Some embodiments include an x-ray system, comprising: an x-ray imager including a plurality of imaging layers; an x-ray source configured to generate an x-ray beam; and an x-ray prefilter; wherein: the x-ray prefilter is configured to adjust an energy spectrum of the x-ray beam to create or decrease a level of x-ray fluence of a local minimum between two of a plurality of local maximums.

A method for determining at least one artifact calibration coefficient is provided. The method may include obtaining preliminary projection values of a first object. The radiation rays may be detected by at least one radiation detector. The method may further include generating a preliminary image of the first object based on the preliminary projection values of the first object and generating calibrated projection values of the first object based on the preliminary image. The method may further include determining a relationship between the preliminary projection values and the calibrated projection values. The method may further include, for each of the at least one radiation detector, determining a location of the radiation detector and determining an artifact calibration coefficient corresponding to the radiation detector based on the relationship between the preliminary projection values and the calibrated projection values and the location of the radiation detector.

Some embodiments include an x-ray system, comprising: a housing; a plurality of overlapping imaging layers disposed in the housing, each imaging layer configured to generate an image in response to a corresponding incident x-ray beam; and a plurality of x-ray markers attached to the housing and disposed to affect the incident x-ray beam for each of the imaging layers.

Some embodiments include an x-ray system, comprising: a housing; a plurality of overlapping imaging layers disposed in the housing, each imaging layer configured to generate an image in response to a corresponding incident x-ray beam; and a plurality of x-ray markers attached to the housing and disposed to affect the incident x-ray beam for each of the imaging layers.

A method for characterizing an electron beam in a liquid metal jet X-ray source. The method includes providing the electron beam and directing the electron beam to an interaction region; providing an electron beam dump connected to ground potential for receiving the electron beam after it has traversed the interaction region; scanning the electron beam over at least part of the interaction region; measuring X-ray radiation generated by interaction between the electron beam and the electron beam dump during the scanning to obtain an X-ray profile; and calculating an electron beam characteristic based on the X-ray profile. Also, a corresponding liquid metal jet X-ray source.

A method for characterizing an electron beam in a liquid metal jet X-ray source. The method includes providing the electron beam and directing the electron beam to an interaction region; providing an electron beam dump connected to ground potential for receiving the electron beam after it has traversed the interaction region; scanning the electron beam over at least part of the interaction region; measuring X-ray radiation generated by interaction between the electron beam and the electron beam dump during the scanning to obtain an X-ray profile; and calculating an electron beam characteristic based on the X-ray profile. Also, a corresponding liquid metal jet X-ray source.

Some embodiments include an x-ray system, comprising: a housing; a plurality of overlapping imaging layers disposed in the housing, each imaging layer configured to generate an image in response to a corresponding incident x-ray beam; and a plurality of x-ray markers attached to the housing and disposed to affect the incident x-ray beam for each of the imaging layers.

Some embodiments include an x-ray system, comprising: a housing; a plurality of overlapping imaging layers disposed in the housing, each imaging layer configured to generate an image in response to a corresponding incident x-ray beam; and a plurality of x-ray markers attached to the housing and disposed to affect the incident x-ray beam for each of the imaging layers.