A sensor device includes: a first sensor element; a second sensor element; and a processing chip that includes a semiconductor substrate, a first processor that receives a first detection signal and processes the first detection signal, a second processor that receives the second detection signal and processes the second detection signal, and an isolation portion that electrically isolates the first processor the second processor. The first processor includes a first diagnosis unit that self-diagnoses a presence or absence of a failure. The second processor includes a second diagnosis unit that self-diagnoses a presence or absence of a failure. The processing chip identifiably outputs a first output of the first processor and a second output of the second processor.

Various embodiments comprise a laser bonded glass-silicon vapor cell for performing spectroscopy on particles like atoms or molecules. In some examples, the laser bonded glass-silicon vapor cell comprises a glass base, a glass top, a silicon piece, and a filling material. The silicon piece comprises at least one through hole. The lower surface of the silicon piece is hermetically bonded to the glass base. The upper surface of the silicon piece is laser bonded to the glass top. The filling material is positioned in a cavity formed by the through hole, the glass base, and the glass top. The filling material may comprise an alkali metal, a salt slush, an inert gas, or a vacuum encapsulation.

Embodiments of the present disclosure generally relate to spintronic devices, and more specifically to self-cooling spintronic devices. In an embodiment, a device is provided. The device includes a spintronic device having a first side and a second side opposite the first side, a first layer disposed on the first side, and a second layer disposed on the second side, the first layer having a Seebeck coefficient that is different from a Seebeck coefficient of the second layer.

A gradiometer includes a at least one magnet attached to a beam. The magnet moves in response to a magnetic force. A sensing element is configured to measure movement or deflection of the beam or magnet. The gradiometer is configured to determine a gradient of a magnetic field acting on the first magnet based on movement of the magnet. The gradiometer can further measure higher order gradients.

A soft magnetic sensor comprising a soft material containing randomly distributed magnetic microparticles and a magnetometer that can estimate force and localize contact over a continuous area. A reference magnetometer can be used to filter motion and ambient noise. Methods for locating contact and determining force comprise data analysis of the magnetometer output. In some embodiments, the sensor can localize an object prior to contact.

A magnetic sensor includes a substrate including a top surface, an insulating layer including an inclined surface, an MR element disposed on the inclined surface, a first insulating portion of an insulating material disposed on a part of the MR element, and a second insulating portion of an insulating material disposed on another part of the MR element at a position forward of the first insulating portion in a direction along the inclined surface, the direction being a direction away from the top surface of the substrate.

A magnetic sensor device includes a first detection circuit, a second detection circuit, and a processor. The processor is configured to execute first generation processing for generating a first initial detection value, second generation processing for generating a second initial detection value, first correction processing, second correction processing, and determination processing. The first correction processing is processing for correcting the first initial detection value and updating the first initial detection value. The second correction processing is processing for correcting the second initial detection value and updating the second initial detection value. The processor executes the determination processing after alternately executing the first correction processing and the second correction processing.

A magnetic sensor includes a substrate including a top surface, an insulating layer including an inclined surface, and a magnetic detection element disposed on the inclined surface. The magnetic detection element includes a first side surface and a second side surface. The first side surface is located at a position forward in a first direction that is one direction along the inclined surface. The second side surface is located at a position forward in a second direction that is another direction along the inclined surface. The magnetic detection element includes a first non-constant portion in which a gap between an upper end of the first side surface and an upper end of the second side surface becomes smaller along the longitudinal direction of the magnetic detection element.

A magnetic sensor includes a substrate including a top surface; an insulating layer disposed on the substrate, the insulating layer including first and second inclined surfaces each inclined with respect to the top surface of the substrate; and an MR element. The MR element is disposed on the first inclined surface or the second inclined surface. The MR element includes a first side surface including a first portion and a second portion, the first portion and the second portion having different angles with respect to the first inclined surface or the second inclined surface.

A magnetic sensor 1 includes a plurality of MR elements disposed in first to fourth areas. Each of the first to fourth areas includes a first end edge and a second end edge located at both ends in a first reference direction, and a third end edge and a fourth end edge located at both ends in a second reference direction. Each of the first and second end edges extends along the second reference direction. Each of the third and fourth end edges extends along a third reference direction. Each of the plurality of MR elements has a shape long in a direction different from each of the first reference direction, the second reference direction, and the third reference direction.