An optical device, such as a microscope, is disclosed that can be assembled from flat materials. The optical device can be assembled via a series of folds of a flat material. The optical microscope can include a stage for supporting a sample, an optic stage, and a light source. The optic stage can include one or more lenses. The optical microscope can be capable of obtaining simultaneous images from different forms of microscopy. The optical microscope may have bright field and filter field viewing capabilities wherein a user shifts from bright field to filter field by lateral movement of the stage containing a lens and a light source that cooperate to provide either the bright field or the filter field.

The present subject matter described an optical microscopy device (2) for a portable imaging system, such as a smartphone. The optical microscopy device (2) comprises an optical lens assembly with ten to sixteen lens elements. The optical lens assembly has an optical magnification in a range of about 1X to about 3X, an airy radius in a range of about 3.2 micron to about 15 micron, a depth of field in a range of about 28 micron to about 133 micron, a numerical aperture in a range of about 0.025 to about 0.176, a half field of view in a range of about 10 degrees to about 39 degrees, and a length in a range of about 6.8 millimeter (mm) to about 18 mm.

The present subject matter described an optical microscopy device (2) for a portable imaging system, such as a smartphone. The optical microscopy device (2) comprises an optical lens assembly with ten to sixteen lens elements. The optical lens assembly has an optical magnification in a range of about 1X to about 3X, an airy radius in a range of about 3.2 micron to about 15 micron, a depth of field in a range of about 28 micron to about 133 micron, a numerical aperture in a range of about 0.025 to about 0.176, a half field of view in a range of about 10 degrees to about 39 degrees, and a length in a range of about 6.8 millimeter (mm) to about 18 mm.

Disclosed are a method of acquiring an image using a light-emitting element array and an apparatus therefor. The method of acquiring an image using a light-emitting element array includes reconstructing a first image from some images among source images, detecting a partial region containing a detection target object from the first image, acquiring partial-region images corresponding to the partial region from each of the source images, and reconstructing a second image from the partial-region images using the FPMP.

A single-particle localization microscope, including an optical system configured to illuminate a sample region with a sequence of light patterns having spatially different distributions of illumination light adapted to cause a single particle located in the sample region to emit detection light, a detector configured to detect a sequence of intensities of the detection light emerging from the sample region in response to the sequence of illuminating light patterns, and a processor configured to determine, based on the sequence of intensities of the detection light, an arrangement of potential positions for locating the particle. The processor further illuminates the sample region with at least one subsequent light pattern, causes detection of at least one subsequent intensity, and decides, based on the at least one subsequent intensity of the detection light, which one of the multiple potential positions represents an actual position of the particle in the sample region.

A single-particle localization microscope, including an optical system configured to illuminate a sample region with a sequence of light patterns having spatially different distributions of illumination light adapted to cause a single particle located in the sample region to emit detection light, a detector configured to detect a sequence of intensities of the detection light emerging from the sample region in response to the sequence of illuminating light patterns, and a processor configured to determine, based on the sequence of intensities of the detection light, an arrangement of potential positions for locating the particle. The processor further illuminates the sample region with at least one subsequent light pattern, causes detection of at least one subsequent intensity, and decides, based on the at least one subsequent intensity of the detection light, which one of the multiple potential positions represents an actual position of the particle in the sample region.

A light source module for a microscope, including a light source configured to emit illumination light along an illumination light path, at least one light blocking shutter configured to be moved into and out of the illumination light path, and at least one light sensor configured to detect an intensity of the illumination light propagating along the illumination light path. The at least one light sensor is integrated with the at least one light blocking shutter to be moved therewith into and out of the illumination light path.

A light source module for a microscope, including a light source configured to emit illumination light along an illumination light path, at least one light blocking shutter configured to be moved into and out of the illumination light path, and at least one light sensor configured to detect an intensity of the illumination light propagating along the illumination light path. The at least one light sensor is integrated with the at least one light blocking shutter to be moved therewith into and out of the illumination light path.

A microscope apparatus comprises: an illumination optical system that guides light from a light source to a sample; a detection unit that detects light from the sample; a detection optical system that has an objective lens and guides light from the sample to the detection unit; a mask that allows a portion of light from the sample and light from the light source to pass therethrough, and blocks the other portion; a mask-switching unit that changes mask patterns of the mask; a microscope control unit; and an information-processing device. The microscope control unit controls the mask-switching unit to change mask patterns. The information-processing device obtains information about the amount of movement of the focus position of the optical system including the objective lens when mask patterns are changed, and calculates the refractive index of the sample based on the obtained information about the amount of movement of the focus position.

A microscope apparatus comprises: an illumination optical system that guides light from a light source to a sample; a detection unit that detects light from the sample; a detection optical system that has an objective lens and guides light from the sample to the detection unit; a mask that allows a portion of light from the sample and light from the light source to pass therethrough, and blocks the other portion; a mask-switching unit that changes mask patterns of the mask; a microscope control unit; and an information-processing device. The microscope control unit controls the mask-switching unit to change mask patterns. The information-processing device obtains information about the amount of movement of the focus position of the optical system including the objective lens when mask patterns are changed, and calculates the refractive index of the sample based on the obtained information about the amount of movement of the focus position.