the comparing threshold include short circuit or mismatch with the LED string corresponding to the minimum current. Accordingly, it is possible to reduce the number of pins and area of a control chip.

One embodiment describes a three-phase electromechanical switching device, which includes three single-phase switching devices mechanically and electrically coupled in parallel with one another, each single-phase switching device including a direct current electromagnetic operator that in operation receives a direct current control signal for switching of the device, stationary contacts disposed in a respective device housing, and a movable assembly that in operation is displaced by energizing the operator and that include movable contacts that open and close, with the stationary contacts, a single current carrying path through the respective single-phase switching device; in which each of the single-phase switching devices receives control signals from control circuitry coupled to the operators of the respective single-phase switching devices to cause at least one of the single-phase switching devices to open or close the single current carrying path at a desired time coordinated with a current zero-crossing or a predicted current zero-crossing of a phase of three-phase power.