Hinge between a first part and a second part of a microelectromechanical system, said system comprising a first element (S) and a second element (M) free to move relative to each other in an out-of-plane direction, said hinge comprising a first rigid part (4), a second part (6) fixed to a first face of the first part (4) by one end and anchored to the second element by a second end, said second part (6) deforming in bending in the out--of-plane direction, a third part (8) fired to a first face of the first part (4) by a second end, and anchored to the first element (S) by a second end, the third part (8) deforming in bending in the out-of-plane direction (Z), and, in an undeformed state the second part (6) and the third part (8) each comprising one face located in the same plane (P2) orthogonal to the out-of-plane direction (Z).

Hinge between a first part and a second part of a microelectromechanical system, said system comprising a first element (S) and a second element (M) free to move relative to each other in an out-of-plane direction, said hinge comprising a first rigid part (4), a second part (6) fixed to a first face of the first part (4) by one end and anchored to the second element by a second end, said second part (6) deforming in bending in the out--of-plane direction, a third part (8) fired to a first face of the first part (4) by a second end, and anchored to the first element (S) by a second end, the third part (8) deforming in bending in the out-of-plane direction (Z), and, in an undeformed state the second part (6) and the third part (8) each comprising one face located in the same plane (P2) orthogonal to the out-of-plane direction (Z).

The present disclosure concerns a device for forming at least one focused beam in a near zone, from an electromagnetic wave incident on said device. Such device is remarkable in that it comprises at least one layer of a dielectric material comprising at least partially a first element, said first element having a first refractive index value, said first element comprising at least partially a second element, said second element having a second refractive index value greater than said first index value, and wherein said second element comprises at least a base surface, defined with respect to an arrival direction of said electromagnetic wave, and wherein said at least a base surface comprises at least two opposite edge line segments whose shape and associated base angles between said at least a base surface and a lateral surface of said second element, in a vertical plane with respect to said at least a base surface, control a shape of said at least one focused beam.

The present disclosure concerns a device for forming at least one focused beam in a near zone, from an electromagnetic wave incident on said device. Such device is remarkable in that it comprises at least one layer of a dielectric material comprising at least partially a first element, said first element having a first refractive index value, said first element comprising at least partially a second element, said second element having a second refractive index value greater than said first index value, and wherein said second element comprises at least a base surface, defined with respect to an arrival direction of said electromagnetic wave, and wherein said at least a base surface comprises at least two opposite edge line segments whose shape and associated base angles between said at least a base surface and a lateral surface of said second element, in a vertical plane with respect to said at least a base surface, control a shape of said at least one focused beam.

The present disclosure concerns an image sensor comprising at least one sensing unit, said at least one sensing unit comprising means for converting light into a readable electric signal. The image sensor is remarkable in that said at least one sensing unit comprises light guiding means for guiding light in direction to said means for converting light into a readable electric signal, said light guiding means comprising: at least one layer of a dielectric material, having a first refractive index with a surface having at least one abrupt change of level forming a step, and an element having a second refractive index lower than said first refractive index, which is in contact with said step.

A planar immersion lens can include any number of features. A planar immersion lens can be configured to control a phase profile of an incident wave by modulating the incident wave with sub-wavelength structures of varying impedances. The planar immersion lens can also be directly excited, with electronics or other subwavelength sources coupled to the planar immersion lens, to generate a wave with the desired phase profile. The planar immersion lens can include a plurality of metallic elements and passive elements disposed over a substrate. The passive elements can be selected, based on both the intrinsic and mutual impedances of the elements, to shape the spatial phase profile of the incident wave within this phase range. The phase gradient can be introduced along the incident material/refractive material interface to focus the incident wave into the refractive material having wave components at or beyond the critical angle. Methods are also provided.

A planar immersion lens can include any number of features. A planar immersion lens can be configured to control a phase profile of an incident wave by modulating the incident wave with sub-wavelength structures of varying impedances. The planar immersion lens can also be directly excited, with electronics or other subwavelength sources coupled to the planar immersion lens, to generate a wave with the desired phase profile. The planar immersion lens can include a plurality of metallic elements and passive elements disposed over a substrate. The passive elements can be selected, based on both the intrinsic and mutual impedances of the elements, to shape the spatial phase profile of the incident wave within this phase range. The phase gradient can be introduced along the incident material/refractive material interface to focus the incident wave into the refractive material having wave components at or beyond the critical angle. Methods are also provided.

A spectroscopic microscope device, comprising at least one array of metasurfaces, and at least one CCD array integrated with the array of metasurfaces. The metasurfaces in the array are configured to separately direct LCP an RCP components of light incident on the metasurface to separate pixels in the CCD array.

An analysis device for quantifying a state of a fluorescent image containing a plurality of bright spots comprises an area setting unit in which states of a plurality of bright spots contained in a plurality of areas set in the fluorescent image in accordance with positions of the plurality of bright spots are quantified as numerical values.

An analysis device for quantifying a state of a fluorescent image containing a plurality of bright spots comprises an area setting unit in which states of a plurality of bright spots contained in a plurality of areas set in the fluorescent image in accordance with positions of the plurality of bright spots are quantified as numerical values.