Patent classifications
G02B19/0004
MASK INSPECTION APPARATUS AND MASK INSPECTION METHOD
Provided are a mask inspection apparatus and a mask inspection method that can prevent a reduction in a reflectance of a drop-in mirror, which is caused by carbon contaminants. A mask inspection apparatus according to the present invention includes a drop-in mirror including multi-layer film and a reflective surface. The drop-in mirror is configured to reflect illumination light incident on the reflective surface and illuminate the mask. An area of the reflective surface is configured to be greater than an area of an illuminated spot irradiated with the illumination light on the reflective surface. The drop-in mirror is configured to be movable. A position of the illuminated spot on the reflective surface is configured to be moved when the drop-in mirror is moved.
IMAGE CAPTURE WITH EXPANDED FIELD OF VIEW
Methods, systems, computer-readable media, and apparatuses for image capture are presented. An apparatus according to one aspect of the disclosure comprises a plurality of optical elements configured to direct light from an environment toward an image sensor. The apparatus further comprises one or more support structures coupled to the plurality of optical elements. According to this aspect, the one or more support structures are configured to support each of the plurality of optical elements at a relative location with respect to the image sensor. According to this aspect, each of the plurality of optical elements is configured to receive light from the environment based on a different field of view, as received light, and direct the received light toward the image sensor.
Flash insert for mobile phone case
A case, for an electronic device such as a mobile phone, containing an insert located near a camera, still image recorder, or video recorder and a flash of the device is disclosed. The placement, material, color and properties of the insert helps reduce and/or eliminate problems associated with the case affecting the resultant flash/light from the camera, causing and adding erroneous colors, effects, and information on the resulting pictures, images, sensors, or videos.
PROJECTOR INCLUDING META-LENS
Provided are projectors, each including a light source configured to emit laser light, a substrate spaced apart from the light source by a distance, a pattern mask including a pattern on a first surface of the substrate, the first surface facing the light source, and a meta-lens including a plurality of first nanostructures on a second surface of the substrate, the second surface facing the first surface, the nanostructures having a shape dimension of a sub-wavelength that is less than a wavelength of light emitted from the light source.
FLASHLIGHT
A rectangular wide-beam flashlight that utilizes a plurality of LEDs positioned in specifically formed optical elements to generate a uniform, rectangular beam pattern configured to substantially illuminate one or more walls in a room. The flashlight uses a radial array of LEDs that are disposed at or within optical elements or cavities configured to combine the output of the LEDs to form a substantially uniform and seamless, high-aspect ratio or wide rectangular beam for adequately illuminating one or more walls in a room.
OPHTHALMIC LASER SYSTEMS WITH Z-DIRECTION MULTI-FOCAL OPTICS
In certain embodiments, an ophthalmic laser system comprises a laser source, multi-focal optics, scanners, delivery optics, and a computer. The laser source generates a laser beam of ultrashort laser pulses. The multi-focal optics multiplex the laser beam to yield focus spots in a target along a propagation axis of the laser beam. The scanners direct the laser beam in x, y, and z directions. The delivery optics focus the laser beam within the target to form the focus spots in the target along the propagation axis of the laser beam. The computer instructs the scanners and the delivery optics to direct and to focus the focus spots at the target according to a scan pattern.
Projector including meta-lens
Provided are projectors, each including a light source configured to emit laser light, a substrate spaced apart from the light source by a distance, a pattern mask including a pattern on a first surface of the substrate, the first surface facing the light source, and a meta-lens including a plurality of first nanostructures on a second surface of the substrate, the second surface facing the first surface, the nanostructures having a shape dimension of a sub-wavelength that is less than a wavelength of light emitted from the light source.
BROAD BEAM LIGHT
A light projecting apparatus is disclosed. The apparatus has a head with first and second light sources. There is a first reflector and a second reflector respectively disposed proximate to the first and second light sources. Each of the first and second reflectors has a concave reflective surface and a convex reflective surface configured to form light emitted by the respective light source into an illumination pattern having a central region having a substantially uniform distribution of luminous intensity and a taper region having a tapered luminous intensity.
OPTICAL STRUCTURE AND METHOD OF FABRICATING THE SAME
An optical structure is provided. The optical structure includes an optical element and a plurality of protrusions. The optical element has a planarized top surface. The plurality of protrusions are disposed on the planarized top surface, wherein each of the plurality of protrusions independently has a size in the subwavelength dimensions.
Managing electromagnetic field propagation in gradient-index media
Methods, systems, and apparatus, including computer programs encoded on a computer storage medium for managing beam shaping in gradient refractive index (GRIN) media are provided. In one aspect, a method includes specifying a field evolution throughout a gradient-index (GRIN) medium and generating a refractive index profile of the GRIN medium based on the specified field evolution in the GRIN medium. Diffraction effects are considered in solving for the refractive index profile. The index profile is found by specifying a desired beam transformation throughout the GRIN medium and solving a series of phase retrieval problems. The GRIN medium can be two-dimensional (2D) or three-dimensional (3D).