A light sheet microscope includes a sample chamber in which a cover slip or slide is arrangeable, which has a surface that defines a partially reflective interface and which has a further surface that defines a further partially reflective interface. The two interfaces are arranged at different distances from an objective. The light sheet microscope further includes an optical system having the objective facing toward the cover slip or slide, an illumination apparatus, which is designed to generate a light sheet, a sensor, and a processor. The two interfaces are formed in that two optical media are applicable in the sample chamber. The light sheet microscope forms a measuring device for acquiring a measured variable. The sensor is designed to acquire the intensities and/or the incidence locations of the two reflection light beams.

The invention relates to a method for automatically determining a plurality of positions (P1-P8) in a sample arrangement (40) in the object space of a microscope (1) comprising a microscope objective (10) which defines an optical axis (8), wherein: a measurement beam (30) is generated by a measurement beam device (19) and directed at the sample arrangement (40), and a measurement beam (32, 32′) reflected by the sample arrangement (40) is detected by a detector (28) which produces an output signal; the sample arrangement (40) is displaced in at least one direction perpendicular to the optical axis (8); and the plurality of positions (P1-P8) in the sample arrangement is determined on the basis of the displacement by means of output signals of the detector (28) generated during the displacement in the at least one direction. The invention also relates to a corresponding microscope (1).

The invention relates to a method for automatically determining a plurality of positions (P1-P8) in a sample arrangement (40) in the object space of a microscope (1) comprising a microscope objective (10) which defines an optical axis (8), wherein: a measurement beam (30) is generated by a measurement beam device (19) and directed at the sample arrangement (40), and a measurement beam (32, 32′) reflected by the sample arrangement (40) is detected by a detector (28) which produces an output signal; the sample arrangement (40) is displaced in at least one direction perpendicular to the optical axis (8); and the plurality of positions (P1-P8) in the sample arrangement is determined on the basis of the displacement by means of output signals of the detector (28) generated during the displacement in the at least one direction. The invention also relates to a corresponding microscope (1).

The invention is directed to a heated stage assembly that can achieve high temperatures (i.e., 40 degrees Celsius and higher and more specifically, 55 degrees Celsius and higher) for use in microscopy including fluorescence microscopy. The microscope stage heater assembly includes a mounting adapter element, a sample holder element mounted within the mounting adapter element, one or more heating elements attached to the sample holder element, and an optical window holder element disposed on a surface of the sample holder element that encloses an optical window element. The optical window element may be in contact with a microscope sample such that the optical window element is heated by the sample holder element to uniformly distribute heat to the specimen.

Apparatuses, systems, and methods for modular sample holders. The microscope may direct illumination light along an illumination path towards a sample and collect light from the sample along a collection path. Light along the illumination path may pass through an immersion fluid and the material of the sample holder to reach the sample. Light along collection path may pass through the material of the sample holder and the immersion fluid. The sample holder may have a first optical surface along the illumination path which is generally perpendicular to an optical axis of the illumination path. The sample holder may have a second optical surface along the collection path which is generally perpendicular to an optical axis of the collection path. The sample holder may be modular. The sample holder may contain the sample in an enclosed channel.

Apparatuses, systems, and methods for modular sample holders. The microscope may direct illumination light along an illumination path towards a sample and collect light from the sample along a collection path. Light along the illumination path may pass through an immersion fluid and the material of the sample holder to reach the sample. Light along collection path may pass through the material of the sample holder and the immersion fluid. The sample holder may have a first optical surface along the illumination path which is generally perpendicular to an optical axis of the illumination path. The sample holder may have a second optical surface along the collection path which is generally perpendicular to an optical axis of the collection path. The sample holder may be modular. The sample holder may contain the sample in an enclosed channel.

A dual-configuration microscope is provided that may be converted into an upright or inverted microscope. The microscope includes a base and a body having a first portion and a second portion, wherein the body is rotatably coupled to the base. The microscope further includes an objective coupled to the first portion of the body, a condenser coupled to the second portion of the body and a stage positioned between the objective and the condenser. The microscope further includes a first and second knob configured to adjust the position of the objective, wherein the first knob is disposed proximal to the first portion of the body and the second knob is disposed proximal to the second portion of the body.

A dual-configuration microscope is provided that may be converted into an upright or inverted microscope. The microscope includes a base and a body having a first portion and a second portion, wherein the body is rotatably coupled to the base. The microscope further includes an objective coupled to the first portion of the body, a condenser coupled to the second portion of the body and a stage positioned between the objective and the condenser. The microscope further includes a first and second knob configured to adjust the position of the objective, wherein the first knob is disposed proximal to the first portion of the body and the second knob is disposed proximal to the second portion of the body.

An adjusting mechanism of a sample holder is provided. The adjusting mechanism includes a base with drives arranged thereon, and a carrier that is adjustable by means of the drives and is designed to receive the sample holder. A coupling element for each drive, which coupling element is designed to connect the base and the carrier. Each coupling element has at least one linear degree of freedom and also a rotary degree of freedom. The carrier is linearly movable, by means of the coupling elements, along a respective movement axis directed from the coupling element to the carrier. Also provided is a microscope that includes such an adjusting mechanism, along with a method for adjusting the orientation of a sample holder).

An adjusting mechanism of a sample holder is provided. The adjusting mechanism includes a base with drives arranged thereon, and a carrier that is adjustable by means of the drives and is designed to receive the sample holder. A coupling element for each drive, which coupling element is designed to connect the base and the carrier. Each coupling element has at least one linear degree of freedom and also a rotary degree of freedom. The carrier is linearly movable, by means of the coupling elements, along a respective movement axis directed from the coupling element to the carrier. Also provided is a microscope that includes such an adjusting mechanism, along with a method for adjusting the orientation of a sample holder).