G02B21/16

AN OPTICAL IMAGING SYSTEM
20220390367 · 2022-12-08 · ·

An optical system is presented for optically imaging a sample including a nanoscale object. The optical system includes an imaging lens, an illumination source configured to provide an excitation light, a detector and a substrate for supporting the sample. A sample interface, arranged to reflect the excitation light, is formed between the sample and a first side of the substrate facing the sample when the sample is applied on the substrate. The optical imaging system is arranged such that the excitation light is sent into the substrate via the imaging lens and such that the detector receives a reference light and a scattered light. The reference light comprises a part of the excitation light reflected at the sample interface and collected by the imaging lens and the scattered light comprises a part of the excitation light scattered by the nanoscale object and collected by the imaging lens. The optical system is configured such that the nanoscale object is imaged at the detector, in response to the excitation light, by an optical contrast of an interference pattern between the reference light and the scattered light. The substrate comprises an optical coating disposed on the first side of the substrate such that the sample is in contact with the optical coating when the sample is applied on the substrate. A degree of reflection of the excitation light at the sample interface is such that the optical contrast is larger compared to the optical contrast obtained with the sample interface formed without the optical coating.

OPTICAL SYSTEM FOR A LIGHT SHEET MICROSCOPE
20220390730 · 2022-12-08 ·

An optical system for a light-sheet microscope comprises transporting optics configured to project, into a sample, a light sheet for illuminating a sample plane positioned obliquely to an optical axis of the transporting optics and to project the illuminated sample plane into an intermediate image space. The transporting optics comprises an interchanging system that includes a first light-deflection element and a second light-deflection element. The interchanging system is configured to switch an illumination direction along which the light sheet illuminates the sample by alternately introducing the first light-deflection element and the second light-deflection element into a beam path of the transporting optics. The first light-deflection element causes a partial image inversion in only one direction. The second light-deflection element causes a complete image inversion in two directions.

METHOD AND APPARATUS FOR ILLUMINATING A DEFINED AREA OF AN OBJECT
20220390731 · 2022-12-08 ·

An optical imaging system includes a light source, a light detector and an aperture plate. The light source includes a plurality of light emitting devices which emit light that is directed toward an object to be illuminated. The light detector is positioned to view the object illuminated by the light source. The aperture plate is positioned relative to the light source to block a first portion of the light emitted by the light source and to allow a second portion of the light emitted by the light source to pass therethrough to illuminate a pre-defined area of the object. The aperture plate includes a plurality of spaced apart apertures formed through the thickness thereof. Each aperture corresponds to a respective light emitting device. Each aperture of the aperture plate is defined by a first opening formed in the thickness of the aperture plate and a second opening formed in the thickness of the aperture plate. The second opening partially overlaps the first opening and is partially offset from the first opening. The first and second openings' planar shapes match the shape of the desired illumination area, with the first openings being smaller than the second openings. A method for illuminating a defined area of an object includes the steps of energizing one or more light emitting devices of a light source in an optical imaging system, which energized light emitting device or devices emit light that is directed toward the object to be illuminated. The light is passed through particularly-shaped apertures, such as described above, formed in an aperture plate positioned between the light source and the object to be illuminated. The apertures in the plate only allow light passing therethrough to impinge on the object at a pre-defined area thereof.

METHOD AND APPARATUS FOR ILLUMINATING A DEFINED AREA OF AN OBJECT
20220390731 · 2022-12-08 ·

An optical imaging system includes a light source, a light detector and an aperture plate. The light source includes a plurality of light emitting devices which emit light that is directed toward an object to be illuminated. The light detector is positioned to view the object illuminated by the light source. The aperture plate is positioned relative to the light source to block a first portion of the light emitted by the light source and to allow a second portion of the light emitted by the light source to pass therethrough to illuminate a pre-defined area of the object. The aperture plate includes a plurality of spaced apart apertures formed through the thickness thereof. Each aperture corresponds to a respective light emitting device. Each aperture of the aperture plate is defined by a first opening formed in the thickness of the aperture plate and a second opening formed in the thickness of the aperture plate. The second opening partially overlaps the first opening and is partially offset from the first opening. The first and second openings' planar shapes match the shape of the desired illumination area, with the first openings being smaller than the second openings. A method for illuminating a defined area of an object includes the steps of energizing one or more light emitting devices of a light source in an optical imaging system, which energized light emitting device or devices emit light that is directed toward the object to be illuminated. The light is passed through particularly-shaped apertures, such as described above, formed in an aperture plate positioned between the light source and the object to be illuminated. The apertures in the plate only allow light passing therethrough to impinge on the object at a pre-defined area thereof.

