Microlens array formation and alignment to heterogeneously integrated optoelectronic devices. Optoelectronic devices are printed or transferred in a single process step while also creating inactive optoelectronic devices that are precisely shaped for alignment purposes rather than for optical or electrical performance. Microlenses are integrated monolithically. The microlenses are aligned directly to a fiducial generated by the device integration step, reducing overall misalignment. Additionally, we use specific optical designs for the lenses to add novel functionalities to the system. By designing the lenses with engineered offsets, distances and curvatures with respect to the arrays of optoelectronic devices, we control properties of light such as: angles, phase, beam widths, and wavelength dependence.

The invention relates firstly to a method for determining a mechanical deviation on a displacement path of an optical zoom lens, in particular on a displacement path of an optical zoom lens of a microscope. The optical zoom lens is arranged in a beam path between an object to be recorded and an electronic image sensor. In a first method step, an optical marker is introduced into the beam path at a position of the beam path located between the object to be recorded and the optical zoom lens, such that the optical marker passes the optical zoom lens and then is depicted on an image in which a position of the optical marker is detected and determined. This is compared with a reference position of the optical marker in order to determine the mechanical deviation on the displacement path of the optical zoom lens. The invention further relates to a method for correction of a displacement error of an image recorded by an electronic image sensor and to an electronic image recording device.

The invention relates firstly to a method for determining a mechanical deviation on a displacement path of an optical zoom lens, in particular on a displacement path of an optical zoom lens of a microscope. The optical zoom lens is arranged in a beam path between an object to be recorded and an electronic image sensor. In a first method step, an optical marker is introduced into the beam path at a position of the beam path located between the object to be recorded and the optical zoom lens, such that the optical marker passes the optical zoom lens and then is depicted on an image in which a position of the optical marker is detected and determined. This is compared with a reference position of the optical marker in order to determine the mechanical deviation on the displacement path of the optical zoom lens. The invention further relates to a method for correction of a displacement error of an image recorded by an electronic image sensor and to an electronic image recording device.

An ion beam cutting calibration system includes a sample cutting table, a coarse calibration device, a microscopic observation device, and a flip table. The flip table includes a flip plate, which is configured to drive the sample cutting table to swing in a vertical plane. The swing axis of the flip plate is collinear with the side edge of the top surface of the ion beam shielding plate close to the sample. Through the coordinated operation of the flip table, the microscopic observation device, the sample cutting table, and the coarse calibration device, the ion beam cutting calibration system avoids the problem that when the position relationship between the sample and the shielding plate is observed from multiple angles during calibration loading, the sample and the shielding plate are likely to be moved out of the field of vision of the microscope and out of focus.

An ion beam cutting calibration system includes a sample cutting table, a coarse calibration device, a microscopic observation device, and a flip table. The flip table includes a flip plate, which is configured to drive the sample cutting table to swing in a vertical plane. The swing axis of the flip plate is collinear with the side edge of the top surface of the ion beam shielding plate close to the sample. Through the coordinated operation of the flip table, the microscopic observation device, the sample cutting table, and the coarse calibration device, the ion beam cutting calibration system avoids the problem that when the position relationship between the sample and the shielding plate is observed from multiple angles during calibration loading, the sample and the shielding plate are likely to be moved out of the field of vision of the microscope and out of focus.

A gaze tracking system includes a contact lens, a photodetector element, a light conditioning element and electronics. The contact lens includes a fiducial having a position. The photodetector element receives a light signal from the fiducial and provides a photodetector output signal. The light signal provides a light intensity pattern at the photodetector. The optical conditioning element receives the light signal and provides a variation in the light intensity pattern on the photodetector in response to changes in the position of the fiducial. And the electronics process the photodetector output signal to calculate the position of the fiducial. A method includes detecting a light signal from a fiducial included in a contact lens, and tracking the contact lens by analyzing the light signal.

A gaze tracking system includes a contact lens, a photodetector element, a light conditioning element and electronics. The contact lens includes a fiducial having a position. The photodetector element receives a light signal from the fiducial and provides a photodetector output signal. The light signal provides a light intensity pattern at the photodetector. The optical conditioning element receives the light signal and provides a variation in the light intensity pattern on the photodetector in response to changes in the position of the fiducial. And the electronics process the photodetector output signal to calculate the position of the fiducial. A method includes detecting a light signal from a fiducial included in a contact lens, and tracking the contact lens by analyzing the light signal.

A method for applying an optical mark to a spectacle lens mounted in a spectacle frame includes determining an intended position of the optical mark at the spectacle lens based on the spectacle frame. The method further includes taking an image of at least a part of the spectacle frame and arranging the spectacle frame in a marking device having a marking appliance and adjusting the relative position of the spectacle frame and the marking appliance such that an actuation axis of the marking appliance intersects with the spectacle lens at the intended position of the optical mark. Additionally, the optical mark to the spectacle lens is applied at the intended position by using the marking appliance. The use of a spectacle frame as a positioning reference for an optical mark and a marking device are also disclosed.

The present disclosure is directed to a reticle for an optical sight of a projectile launching device. A reticle of the present disclosure is graduated in angular measurement and operationally configured as an exact firing solution using ballistic data and operationally configured for target auto ranging, bullet drop compensation and target auto leading at one or more incremental distances. A reticle of the present disclosure is also operationally configured for use with one or more firearm/ammo combinations zeroed at one or more distances.

The present disclosure is directed to a reticle for an optical sight of a projectile launching device. A reticle of the present disclosure is graduated in angular measurement and operationally configured as an exact firing solution using ballistic data and operationally configured for target auto ranging, bullet drop compensation and target auto leading at one or more incremental distances. A reticle of the present disclosure is also operationally configured for use with one or more firearm/ammo combinations zeroed at one or more distances.