A power off delay system and method is configured to delay termination of electrical power to a digital pathology device in a power off condition. If the apparatus includes a UPS, the power off delay system and method delays termination of electrical power when a power switch is turned off and when a catastrophic power failure occurs. During the delay of the termination of electrical power, the digital pathology device is configured to control the scanning stage system and the glass slide conveyor system and the slide rack conveyor system to place each of these systems into a known state and position all glass slides into a known position prior to the termination of electrical power to the digital pathology device. This allows the digital pathology device to resume normal operation upon power up.

A power off delay system and method is configured to delay termination of electrical power to a digital pathology device in a power off condition. If the apparatus includes a UPS, the power off delay system and method delays termination of electrical power when a power switch is turned off and when a catastrophic power failure occurs. During the delay of the termination of electrical power, the digital pathology device is configured to control the scanning stage system and the glass slide conveyor system and the slide rack conveyor system to place each of these systems into a known state and position all glass slides into a known position prior to the termination of electrical power to the digital pathology device. This allows the digital pathology device to resume normal operation upon power up.

A computer-implemented system and method for template-based imaging are disclosed. A first image of a first slide, a second image of a second slide, and a third image of a third slide are received, wherein the third image includes a representation of a sample disposed on the third slide. Values of pixels of a template image that are associated with a plurality of features common to the first and second slides and represented in the first and second images are set to a non-background value and values of pixels of the template image not associated with the plurality of features are set to a background value. An offset between the template image and the third image is developed and coordinates of pixels in the third image that are associated with the representation of the sample are determined in accordance with the offset.

A sample smear apparatus of an embodiment includes: a slide feeder that feeds a slide glass before processing; a smear processor that smears a sample on the slide glass; and a slide transporter including a slide holder mechanism with an upper surface where to hold the slide glass and a transfer mechanism that moves the slide holder mechanism in a vertical direction and in a horizontal direction, the slide transporter arranged movably to the slide feeder and the smear processor.

A sample smear apparatus of an embodiment includes: a slide feeder that feeds a slide glass before processing; a smear processor that smears a sample on the slide glass; and a slide transporter including a slide holder mechanism with an upper surface where to hold the slide glass and a transfer mechanism that moves the slide holder mechanism in a vertical direction and in a horizontal direction, the slide transporter arranged movably to the slide feeder and the smear processor.

This disclosure is directed to system for transferring a substrate, such as a microscope slide, and holding the substrate within at least one device. The system includes a holder for holding the substrate and a gripper for transferring the substrate, such as between a cassette or stack and the holder. A method is also discussed herein.

A method and system for measuring the alignment between a substrate and a platform upon which it is disposed by using image processing algorithms are described herein. These algorithms automate the detection of edges of a microscope slide and the platform in a digital image. A reference line pattern in an image of the platform can be used to detect platform edges based on a computed location of the reference line pattern in the image.

A method and system for measuring the alignment between a substrate and a platform upon which it is disposed by using image processing algorithms are described herein. These algorithms automate the detection of edges of a microscope slide and the platform in a digital image. A reference line pattern in an image of the platform can be used to detect platform edges based on a computed location of the reference line pattern in the image.

Exemplary embodiments of apparatus and method for facilitating an analysis of a sample(s) can be provided. For example, using a first arrangement(s), it can be possible to receive the sample(s) thereon. Further, for example, using a second arrangement(s), it can be possible to cause a force to be applied on a portion(s) of the sample(s) such that a surface(s) of the sample(s) can be flattened against a section(s) of the first arrangement(s).

An optical system of an optical analysis device is easily evaluated with high accuracy. There is provided a method of evaluating an optical analysis device including an optical system A capable of forming a confocal volume C at a focal position by condensing excitation light B, the method including the steps of: placing, at the focal position of the optical system A, a phantom sample in which two or more types of solid members having different fluorescent substance concentrations are arranged adjacent to each other; irradiating the phantom sample 1 with excitation light through the optical system A while relatively moving the confocal volume C formed by the optical system A and the phantom sample in an arrangement direction of the solid members; detecting fluorescent light generated in the solid members placed in the confocal volume C; and evaluating the optical system A based on the detected fluorescent light.