SYSTEMS AND METHODS FOR OPTOGENETIC IMAGING USING SEMI-KINEMATIC COUPLING

Provided herein are systems and methods for imaging using a microscope system comprising removeable or replaceable component parts. Such systems and methods employ semi-kinetic coupling for easy, tool-free attachment of the microscope system to a baseplate. Systems and methods provided herein may comprise simultaneous imaging and stimulation using a microscope system. The microscope system can have a relatively small size compared to an average microscope system.

SYSTEMS AND METHODS FOR OPTOGENETIC IMAGING USING SEMI-KINEMATIC COUPLING

Provided herein are systems and methods for imaging using a microscope system comprising removeable or replaceable component parts. Such systems and methods employ semi-kinetic coupling for easy, tool-free attachment of the microscope system to a baseplate. Systems and methods provided herein may comprise simultaneous imaging and stimulation using a microscope system. The microscope system can have a relatively small size compared to an average microscope system.

DIFFRACTIVE OPTICAL ELEMENT COMPRISING A METASURFACE FOR TIRF MICROSCOPY

Disclosed is a diffractive optical element includes a substrate (BS) having a first surface and a second surface opposite the first surface, being transparent to light in at least one spectral range and having, in the spectral range, a refractive index that is greater than that of water, at least one metasurface able to diffract light radiation of wavelength λ within the spectral range, incident with an angle of incidence, according to a diffracted radiation, so that the diffracted radiation propagates in the substrate and reaches the second surface of the substrate at a diffracted angle θ.sub.d that is greater than or equal to a limit angle (θ.sub.c) of total internal reflection between the substrate and water, the metasurface being designed to have, for the angle of incidence, a transmission with a 0 order of diffraction below 5% and a transmission of the diffracted radiation corresponding to a −1 or +1 order of diffraction above 50%.

DIFFRACTIVE OPTICAL ELEMENT COMPRISING A METASURFACE FOR TIRF MICROSCOPY

Disclosed is a diffractive optical element includes a substrate (BS) having a first surface and a second surface opposite the first surface, being transparent to light in at least one spectral range and having, in the spectral range, a refractive index that is greater than that of water, at least one metasurface able to diffract light radiation of wavelength λ within the spectral range, incident with an angle of incidence, according to a diffracted radiation, so that the diffracted radiation propagates in the substrate and reaches the second surface of the substrate at a diffracted angle θ.sub.d that is greater than or equal to a limit angle (θ.sub.c) of total internal reflection between the substrate and water, the metasurface being designed to have, for the angle of incidence, a transmission with a 0 order of diffraction below 5% and a transmission of the diffracted radiation corresponding to a −1 or +1 order of diffraction above 50%.

RANDOM ACCESS PROJECTION MICROSCOPY
20220382031 · 2022-12-01 ·

A method of imaging a sample providing light from a light source, directing the provided light into an extended focus, scanning the extended focus across a wavefront modulating element that modulates amplitudes of the light along the extended focus, providing the modulated light to the sample, detecting light emitted from the sample in response to excitation by the modulated light, and generating an image of the sample based on the detected fluorescence emission light.

System and method for characterizing particulates in a fluid sample

A system for characterizing at least one particle from a fluid sample is disclosed. The system includes a filter disposed upstream of an outlet, and a luminaire configured to illuminate the at least one particle at an oblique angle. An imaging device is configured to capture and process images of the illuminated at least one particle as it rests on the filter for characterizing the at least one particle. A system for characterizing at least one particle using bright field illumination is also disclosed. A method for characterizing particulates in a fluid sample using at least one of oblique angle and bright field illumination is also disclosed.