An apparatus (10) for checking a component (30) is disclosed. The apparatus (10) comprises a sample holder (20) with a module (28) for receiving at least one component (30), at least one magnetic field generator (60a, 60b, 60c) for generating a magnetic field around the module (28), an inlet (40) for feeding a tempered medium into the module (25), and an outlet (45) for discharging a tempered medium from the module (28).

A sensor test system having excellent throughput is provided.

The sensor test system 1 includes a test apparatus group 20 including a plurality of sensor test apparatuses 30A to 30D coupled to each other so that the sensor 90 can be transferred, and each of the sensor test apparatuses 30A to 30D includes an application unit 40 including an application device 42 including a socket 445 to which the sensor 90 is electrically connected, and a pressure chamber 43 which applies a pressure to the sensor 90, a test unit 35 which tests the sensor 90 via the socket 445, and a conveying robot 33 which conveys the sensor 90 into and out of the application unit 40.

The present disclosure relates to a magnetic resonance imaging device and shimming methods on the magnetic resonance imaging device. The magnetic resonance imaging device includes a main magnet, gradient coils, a vacuum enclosure, and a shimming conduit. The vacuum enclosure is configured to house at least part of the shimming conduit. The vacuum enclosure and at least part of the shimming conduit defines a hermetically sealed space configured to house the gradient coils. The shimming conduit has at least one opening configured to allow for access to an interior of the shimming conduit. The interior of the shimming conduit is hermetically insulated from the hermetically sealed space.

An exchange-coupled film according to the present invention includes an antiferromagnetic layer, pinned magnetic layer, and free magnetic layer which are stacked. The antiferromagnetic layer is composed of a PtCr sublayer and an XMn sublayer (where X is Pt or Ir). The XMn sublayer is in contact with the pinned magnetic layer. The PtCr sublayer has a composition represented by the formula Pt.sub.Cr.sub.100 at %- ( is 44 at % to 58 at %) when the XMn sublayer is placed on the PtCr sublayer or has a composition represented by the formula Pt.sub.Cr.sub.100 at %- ( is 44 at % to 57 at %) when the XMn sublayer is placed on the pinned magnetic layer.

Apparatus including a regulator configured to generate a regulated output and a diagnostic circuit configured to generate a diagnostic signal indicative of whether the regulator is able to maintain regulation is described. The regulator includes an amplifier having a first input responsive to a reference voltage, a second input responsive to a feedback signal associated with the regulated output, and an output at which a control voltage is provided and further includes a pass element controlled by the control voltage and coupled to a node which the regulated output is provided. The diagnostic circuit is responsive to the control voltage and to the reference voltage to generate the diagnostic signal. The regulator may be a voltage regulator or a current regulator and in some embodiments, the diagnostic signal takes the form of a composite signal indicative of whether a voltage regulator and whether a current regulator can maintain regulation.

An apparatus and a method for redundant measurements of a magnetic field originating from or influenced by a moveable object is described. The apparatus comprising at least one first magnetic field sensitive element measuring at least one magnetic field property of the magnetic field, wherein the at least one first magnetic field sensitive element is implemented on a first area of a semiconductor substrate, at least one second magnetic field sensitive element measuring at least one magnetic field property of the magnetic field, wherein the at least one second magnetic field sensitive element is implemented on a second area of said semiconductor substrate, and wherein the first and second areas are isolated from one another.

Provided is a magnetic field measuring device which has good temperature stability and which enables an improvement by making it possible for the sensitivity of a Hall element, a magnetic impedance (MI) element or a magnetic resistance (MR) element, which are conventionally used extensively, to be set freely. This magnetic field measuring device comprises: a temperature maintaining means for maintaining an extremely low temperature state in which a superconductor adopts a superconducting state; a magnetic sensor which is provided inside the temperature maintaining means to detect a magnetic field; and a magnetic field space forming means for forming a magnetic field space specific to the superconducting state, by adopting a superconducting state inside the temperature maintaining means; wherein the magnetic sensor is disposed in the magnetic field space.

A cryocooler superconducting quantum interference (SQUID) system includes a cryocooler including a cold head, a cold head chamber in which the cold head is disposed, a sensor chamber including a SQUID sensor cooled to a low temperature by the cryocooler; and a connection block connecting the cold head and a thermal anchor disposed in the sensor chamber to each other to cool the SQUID sensor in the sensor chamber.

A magnetic field sensor comprises a magnetoresistance element with a variable conductivity that changes based on a function of a magnetic field strength and angle of an external magnetic field and a voltage across the magnetoresistance element. A circuit is included to monitor an electrical current through the magnetoresistance element during operation and to apply a constant voltage across the magnetoresistance element based on the monitored electrical current so that the variable conductivity does not change as result of a changing voltage across the magnetoresistance element.

A magnetoresistive sensor sensitive to an out-of-plane applied magnetic field includes a sensing layer; a reference layer with a fixed magnetization, the direction of the fixed magnetization being perpendicular to the plane of the reference layer; a non-magnetic spacer layer separating the sensing layer and the reference layer; the sensing layer having spontaneously a magnetization vortex configuration in the absence of an applied magnetic field, the vortex core diameter varying in the presence of an applied magnetic field perpendicular to the plane of the reference layer.