The invention relates to a vacuum chamber packaging machine with spring fracture detection. A first electrical line can be provided connecting springs to a controller, where interruption of the line due to a fractured spring may be detected by the controller via an applied voltage, so that no safety deficiency arises.

A computer including a hardware interface wherein the hardware interface includes a first resistor with a first first resistor pin and a second first resistor pin, a second resistor with a first second resistor pin and a second second resistor pin, a transistor, a comparator; the first first resistor pin being coupled on the one hand to the first hardware interface pin and on the other hand to a first transistor pin.

A system that applies a counteracting voltage or current to a rotating shaft to minimize a grounding voltage signal of the shaft, measures and analyzes the counteracting signal, and provides expert system logic that compares prior learned waveforms and models of baseline, fault, and degradation waveforms to operational waveforms to determine and predict faults and degradation events. Self-learning logic analyzes the operational waveforms to look for changes, and finds or predicts fault and degradation events in relation to archived characteristics of earlier waveforms. It then adds characteristics of predictive waveforms to the database of model waveforms, and updates rules and thresholds in the expert logic based on the found predictors. It may further calculate and continuously refine a counteracting signal waveform to minimize the shaft grounding waveform.

A volt meter and a current meter may measure a voltage and a current for the calculation of power consumption. A controller may calculate the power consumption when a heating element is activated and when the heating element is deactivated. Based on the power consumptions when the heating element is activated or deactivated, a failure condition may be determined.

An array substrate and a method for detecting the array substrate are disclosed. The array substrate comprises a display area and a detecting area. In a first detecting mode, a first to a sixth detecting circuits are divided into three groups, and a first detecting signal is successively provided to these three groups of detecting circuits, so that a circuit defect possibly existing in a charge line and a share line that are located in each row of subarea can be detected. In a second detecting mode, the first to the sixth detecting circuits are divided into two groups, and a second detecting signal is provided to the two groups of detecting circuits successively, so that a circuit defect possible existing in the charge line and the share line that are located in adjacent rows of subareas can be detected.

A testing device of an inverter device includes a power supply device including an AC-DC conversion circuit for converting AC power received from an AC power supply into DC power and a control part for controlling the AC-DC conversion circuit and a filter circuit interposed between a tested inverter device to be tested and the power supply device, having a reactor and a capacitor, and delivering the DC power output from the power supply device to the tested inverter device. The control part is configured to execute output adjustment of the AC-DC conversion circuit when a test start signal is generated to start an instantaneous voltage abnormality test which is a test changing magnitude of power supply voltage of the AC power supply in a predetermined direction being either one of increase or decrease during operation of the tested inverter device and the power supply device.

A method and a system for detecting a pantograph-catenary electric arc based on a train power supply system are provided. The method includes: boosting, by a booster transformer, a voltage of alternating current transmitted via an electric network, to generate high voltage electrical energy, where a high voltage and a great current are generated in a gap between a catenary wire and a pantograph in a discharging circuit with the high voltage electrical energy; and collecting an electric arc generated in the gap between the catenary wire and the pantograph in a case of the high voltage and the great current.

Disclosed herein is a slave module for monitoring an electric system. The slave module includes: a data transmitting/receiving unit configured to receive request data from the master module and transmit response data to the master module via the serial bus; a data converting unit configured to convert the request data into first digital data and convert second digital data into the request data; a determining unit configured to determine whether the serial bus is in inactive state based on the first digital data and the second digital data; and a data processing unit configured to transmit emergency data to the master module if it is determined that the serial bus is in the inactive state.

A driver circuit arrangement for driving a transistor bridge, which includes at least a first half-bridge composed of a low-side transistor and a high-side transistor, is described herein. In accordance with one example of the description, the circuit includes a current source and a detection circuit. The current source is operably coupled to the high-side transistor of the first half-bridge and configured to supply a test current to the first half bridge. The detection circuit is configured to compare a voltage sense signal, which represents the voltage across the high-side transistor of the first half-bridge, with at least one first threshold to detect, dependent on the result of this comparison, whether a short-circuit is present in the first half-bridge.

A device for determining impedance at a data pin of a communication interface. In one embodiment, the device includes a current source configured to selectively inject a test current to the data pin. The device also includes a sensing circuit for sensing a first test voltage corresponding to a voltage at the data pin without the test current injected, and a second test voltage corresponding to another voltage at the data pin with the test current injected. The sensing circuit determines the impedance at the data pin based on the first test voltage and the second test voltage.