A super-resolution microscope avoids the need for complex phase plate optics normally used to produce a doughnut-shaped depletion beam by employing low-intensity regions of common diffraction patterns such as an Airy disk.

A super-resolution microscope avoids the need for complex phase plate optics normally used to produce a doughnut-shaped depletion beam by employing low-intensity regions of common diffraction patterns such as an Airy disk.

A method for operating a light microscope with structured illumination includes: providing illumination patterns by means of a structuring device which splits impinging light into at least three coherent beam parts which correspond to a −1., 0., and +1. diffraction orders of light; generating different phases of the illumination patterns by setting different phase values for the beam parts with phase shifters; and recording at least one microscope image for each of the illumination patterns and calculating a high resolution image from the microscope images. Phase shifters are provided not only for the beam parts of the −1. and +1. diffraction orders but also at least one phase shifter for the beam part of the 0. diffraction order. At least two different phase values Φ.sub.0 are set with the at least one phase shifter for the 0. diffraction order to provide a plurality of illumination patterns with different phases.

A fluorescence microscope (10) includes a sample illumination beam path including a source (9) for illumination light, a first wave front modulator (24) for providing the focused illumination light (8) with a central intensity minimum, a beam splitter (26) and a second adjustable wave front modulator (34) arranged in a pupil plane (30) of an objective (20). A first detection beam path section including the second wave front modulator (34) and a telescope (11) and ending at the beam splitter (26) coincides with the sample illumination beam path. A separate second detection beam path section includes a detector (38) for luminescence light from a sample. The telescope (11) images a first pupil (31) formed in the pupil plane (30) in a smaller second pupil (32), and transfers a beam of the illumination light (8) collimated in the second pupil (32) into an expanded beam collimated in the first pupil (31).

Sub-diffraction limited magneto-optical microscopy, such as Kerr or Faraday effect microscopy, provide many advantages to fields of science and technology for measuring, or imaging, the magnetization structures and magnetization domains of materials. Disclosed is a method and system for performing sub-diffraction limited magneto-optic microscopy. The method includes positioning a microlens or microlens layer relative to a surface of a sample to image the surface of the sample, forming a photonic nanojet to probe the surface of the sample, and receiving light reflected by the surface of the sample or transmitted through the sample at an imaging sensor. The methods and associated systems and devices enable sub-diffraction limited imaging of magnetic domains at resolutions 2 to 8 times the classical diffraction limit.

Sub-diffraction limited magneto-optical microscopy, such as Kerr or Faraday effect microscopy, provide many advantages to fields of science and technology for measuring, or imaging, the magnetization structures and magnetization domains of materials. Disclosed is a method and system for performing sub-diffraction limited magneto-optic microscopy. The method includes positioning a microlens or microlens layer relative to a surface of a sample to image the surface of the sample, forming a photonic nanojet to probe the surface of the sample, and receiving light reflected by the surface of the sample or transmitted through the sample at an imaging sensor. The methods and associated systems and devices enable sub-diffraction limited imaging of magnetic domains at resolutions 2 to 8 times the classical diffraction limit.

Disclosed herein is a super resolution imaging method and system for obtaining an image in a crystal material and/or device.

Disclosed herein is a super resolution imaging method and system for obtaining an image in a crystal material and/or device.

A system includes a light source, a deflection unit configured to deflect a light beam having a wavelength λ emitted from the light source, and a lens unit including a plurality of lenses that focuses deflected light on a surface to be scanned, at least one lens among the plurality of lenses has a micro concavo-convex structure in an optical surface, and the optical surface having the micro concavo-convex structure has a transmittance distribution for the light beam having the wavelength λ according to a light quantity distribution of the deflected light and entering the lens unit.

Disclosed herein are methods of tomographic imaging, the methods comprising emitting a beam of light from a light source to a sample and modulating the beam of light through a spatial light modulator configured to convert the beam of light to an Airy beam. The spatial light modulator can be rotatable and positioned at a first angle relative to the sample. The method can further obtain a first perspective view of the sample, rotate the spatial light modulator to a second angle relative to the sample, and obtain a second perspective view of the sample. Each of the perspective views can be generated by the Airy beam interacting with the sample on a focal plane. The method can then reconstruct a volumetric three-dimensional view of the sample using the first perspective view and the second perspective view.