Patent classifications
G02B27/32
Reticles, methods of use and manufacture
The present invention relates to target acquisition and related devices, and more particularly to telescopic gunsights and associated equipment used to achieve shooting accuracy at, for example, close ranges, medium ranges and long ranges at stationary and moving targets.
Observation method and specimen observation apparatus
Provided is an observation method including: acquiring an observed image that has been photographed by the first specimen observation apparatus with the specimen holder being mounted on the first specimen stage, the observed image having an observation target position of a specimen positioned at a center thereof, and including the plurality of markers (Step S104); acquiring pixel coordinates of each of the plurality of markers in the observed image (Step S106); acquiring stage coordinates of each of the plurality of markers on the second specimen stage having the specimen holder mounted thereon (Step S108); and converting, based on the pixel coordinates of the plurality of markers and the stage coordinates of the plurality of markers, pixel coordinates of the center of the observed image into stage coordinates to move the second specimen stage to the obtained stage coordinates (Step S112).
Observation method and specimen observation apparatus
Provided is an observation method including: acquiring an observed image that has been photographed by the first specimen observation apparatus with the specimen holder being mounted on the first specimen stage, the observed image having an observation target position of a specimen positioned at a center thereof, and including the plurality of markers (Step S104); acquiring pixel coordinates of each of the plurality of markers in the observed image (Step S106); acquiring stage coordinates of each of the plurality of markers on the second specimen stage having the specimen holder mounted thereon (Step S108); and converting, based on the pixel coordinates of the plurality of markers and the stage coordinates of the plurality of markers, pixel coordinates of the center of the observed image into stage coordinates to move the second specimen stage to the obtained stage coordinates (Step S112).
RIFLE SCOPE TURRET WITH TOOL-FREE ZEROING
A viewing optic is disclosed. In one embodiment, the viewing optic is a rifle scope having a scope body, a movable optical element defining an optical axis connected to the scope body, a turret and a zero point adjustment subassembly. The turret includes a turret screw, a turret chassis subassembly and a turret cap. The turret screw defines a screw axis and is operably connected to the optical element for adjusting the optical axis in response to rotation of the screw. The turret cap at least partially overlaps the turret chassis subassembly. The zero point adjustment subassembly includes a zero cap connected to the turret screw and a locking mechanism. The locking mechanism releasably secures the zero cap and the turret. The zero point adjustment subassembly permits adjustment of the zero point without the use of tools.
Calibration targets for microscope imaging
This disclosure is directed to optical microscope calibration devices that can be used with optical microscopes to adjust the microscope imaging parameters so that images of samples can be obtained below the diffraction limit. The microscope calibration devices include at least one calibration target. Each calibration target includes a number of features with dimensions below the diffraction limit of a microscope objective. Separate color component diffraction limited images of one of the calibration targets are obtained for a particular magnification. The color component images can be combined and image processed to obtain a focused and non-distorted image of the calibration target. The parameters used to obtain the focused and non-distorted image of the calibration target can be used to obtain focused and non-distorted images of a sample for the same magnification by using the same parameters.
Calibration targets for microscope imaging
This disclosure is directed to optical microscope calibration devices that can be used with optical microscopes to adjust the microscope imaging parameters so that images of samples can be obtained below the diffraction limit. The microscope calibration devices include at least one calibration target. Each calibration target includes a number of features with dimensions below the diffraction limit of a microscope objective. Separate color component diffraction limited images of one of the calibration targets are obtained for a particular magnification. The color component images can be combined and image processed to obtain a focused and non-distorted image of the calibration target. The parameters used to obtain the focused and non-distorted image of the calibration target can be used to obtain focused and non-distorted images of a sample for the same magnification by using the same parameters.
Object developing and calibrating method in a surgical environment
The invention discloses an object developing and calibrating method in a surgical environment. The method mainly includes the steps of: using at least one infrared LED (IR-LED) and at least one infrared sensor (IR-Sensor) on a surgical eyeglass, to have a surgical environment image; and retaining image signals within a first wavelength range and removing image signals not in the first wavelength range in the surgical environment image. The method helps the surgeon see only the object images on the surgical eyeglass without the interference of non-surgical environmental imaging noises.
OPTICAL ELEMENT, DISPLAY DEVICE, AND METHOD FOR MANUFACTURING OPTICAL ELEMENT
A deflection optical element, which diffracts incident light, includes a substrate having translucency, and a holographic material layer disposed so as to overlap the substrate, the holographic material layer being formed with a diffraction grating composed of interference fringes, wherein the holographic material layer is formed with an alignment mark where the interference fringes are discontinuous, and the alignment mark is located in an optically effective area where the holographic material layer diffracts the incident light.
IDENTIFYING FIDUCIAL MARKERS IN MICROSCOPE IMAGES
Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for obtaining a microscope image that depicts a sample and a plurality of fiducial markers, identifying the plurality of fiducial markers in the image, and using the plurality of fiducial markers to register the image. Identifying the plurality of fiducial markers in the image includes comparing a spatial intensity distribution of a plurality of regions of the image to a reference distribution function.
Identifying Fiducial Markers in Fluorescence Microscope Images
Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for obtaining a fluorescence microscope image that depicts a sample and a plurality of fiducial markers, identifying the plurality of fiducial markers in the image, and using the plurality of fiducial markers to register the image. The sample and the plurality of fiducial markers have a common fluorescence color, and identifying the plurality of fiducial markers in the image includes comparing a spatial intensity distribution of a plurality of fluorescent regions of the image to a reference distribution function.