A lighting device for total-internal-reflection fluorescence microscopy includes a substrate that is transparent to light, having a refractive index higher than that of water; a light-emitting device arranged in the interior of the substrate, suitable for emitting light radiation in the direction of a surface of the substrate, the light-emitting device being arranged such that at least one portion of the radiation reaches the surface with an angle of incidence larger than or equal to a critical angle of total internal reflection for an interface between the substrate and water; and at least one opaque mask, arranged in the interior or on the surface of the substrate so as to intercept a portion of the radiation that, in the absence of the mask, would reach the surface with an angle of incidence smaller than the critical angle. A lighting device to total-internal-reflection fluorescence microscopy is provided.

A lighting device for total-internal-reflection fluorescence microscopy includes a substrate that is transparent to light, having a refractive index higher than that of water; a light-emitting device arranged in the interior of the substrate, suitable for emitting light radiation in the direction of a surface of the substrate, the light-emitting device being arranged such that at least one portion of the radiation reaches the surface with an angle of incidence larger than or equal to a critical angle of total internal reflection for an interface between the substrate and water; and at least one opaque mask, arranged in the interior or on the surface of the substrate so as to intercept a portion of the radiation that, in the absence of the mask, would reach the surface with an angle of incidence smaller than the critical angle. A lighting device to total-internal-reflection fluorescence microscopy is provided.

A hinge between a first part and a second part of a microelectromechanical system including a first element and a second element free to move relative to each other in an out-of-plane direction is disclosed. The hinge includes a first rigid part; a second part fixed to a first face of the first part by one end and anchored to the second element by a second end, the second part deforming in bending in the out-of-plane direction; and a third part fired to a first face of the first part by a second end, and anchored to the first element by a second end, the third part deforming in bending in the out-of-plane direction. In an undeformed state, the second part and the third part each includes one face located in the same plane orthogonal to the out-of-plane direction.

A hinge between a first part and a second part of a microelectromechanical system including a first element and a second element free to move relative to each other in an out-of-plane direction is disclosed. The hinge includes a first rigid part; a second part fixed to a first face of the first part by one end and anchored to the second element by a second end, the second part deforming in bending in the out-of-plane direction; and a third part fired to a first face of the first part by a second end, and anchored to the first element by a second end, the third part deforming in bending in the out-of-plane direction. In an undeformed state, the second part and the third part each includes one face located in the same plane orthogonal to the out-of-plane direction.

At least one embodiment relates to an apparatus for super-resolution fluorescence-microscopy imaging of a sample. The apparatus includes an objective lens having a forward field of view, the objective lens being configured to collect light. The apparatus may also include a processing arrangement configured to perform super-resolution fluorescence-microscopy imaging of the sample with the collected light. Further, the apparatus includes a waveguide component located forward of the objective lens and configured to (i) receive light from outside the forward field of view, and (ii) use total internal reflection within the waveguide component to direct excitation light. In addition, the apparatus includes an electronic optical-path control system configured to cause input light of a first wavelength to follow a first optical path corresponding to a first optical mode and also configured to cause input light of the first wavelength to follow a second optical path corresponding to a second optical mode.

At least one embodiment relates to an apparatus for super-resolution fluorescence-microscopy imaging of a sample. The apparatus includes an objective lens having a forward field of view, the objective lens being configured to collect light. The apparatus may also include a processing arrangement configured to perform super-resolution fluorescence-microscopy imaging of the sample with the collected light. Further, the apparatus includes a waveguide component located forward of the objective lens and configured to (i) receive light from outside the forward field of view, and (ii) use total internal reflection within the waveguide component to direct excitation light. In addition, the apparatus includes an electronic optical-path control system configured to cause input light of a first wavelength to follow a first optical path corresponding to a first optical mode and also configured to cause input light of the first wavelength to follow a second optical path corresponding to a second optical mode.

The disclosure relates to an image sensor comprising pixels for acquiring color information from incoming visible light, wherein said image sensor comprising at least two pixels being partially covered by a color splitter structure comprising a first part and a second part, each of said first and second parts being adjacent to a dielectric part, each of said dielectric part having a first refractive index n.sub.1 (said first part having a second refractive index n.sub.2, and said second part having a third refractive index n.sub.3, wherein n.sub.1<n.sub.3<n.sub.2, and wherein according to a cross section, the first part of said color splitter structure has a first width W.sub.1, a height H and the second part of said color splitter structure has a second width W.sub.2, and the same height H, and wherein said color splitter structure has a first, a second and a third edges at the interfaces between parts having different refractive indexes, each edge generating beams or nanojets, and wherein said height H is close to a value Formul (I), where .sub.B1 and .sub.B3 are tan .sub.B1 and are respectively radiation angles of a first and a third beams generated by said first and third edges, and wherein one of said at least two pixels records light associated with a first wavelength -.sub.1 and the other of said at least two pixels records light having a spectrum in which no or few electromagnetic waves having a wavelength equal to -.sub.1 are present, wherein said first wavelength -.sub.1 being either high or small in a range of visible light.

Systems, methods, and computer-readable storage media are disclosed for providing a structured total internal reflection fluorescence (sTIRF) imaging system providing improved out of focus blur rejection and improved image contrast. The sTIRF imaging system may be configured to illuminate a sample using two beams of light (e.g., a primary beam of light and an interfering beam of light). The interfering beam of light may be configured to create interference with respect to the primary beam of light. The sTIRF imaging system may be configured to capture a plurality of intermediate images of the sample during the illuminating, and to generate a final image of the sample based on the plurality of intermediate images. The interference caused by the two beams of light may enable the sTIRF imaging system to reject out of focus blur based on detection of whether fluorescence emissions from the sample being imaged fluctuate or remain static.

Systems, methods, and computer-readable storage media are disclosed for providing a structured total internal reflection fluorescence (sTIRF) imaging system providing improved out of focus blur rejection and improved image contrast. The sTIRF imaging system may be configured to illuminate a sample using two beams of light (e.g., a primary beam of light and an interfering beam of light). The interfering beam of light may be configured to create interference with respect to the primary beam of light. The sTIRF imaging system may be configured to capture a plurality of intermediate images of the sample during the illuminating, and to generate a final image of the sample based on the plurality of intermediate images. The interference caused by the two beams of light may enable the sTIRF imaging system to reject out of focus blur based on detection of whether fluorescence emissions from the sample being imaged fluctuate or remain static.

The present disclosure concerns a device for forming a field intensity distribution in the near zone, from a propagating electromagnetic waves which are incident on said device. The device comprises: at least one layer of dielectric material, having a first refractive index n1 with a surface having at least one abrupt change of level forming a step; an element having a second refractive index n2 lower than said first refractive index n1, which is in contact with said step; and wherein said step generates a beam which is tilted compared to a propagation direction of said electromagnetic waves, and said beam having a length comprised between _1 to 10_1, with _1 being a wavelength of said electromagnetic waves in said dielectric material.