A method and apparatus for calibrating an impedance measurement device are provided. The impedance measurement device outputs a first AC signal to a phase-locked current generator. The phase-locked current generator generates a second AC signal having a phase that is locked to a phase of the first AC signal and having an amplitude that is representative of a presented impedance having a known impedance value. The phase-locked current generator outputs the second AC signal to the impedance measurement device. The impedance measurement device performs an impedance measurement based on the second AC signal to produce a measured impedance value associated with the presented impedance. The impedance measurement device is calibrated based on the measured impedance value and the known impedance value of the presented impedance.

A chip, a self-calibration circuit and method for chip parameter offset upon power-up are disclosed. The circuit includes a counting circuit, a calibration data latch circuit, a calibration data selection circuit and a parameter calibration circuit. The counting circuit outputs a sequentially scanned counting signal when receiving a valid enabling signal. The calibration data latch circuit latches the counting signal when receiving a valid latch signal. The calibration data selection circuit selects the counting signal latched by the calibration data latch circuit as a calibration signal when receiving the valid latch signal, otherwise selects the counting signal currently outputted as the calibration signal. The parameter calibration circuit implements a parameter calibration based on the calibration signal in a calibration mode, while outputs the valid latch signal when the parameter calibration satisfies a preset requirement. Thus, a parameter calibration with a higher accuracy and flexibility is realized in a cheaper way.

A method for calibrating a sensor system, including: providing at least one first sensor unit and one second sensor unit, providing first correction data for the first sensor unit on the basis of measuring signals of the first sensor unit, providing second correction data for the first sensor unit, in the case of an activated second sensor unit, on the basis of measuring signals of the first sensor unit and on the basis of measuring signals of the second sensor unit, determining a first quality parameter for the first correction data and a second quality parameter for the second correction data, determining present correction data for measuring signals of the first sensor unit based on the correction data having the highest of the two determined quality parameters, and calibrating the first sensor unit by correcting first measuring signals on the basis of the present correction data.

A system and method for phase and gain calibration of a current sensor system. The system comprises a microcontroller configured to execute software in an energy measurement component and a calibration computer having a calibration application. The energy measurement component receives first and second digital signals representing current and voltage signals, respectively, received from a test source, and calculates active power and a power factor, and provides those values to the calibration computer. The power factor is converted to a converted phase angle. Based on the information received from the energy measurement component, the calibration application calculates parameters used to update components within the microcontroller to maximize the accuracy of the current sensor system.

A new method for calibrating slide screw tuners, both using hexahedron vertically moving and disc-shaped eccentrically rotating reflective tuning probes, allows straightening the reflection factor phase response (anti-skewing); it uses a new scaling method and a new coordinate system of tuning probe control. The method is agnostic and self-regulating, it treats the tuner as a black box and depends on the test frequency. The result is improved mathematical interpolation and tuning results using reduced number of calibration points and allowing higher calibration speed.

A method for calibrating a magnetometer. The magnetometer travels through (Si) a set of path positions, and acquires (S2) a plurality of measurements of the magnetic field. Trajectory information (S3) is provided representative of the location and the orientation of a point integral with the magnetometer. The measurements of the magnetic field are matched up (S4) with the trajectory information. A determination (S5) is made of calibration parameters of the magnetometer by the minimisation of a cost function involving, for a plurality of determination times, at least the calibration parameters, a measurement of the magnetic field, and a relationship linking the change in a magnetic field with the change in the location and in the orientation of the magnetometer derived from the trajectory information.

Various aspects of the disclosure relate to evaluating the electromagnetic impedance characteristics of a material under test (MUT) over a range of frequencies. In particular aspects, a system includes: an electrically non-conducting container sized to hold the MUT, the electrically non-conducting container having a first opening at a first end thereof and a second opening at a second, opposite end thereof; a transmitting electrode assembly at the first end of the electrically non-conducting container, the transmitting electrode assembly having a transmitting electrode with a transmitting surface; and a receiving electrode assembly at the second end of the electrically non-conducting container, the receiving electrode assembly having a receiving electrode with a receiving surface, wherein the receiving electrode is approximately parallel with the transmitting electrode, and wherein the transmitting surface of the transmitting electrode is larger than the receiving surface of the receiving electrode.

A method and apparatus are for monitoring a secondary power device and for accurately checking a state of the secondary power device, and an electronic system includes the apparatus. The method of monitoring a secondary power device includes setting a first reference parameter by using a voltage of at least one capacitor of the secondary power device, setting a second reference parameter by using the voltage of the at least one capacitor and the first reference parameter, and setting a reference level for checking of the state of the secondary power device by using the second reference parameter, wherein the reference level is used in checking of the state of the secondary power device.

A device may determine an analog gain for an aggregated analog signal. The aggregated analog signal may be associated with a calibration test to be used to determine a set of calibration parameters for a load test of a base station. The device may determine the set of calibration parameters for the load test based on an outcome of performing a calibration test. The set of calibration parameters may result in a set of digital gains approximately centered in a digital dynamic gain range. The device may perform the load test after determining the analog gain for the analog signal and based on the set of calibration parameters for the load test.

A calibration operation determines a resistance of a sense resistor in a POE system. A voltage measurement is taken with a first current flowing through the sense resistor. A second voltage measurement is taken with a second current flowing through the resistor. A resistance value of the sense resistor is determined based on a voltage difference between the first and second voltage measurements and a current difference between the first current and the second currents.