Patent classifications
G02B21/34
SAMPLE CHAMBER FOR MICROSCOPING CELLS AND SYSTEM WITH A SAMPLE HOLDER AND A SAMPLE CHAMBER
The invention relates to a sample chamber for microscoping cells, comprising a cover plate, the underside of which comprises a bearing area. A reservoir for the cells with a reservoir base can be formed in the cover plate and the underside of the cover plate can comprise a reservoir base area which is arranged offset downwardly with respect to the bearing area. Alternatively, the sample chamber can comprise a base plate and the underside of the cover plate can comprise a fastening area which is arranged offset downwardly with respect to the bearing area and to which the base plate is fastened, wherein the cover plate and the base plate are configured and arranged such that they together form a reservoir for the cells with a reservoir base, wherein the base plate forms the reservoir base. The invention also relates to a system with a sample holder and a sample chamber.
SAMPLE CHAMBER FOR MICROSCOPING CELLS AND SYSTEM WITH A SAMPLE HOLDER AND A SAMPLE CHAMBER
The invention relates to a sample chamber for microscoping cells, comprising a cover plate, the underside of which comprises a bearing area. A reservoir for the cells with a reservoir base can be formed in the cover plate and the underside of the cover plate can comprise a reservoir base area which is arranged offset downwardly with respect to the bearing area. Alternatively, the sample chamber can comprise a base plate and the underside of the cover plate can comprise a fastening area which is arranged offset downwardly with respect to the bearing area and to which the base plate is fastened, wherein the cover plate and the base plate are configured and arranged such that they together form a reservoir for the cells with a reservoir base, wherein the base plate forms the reservoir base. The invention also relates to a system with a sample holder and a sample chamber.
Amplifiable nanoparticle enhanced quantitative scattering assay under low magnification dark field microscope
The present disclosure relates a low magnification dark-field microscope system and method for producing a dark-field image. The method includes transferring a biological specimen to a surface of a sample plate, and pre-treating the biological specimen using one or more pre-treatment steps selected from (1) heating the biological specimen using a heating device; (2) applying ultrasound energy using an ultrasound transducer and ultrasound generator; and (3) doping the biological specimen with a metallic nanoparticle. Following pre-treatment, the method includes imaging a region of interest the biological specimen on the sample plate using a dark-field microscope to generate a dark-field image of the biological specimen.
Process record slide and method of using the same for loose cells
The present application relates to process record slide and method of using the same for loose cells. A single to multi-region slide wherein each region contains one to four control targets and is suitable for processing through Special Stains, IHC or CC, and others. Each region may be bonded by a hydrophobic barrier to form a well. The slide has an adhesive coating suitable for capturing loose cells and cell debris.
METHOD AND DEVICE FOR DETERMINING THE OPTIMAL POSITION OF THE FOCAL PLANE FOR EXAMINING A SPECIMEN BY MICROSCOPY
A method for determining the optimal position of the focal plane for examining a specimen by microscopy can include a) illuminating the specimen with light and recording images at different positions of the focal plane to provide a stack of intensity images, b) calculating a phase image from at least two intensity images, with the calculated phase image being assigned a focal plane position located within a focal plane region whose boundaries are the two most spaced apart positions of the focal plane of the at least two intensity images, c) repeating step b) multiple times with different intensity images such that a stack of phase images is available, d) calculating at least one focus measure value for each phase image, and e) determining the optimal position of the focal plane on the basis of the calculated focus measure values and the focal plane positions assigned to the phase images.
METHOD AND DEVICE FOR DETERMINING THE OPTIMAL POSITION OF THE FOCAL PLANE FOR EXAMINING A SPECIMEN BY MICROSCOPY
A method for determining the optimal position of the focal plane for examining a specimen by microscopy can include a) illuminating the specimen with light and recording images at different positions of the focal plane to provide a stack of intensity images, b) calculating a phase image from at least two intensity images, with the calculated phase image being assigned a focal plane position located within a focal plane region whose boundaries are the two most spaced apart positions of the focal plane of the at least two intensity images, c) repeating step b) multiple times with different intensity images such that a stack of phase images is available, d) calculating at least one focus measure value for each phase image, and e) determining the optimal position of the focal plane on the basis of the calculated focus measure values and the focal plane positions assigned to the phase images.
Automated substrate loading
This disclosure is directed to system for transferring a substrate, such as a microscope slide, and holding the substrate within at least one device. The system includes a holder for holding the substrate and a gripper for transferring the substrate, such as between a cassette or stack and the holder. A method is also discussed herein.
Automated substrate loading
This disclosure is directed to system for transferring a substrate, such as a microscope slide, and holding the substrate within at least one device. The system includes a holder for holding the substrate and a gripper for transferring the substrate, such as between a cassette or stack and the holder. A method is also discussed herein.
Portable imaging device
A base assembly includes an imaging sensor having a sensor surface to receive a sample, and a platform connected to the base assembly. The base assembly includes (a) an aperture configured to receive a lid surface of a lid in a position to define an imaging space between the sensor surface and the lid surface and (b) a movement portion movable toward and away from the base assembly. The platform and the base assembly are configured to limit contact between the sample and the base assembly other than at the sensor surface.
Portable imaging device
A base assembly includes an imaging sensor having a sensor surface to receive a sample, and a platform connected to the base assembly. The base assembly includes (a) an aperture configured to receive a lid surface of a lid in a position to define an imaging space between the sensor surface and the lid surface and (b) a movement portion movable toward and away from the base assembly. The platform and the base assembly are configured to limit contact between the sample and the base assembly other than at the sensor surface.