The method and device to ensure a safety of people's life and health is based on measurements of spontaneous electromagnetic radiation caused by a deformation from a structure or device, a nucleation and growth of plant cells and living organisms; calculating an energy stored in a portion of the structure or cells based on a measured intensity; performing a comparison of the energy stored with a critical value for the structure and pathological changes in the cells; and indicate a potential failure of the structure or a level of pathological changes based on the performed comparison.

The method and device to ensure a safety of people's life and health is based on measurements of spontaneous electromagnetic radiation caused by a deformation from a structure or device, a nucleation and growth of plant cells and living organisms; calculating an energy stored in a portion of the structure or cells based on a measured intensity; performing a comparison of the energy stored with a critical value for the structure and pathological changes in the cells; and indicate a potential failure of the structure or a level of pathological changes based on the performed comparison.

An apparatus includes a substrate, a nested enclosure assembly including an outer enclosure and an inner enclosure, wherein the outer enclosure encloses the inner enclosure and the inner enclosure encloses at least the electronic assembly. An insulating medium is disposed within a cavity between the outer surface of the inner enclosure and the inner surface of the outer enclosure and the system includes a sensor assembly communicatively coupled to the electronic assembly. The sensor assembly includes one or more sensors that are configured to acquire one or more measurement parameters at one or more locations of the substrate. The electronic assembly is configured to receive the one or more measurement parameters from the one or more sensors.

An apparatus includes a substrate, a nested enclosure assembly including an outer enclosure and an inner enclosure, wherein the outer enclosure encloses the inner enclosure and the inner enclosure encloses at least the electronic assembly. An insulating medium is disposed within a cavity between the outer surface of the inner enclosure and the inner surface of the outer enclosure and the system includes a sensor assembly communicatively coupled to the electronic assembly. The sensor assembly includes one or more sensors that are configured to acquire one or more measurement parameters at one or more locations of the substrate. The electronic assembly is configured to receive the one or more measurement parameters from the one or more sensors.

Disclosed herein is an image sensor comprising: a plurality of radiation detectors; a mask with a plurality of radiation transmitting zones and a radiation blocking zone; and an actuator configured to move the plurality of radiation detectors from a first position to a second position and to move the mask from a third position to a fourth position; wherein while the radiation detectors are at the first position and the mask is at the third position and while the radiation detectors are at the second position and the mask is at the fourth position, the radiation blocking zone blocks radiation from a radiation source that would otherwise incident on a dead zone of the image sensor and the radiation transmitting zones allow at least a portion of radiation from the radiation source that would incident on active areas of the image sensor to pass through.

An apparatus is described herein. The apparatus comprises a first modality unit and a second modality unit. The first modality unit is located within a gantry. The second modality unit within the gantry is moveable along an examination axis to be concentric about with the first modality unit such that a field of view of the first modality unit and a field of view of the second modality unit are centered about a single point of interest.

There is provided a method for at least partly determining the orientation of an edge-on x-ray detector with respect to the direction of x-rays from an x-ray source. The method includes obtaining (S1) information from measurements, performed by the x-ray detector, representing the intensity of the x-rays at a minimum of two different relative positions of a phantom in relation to the x-ray detector and the x-ray source, the phantom being situated between the x-ray source and the x-ray detector and designed to embed directional information in the x-ray field when exposed to x-rays. The method also includes determining (S2) at least one parameter associated with the orientation of the x-ray detector with respect to the direction of x-rays based on the obtained information from measurements and a geometrical model of the spatial configuration of the x-ray detector, x-ray source and phantom.

There is provided a method for at least partly determining the orientation of an edge-on x-ray detector with respect to the direction of x-rays from an x-ray source. The method includes obtaining (S1) information from measurements, performed by the x-ray detector, representing the intensity of the x-rays at a minimum of two different relative positions of a phantom in relation to the x-ray detector and the x-ray source, the phantom being situated between the x-ray source and the x-ray detector and designed to embed directional information in the x-ray field when exposed to x-rays. The method also includes determining (S2) at least one parameter associated with the orientation of the x-ray detector with respect to the direction of x-rays based on the obtained information from measurements and a geometrical model of the spatial configuration of the x-ray detector, x-ray source and phantom.

A scintillator material includes a matrix phase and scintillator parts dispersed in the matrix phase. The scintillator parts contain fine particles of single crystal. According to the above aspect, since the scintillator parts containing the fine particles of single crystal are dispersed in the matrix phase, it is possible to reduce an influence from an environment.

A scintillator material includes a matrix phase and scintillator parts dispersed in the matrix phase. The scintillator parts contain fine particles of single crystal. According to the above aspect, since the scintillator parts containing the fine particles of single crystal are dispersed in the matrix phase, it is possible to reduce an influence from an environment.