A kinematically engaged yoke system (KEYS) for multiple-order-diffraction engineered material may comprise a harness comprising a frame and a plurality of semi-kinematic keys disposed on the frame, wherein the semi-kinematic keys are configured based on a MOD-side mechanical profile of a plurality of segments of a multiple-order-diffraction engineered material, and wherein the MOD-side mechanical profile, when engaged with the semi-kinematic keys, functions as a fiducial that provides alignment between neighboring segments; and one or more shims disposed between one or more pairs of neighboring segments of the plurality of segments of the multiple-order-diffraction engineered material, wherein the one or more shims facilitate alignment of the one or more pairs of neighboring segments of the plurality of segments based on a translation across one or more surfaces of the one or more shims.

A rifle scope having an eyepiece and a reticle, and wherein the reticle when viewed through the eyepiece displays. A horizontal center line is at the vertical center of the display, and below the horizontal center line there is a set aiming lines, each marked by a first indicium on a first horizontal side of the aiming line, indicating an angle measured in minutes of angle, from the horizontal center line. Finally, a subset of the aiming lines are marked with a second indicium, on a second horizontal side, opposed to the first horizontal side, of the aiming line, and wherein each the second indicium indicates distance in inches from the brisket to the top of the shoulders of a type of deer.

A rifle scope having an eyepiece and a reticle, and wherein the reticle when viewed through the eyepiece displays. A horizontal center line is at the vertical center of the display, and below the horizontal center line there is a set aiming lines, each marked by a first indicium on a first horizontal side of the aiming line, indicating an angle measured in minutes of angle, from the horizontal center line. Finally, a subset of the aiming lines are marked with a second indicium, on a second horizontal side, opposed to the first horizontal side, of the aiming line, and wherein each the second indicium indicates distance in inches from the brisket to the top of the shoulders of a type of deer.

A template-based image analysis system and method are disclosed. A slide is loaded in a high-content image system (HCIS), wherein the slide includes a plurality of reference marks and a plurality of sample locations. An acquired images data store has previously acquired images stored therein. An image acquisition module acquires an image of the slide from the high-content imaging system. A feature identification module develops a binary image of the acquired image, wherein the binary image identifies areas associated with reference marks. A template generation module generates a template in accordance with the previously acquired images and a template alignment module aligns the generate template with the binary image. An offset calculation module determines an offset between the template and the binary image and an image segmentation module determines the coordinates of pixels of the acquired image that are associated with the sample locations in accordance with the calculated offset.

Scatterometry overlay targets as well as target design and measurement methods are provided, which mitigate the effects of grating asymmetries in diffraction based overlay measurements. Targets comprise additional cells with sub-resolved structures replacing resolved coarse pitch gratings and/or comprise alternating sub-resolved structures with coarse pitch periodicity—to isolate and remove inaccuracies that result from grating asymmetries. Measurement methods utilize orthogonally polarized illumination to isolate the grating asymmetry effects in different measurement directions, with respect to the designed target structures.

Scatterometry overlay targets as well as target design and measurement methods are provided, which mitigate the effects of grating asymmetries in diffraction based overlay measurements. Targets comprise additional cells with sub-resolved structures replacing resolved coarse pitch gratings and/or comprise alternating sub-resolved structures with coarse pitch periodicity—to isolate and remove inaccuracies that result from grating asymmetries. Measurement methods utilize orthogonally polarized illumination to isolate the grating asymmetry effects in different measurement directions, with respect to the designed target structures.

There are provided a reticle, a reticle unit, and an optical apparatus, such as a rifle scope, each having a novel configuration that allows formation of a desired pattern. In a reticle 30A.sub.1 on which a pattern that serves as an indicator when an object under observation is visually recognized is formed, the pattern is formed of protruding sections 33a and 33b provided on a pattern formation surface 31a of a plate-shaped optical member 31. The protruding sections 33a and 33b are each formed of a plurality of protruding ridges 133 (structural elements) extending in the lengthwise direction of a line that forms the pattern in parallel to the widthwise direction of the line. The protruding ridges 133 each have an inclining surface 140 inclining with respect to the optical path of an observation optical path, and the inclination angle of the inclining surface with respect to the optical axis Z is so set at an angle that causes light incident via an objective lens to be deflected to exit out of the observation optical path.

There are provided a reticle, a reticle unit, and an optical apparatus, such as a rifle scope, each having a novel configuration that allows formation of a desired pattern. In a reticle 30A.sub.1 on which a pattern that serves as an indicator when an object under observation is visually recognized is formed, the pattern is formed of protruding sections 33a and 33b provided on a pattern formation surface 31a of a plate-shaped optical member 31. The protruding sections 33a and 33b are each formed of a plurality of protruding ridges 133 (structural elements) extending in the lengthwise direction of a line that forms the pattern in parallel to the widthwise direction of the line. The protruding ridges 133 each have an inclining surface 140 inclining with respect to the optical path of an observation optical path, and the inclination angle of the inclining surface with respect to the optical axis Z is so set at an angle that causes light incident via an objective lens to be deflected to exit out of the observation optical path.

A dual focal plane optical sighting device, such as a riflescope, having two focal planes, with a first reticle at the first focal plane, and a second reticle at the second focal plane. The reticle at the first focal plane is a glass etched reticle; the reticle at the second focal plane is a wire reticle. The two reticles have different patterns or markings providing the appearance of a single reticle or complementary markings when viewed through the optical sighting device.

A dual focal plane optical sighting device, such as a riflescope, having two focal planes, with a first reticle at the first focal plane, and a second reticle at the second focal plane. The reticle at the first focal plane is a glass etched reticle; the reticle at the second focal plane is a wire reticle. The two reticles have different patterns or markings providing the appearance of a single reticle or complementary markings when viewed through the optical sighting device.