Patent classifications
G02B21/32
Three-dimensional confocal microscopy apparatus and focal plane scanning and aberration correction unit
Provided is a 3-dimensional confocal microscopy apparatus which is manufactured by combining a confocal microscope and an optical tweezers technique, wherein a pair of lenses for focal plane displacement where one lens is movable in the optical axis direction is arranged between a fixed objective lens and a fluorescent light imaging camera, and the 3-dimensional confocal microscopy apparatus also includes a mean which corrects the aberration of a fluorescent confocal image obtained by the fluorescent imaging camera. Accordingly, it is possible to provide a 3-dimensional confocal microscopy apparatus which can acquire a 3-dimensional image of a specimen during a manipulation of the specimen using optical tweezers without affecting an optical trap.
Three-dimensional confocal microscopy apparatus and focal plane scanning and aberration correction unit
Provided is a 3-dimensional confocal microscopy apparatus which is manufactured by combining a confocal microscope and an optical tweezers technique, wherein a pair of lenses for focal plane displacement where one lens is movable in the optical axis direction is arranged between a fixed objective lens and a fluorescent light imaging camera, and the 3-dimensional confocal microscopy apparatus also includes a mean which corrects the aberration of a fluorescent confocal image obtained by the fluorescent imaging camera. Accordingly, it is possible to provide a 3-dimensional confocal microscopy apparatus which can acquire a 3-dimensional image of a specimen during a manipulation of the specimen using optical tweezers without affecting an optical trap.
Super-resolution microscopy methods and systems enhanced by dielectric microspheres or microcylinders used in combination with metallic nanostructures
Methods and systems for the super-resolution imaging can make visible strongly subwavelength feature sizes (even below 100 nm) in the optical images of biomedical or any nanoscale structures. The main application of the proposed methods and systems is related to label-free imaging where biological or other objects are not stained with fluorescent dye molecules or with fluorophores. This label-free microscopy is more challenging as compared to fluorescent microscopy because of the poor optical contrast of images of objects with subwavelength dimensions. However, these methods and systems are also applicable to fluorescent imaging. Their use is extremely simple, and it is based on application of the microspheres or microcylinders or, alternatively, elastomeric slabs with embedded microspheres or microcylinders to the objects which are deposited on the surfaces covered with thin metallic layers or metallic nanostructures. The mechanism of imaging involved use of the plasmonic near-fields for illuminating the objects and virtual imaging of these objects through microspheres or microcylinders. These methods and systems do not require use of fragile probe tips and slow point-by-point scanning techniques. These methods and systems can be used in conjunction with any types of microscopes including upright, inverted, fluorescence, confocal, phase-contrast, total internal reflection and others. Scanning the samples can be performed using micromanipulation with individual spheres or cylinders or using translation of the slabs. These methods and systems are applicable to dry, wet and totally liquid-immersed samples and structures.
Super-resolution microscopy methods and systems enhanced by dielectric microspheres or microcylinders used in combination with metallic nanostructures
Methods and systems for the super-resolution imaging can make visible strongly subwavelength feature sizes (even below 100 nm) in the optical images of biomedical or any nanoscale structures. The main application of the proposed methods and systems is related to label-free imaging where biological or other objects are not stained with fluorescent dye molecules or with fluorophores. This label-free microscopy is more challenging as compared to fluorescent microscopy because of the poor optical contrast of images of objects with subwavelength dimensions. However, these methods and systems are also applicable to fluorescent imaging. Their use is extremely simple, and it is based on application of the microspheres or microcylinders or, alternatively, elastomeric slabs with embedded microspheres or microcylinders to the objects which are deposited on the surfaces covered with thin metallic layers or metallic nanostructures. The mechanism of imaging involved use of the plasmonic near-fields for illuminating the objects and virtual imaging of these objects through microspheres or microcylinders. These methods and systems do not require use of fragile probe tips and slow point-by-point scanning techniques. These methods and systems can be used in conjunction with any types of microscopes including upright, inverted, fluorescence, confocal, phase-contrast, total internal reflection and others. Scanning the samples can be performed using micromanipulation with individual spheres or cylinders or using translation of the slabs. These methods and systems are applicable to dry, wet and totally liquid-immersed samples and structures.
Haptic feedback microscope
A system and method for using a microscope to at least haptically observe a specimen in a fluid is provided. In one embodiment of the present invention, an audio frequency modulation sensing (AFMS) device is used to convert an optical signal from the specimen into an electrical signal. A haptic feedback device is then used to convert the electrical signal in at least vibrations, thereby providing a user with haptic feedback associated with the optical signal from the specimen. In another embodiment, a second electrical signal can be provided to a second haptic feedback (e.g., shaker, piezo electric, electric current inducing, etc.) device in the fluid, thereby allowing for bidirectional haptic feedback between the user and the specimen. In other embodiments, aural data can be extracted from the electrical signal and presented to the user either alone in in synchronization with video data (e.g., from a video camera).
Haptic feedback microscope
A system and method for using a microscope to at least haptically observe a specimen in a fluid is provided. In one embodiment of the present invention, an audio frequency modulation sensing (AFMS) device is used to convert an optical signal from the specimen into an electrical signal. A haptic feedback device is then used to convert the electrical signal in at least vibrations, thereby providing a user with haptic feedback associated with the optical signal from the specimen. In another embodiment, a second electrical signal can be provided to a second haptic feedback (e.g., shaker, piezo electric, electric current inducing, etc.) device in the fluid, thereby allowing for bidirectional haptic feedback between the user and the specimen. In other embodiments, aural data can be extracted from the electrical signal and presented to the user either alone in in synchronization with video data (e.g., from a video camera).
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
OPTICAL MANIPULATION APPARATUS
A device configured for radiating a focused electromagnetic beam is proposed. Such device comprises: —a first (101) and a second (102) part having respectively a second n.sub.2 and third n.sub.3 refractive index and a first W.sub.1 and second W.sub.2; —a first contact area (100e1) intended to be between a host medium having a first refractive index n1 and in which the micro or nanoparticles are intended to be trapped or moved by a focused electromagnetic beam radiated by the device; —a second contact area (100e2) between the first part and the second part; and —a third contact area (100e3) intended to be between the second part and the host medium. The focused electromagnetic beam results from a combination of at least two beams among a first (NJ1), a second (NJ2) and a third (NJ3) jet beams radiated respectively by the first, second and third contact areas when an incoming electromagnetic wave (IEM) illuminates the device. The device is configured for having a direction of propagation of the focused electromagnetic beam tilted in respect of a direction of propagation of the incoming electromagnetic wave.
PARTICLE POSITIONING DEVICE WITH PERIODIC DIELECTRIC STRUCTURE
Devices and techniques for a particle positioning device are generally described. In some examples, a fluid may be introduced to a channel formed on a first surface of a substrate. In various examples, the channel may comprise a periodic dielectric structure etched in a first surface of the substrate and a channel wall material. In some examples, a laser beam may be directed through the channel wall material to the periodic dielectric structure. In various further examples, the laser beam may be reflected from the periodic dielectric structure into an interior region of the channel to form a focal enhancement region of the laser beam in the interior region of the channel adjacent to the periodic dielectric structure. In various examples, a force may be exerted on a particle suspended in the fluid with an electric field gradient generated by the focal enhancement region of the laser beam.