A controller configured to detect fault conditions in a circuit that operates an electrical-load includes a gate-driver and a voltage-detector. The gate-driver is configured to control a gate-current to a switching-device. The gate-current is controlled such that the switching-device is operated in a linear-state when the switching-device transitions from an on-state to an off-state. The voltage-detector is configured to determine a voltage-drop across the switching-device. The controller is configured to indicate a no-fault condition when the voltage-drop is greater than a voltage-threshold for more time than a no-fault interval after the switching device is operated from the on-state to the linear-state.

A heat source position inside a measurement object is identified with high accuracy by improving time resolution.

An analysis system according to the present invention is an analysis system that identifies a heat source position inside a measurement object, and includes a condition setting unit that sets a measurement point for one surface of the measurement object, a tester that applies a stimulation signal to the measurement object, a light source that irradiates the measurement point of the measurement object with light, a photo detector that detects light reflected from a predetermined measurement point on the surface of the measurement object according to the irradiation of light and outputs a detection signal, and an analysis unit that derives a distance from the measurement point to the heat source position based on the detection signal and the stimulation signal and identifies the heat source position.

An abnormality detection device includes: a coupling-capacitor having a first-end and a second-end coupled with a high-voltage circuit; a signal output unit; a signal extraction unit; and a signal input unit. The signal output unit is coupled with the first-end of the coupling-capacitor via a detection-resistor, and outputs an alternating-current inspection-signal. The signal extraction unit extracts the inspection-signal, as an extraction-signal, output between the detection-resistor and the coupling-capacitor. The signal input unit detects abnormality of insulation resistance of the high-voltage circuit based on a level of the inputted extraction-signal. The signal extraction unit includes a signal removing filter and a subtraction circuit. The filter removes a signal equal in frequency to the inspection-signal and passes low-frequency noises lower in frequency than the inspection-signal. The subtraction circuit outputs a differential signal, as the extraction-signal, between a signal having passed through the filter and a signal not having passed through the filter.

Fault detection techniques for control of sensor systems. A sensor control integrated circuit (“IC”) may include a fault detection system for coupling to the sensor supply lines. The system may detect faults for each of the sensor supply lines. The fault detection system may level shift sensor supply line signals from a first voltage domain to a second voltage domain appropriate for the fault detection system of the controller IC. The fault detection system may level shift source potential voltages from the first voltage domain to the second voltage domain to detect predetermined fault types. The fault detection system may compare the second domain voltages from the sensor supply lines to voltages representing predetermined fault types and may generate fault status indicators based on the comparison.

A current measurement apparatus comprises: a capacitor connected in parallel to a signal terminal of a device under test (DUT); a test pattern generation apparatus generating a test pattern to operate the DUT; and a measurement module connected to one end of the capacitor. The measurement module comprises: an input/output (I/O) buffer increasing or reducing an amount of charges of the capacitor and outputting a signal corresponding to an output logic value according to a voltage of the one end of the capacitor; a time measurer measuring an arrival time which it takes for the voltage of the one end of the capacitor to reach a second voltage from a first voltage; and a controller controlling the i/o buffer and the time measurer to measure the arrival time and controlling such that a value of a current related to an inspection of a DUT is measured using the arrival time.

A current measurement apparatus comprises: a capacitor connected in parallel to a signal terminal of a device under test (DUT); a test pattern generation apparatus generating a test pattern to operate the DUT; and a measurement module connected to one end of the capacitor. The measurement module comprises: an input/output (I/O) buffer increasing or reducing an amount of charges of the capacitor and outputting a signal corresponding to an output logic value according to a voltage of the one end of the capacitor; a time measurer measuring an arrival time which it takes for the voltage of the one end of the capacitor to reach a second voltage from a first voltage; and a controller controlling the i/o buffer and the time measurer to measure the arrival time and controlling such that a value of a current related to an inspection of a DUT is measured using the arrival time.

This disclosure describes techniques for separately determining isolation resistances from nodes of a power system of an electric vehicle (EV) to a chassis of the EV. Processing circuitry may determine a first isolation resistance between a first node of the power system in the EV and a chassis of the EV, determine a second isolation resistance between a second node of the power system in the EV and the chassis of the EV, determine that the first isolation resistance or the second isolation resistance is less than a threshold resistance, and output information based on the determination that the first isolation resistance or the second isolation resistance is less than the threshold resistance.

This disclosure describes techniques for separately determining isolation resistances from nodes of a power system of an electric vehicle (EV) to a chassis of the EV. Processing circuitry may determine a first isolation resistance between a first node of the power system in the EV and a chassis of the EV, determine a second isolation resistance between a second node of the power system in the EV and the chassis of the EV, determine that the first isolation resistance or the second isolation resistance is less than a threshold resistance, and output information based on the determination that the first isolation resistance or the second isolation resistance is less than the threshold resistance.

A high voltage power monitoring system includes a controller, a detector connected to the controller, and a generator connected to the detector and the controller. The generator may be configured to generate a plurality of test signals according to control signals generated via the controller. The generator may provide the test signals to the detector. The detector may be configured to provide the plurality of test signals to a test loop. The detector may be configured to simultaneously sense a first voltage, a second voltage, a first current, and a second current. The first voltage and the first current may correspond to a first test signal of the plurality of test signals. The second voltage and the second current may correspond to a returned version of the first test signal that has passed through the test loop.

The present disclosure relates to a method for monitoring an on-board electrical system of a vehicle having at least one distributor and a load that are connected together via a cable. In one implementation, the method includes reading in a sequence of data for a number of parameters representing information about operation of the vehicle by a driver and/or about a state of the vehicle and/or a state of the driver and/or a driving environment; classifying the data as a normal value or an error value; and evaluating the data classified as an error value or a normal value. The normal values may lie within a state space separated from the error values by a discrimination limit. Evaluating the data classified as an error value may include determining if the data classified as an error value fulfils a criterion, and evaluating the data classified as a normal value may include statistically evaluating to determine a stochastic parameter and determining if the stochastic parameter exceeds a threshold value.