Disclosed are a method of acquiring an image using a light-emitting element array and an apparatus therefor. The method of acquiring an image using a light-emitting element array includes reconstructing a first image from some images among source images, detecting a partial region containing a detection target object from the first image, acquiring partial-region images corresponding to the partial region from each of the source images, and reconstructing a second image from the partial-region images using the FPMP.

Systems and methods are provided for classifying microbial cells according to morphological features of microcolonies. A dark-field objective is employed to acquire a dark-field image of a microcolony during a microcolony growth phase that is characterized by phenotypic expression of microcolony morphological features which evolve with time and are differentiated among classes of microbial cell types. The dark-field image is processed to classify the microcolony according to two or more microbial cell types, such as Gram status and/or speciation. The dark-field objective may have a numerical aperture selected to facilitate the imaging of microcolony morphological features, residing, for example, between 0.15 and 0.35. A set of dark-field images of a microcolony may be collected during the microcolony growth phase and processed to classify the microcolony. Classification may be performed according to a temporal ordering of the dark-field images, for example, using a recurrent neural network.

A single-particle localization microscope, including an optical system configured to illuminate a sample region with a sequence of light patterns having spatially different distributions of illumination light adapted to cause a single particle located in the sample region to emit detection light, a detector configured to detect a sequence of intensities of the detection light emerging from the sample region in response to the sequence of illuminating light patterns, and a processor configured to determine, based on the sequence of intensities of the detection light, an arrangement of potential positions for locating the particle. The processor further illuminates the sample region with at least one subsequent light pattern, causes detection of at least one subsequent intensity, and decides, based on the at least one subsequent intensity of the detection light, which one of the multiple potential positions represents an actual position of the particle in the sample region.

A light source module for a microscope, including a light source configured to emit illumination light along an illumination light path, at least one light blocking shutter configured to be moved into and out of the illumination light path, and at least one light sensor configured to detect an intensity of the illumination light propagating along the illumination light path. The at least one light sensor is integrated with the at least one light blocking shutter to be moved therewith into and out of the illumination light path.

A light source module for a microscope, including a light source configured to emit illumination light along an illumination light path, at least one light blocking shutter configured to be moved into and out of the illumination light path, and at least one light sensor configured to detect an intensity of the illumination light propagating along the illumination light path. The at least one light sensor is integrated with the at least one light blocking shutter to be moved therewith into and out of the illumination light path.

A method for configuring a sequence controller of an automated microscope includes, in a learning operating mode, performing training settings in succession. Each training setting corresponds to a respective setting data set of microscope components. A user brings at least a part of the microscope components into positions, and assigns each respective position to one or more examination steps to be performed by the microscope components. The method further includes assessing the training settings after the training settings are performed, and based on the assessment, storing the setting data sets associated with the training settings for subsequent use in the sequence controller, and/or discarding the setting data sets, and/or modifying the setting data sets. The sequence controller specifies a use of the stored setting data sets in the form of a setting of the microscope components in an examination operating mode following the learning operating mode.

An optical microscope apparatus includes: a sample interrogation system configured to probe a sample location; and a light collection system configured to collect light output from a sample due to being probed by the sample interrogation system. The light collection system includes: a mirror positioned along an imaging axis that passes through the sample location; and an optical lens system including a plurality of optical lenses arranged along the imaging axis, at least one of the lenses being a multiplet optical lens.

A method (400) and a system (200) for generating a chromatically modified image of one or more components on a microscopic slide (303) is disclosed. In one aspect of the invention, the method includes obtaining the image of the one or more components on the microscopic slide (303). Additionally, the method (400) includes processing the image to identify the one or more components. The method (400) further includes segmenting at least one part of the one or more components identified from the image. Furthermore, the method (400) includes chromatically modifying the at least one part of the one or more components and generating a chromatically modified image of the one or more components.

A SPIM-microscope (Selective Plane Imaging Microscopy) and a method of operating the same having a y-direction illumination light source and a z-direction detection light camera. An x-scanner generates a sequential light sheet by scanning the illumination light beam in the x-direction. An electronic zoom is provided that is adapted to change the scanning length in the x-direction independently of a focal length of the illumination light beam and a size of the light sheet in the y-direction and in the z-direction, wherein the number of image pixels in x-direction is maintained unchanged by the electronic zoom independently of the scanning length in x-direction that has been selected.

The present invention relates to systems and methods for sequential operation of staining, imaging and sectioning of tissue samples by a processing system. After each layer of the sample is removed by the sectioning system, the system automatically stains the exposed surface of a sample to a depth to enable imaging of the remaining tissue. The system then repeats the sectioning, staining and imaging steps in sequence to image the sample.