G02F2203/69

Display panel and method for testing for occurrence of crack in display panel

A display panel and a method for testing for an occurrence of a crack in a display panel are provided. The display panel includes a panel body, a ground line, a first ground connecting portion, a first testing portion, a second ground connecting portion, a second testing portion, and a switch. By measuring a voltage, a resistance, or a current between the first testing portion and the second testing portion, an open circuit in the ground line and a crack in a non-display area can be detected. Therefore, difficulty of confirming if a crack occurs in the display panel is reduced.

CALIBRATING AND CONTROLLING NESTED MACH-ZEHNDER INTERFEROMETER THAT INCLUDES PRE-STAGES
20210263387 · 2021-08-26 ·

A nested Mach-Zehnder device may comprise a parent pre-stage interferometer, a parent interferometer coupled to the parent pre-stage interferometer, a first child pre-stage interferometer, a first child interferometer coupled to the first child pre-stage interferometer, a second child pre-stage interferometer, a second child interferometer coupled to the second child pre-stage interferometer, wherein a phase of each interferometer is electrically adjustable. The nested Mach-Zehnder device may comprise one or more components to: determine a performance parameter associated with a constellation diagram generated by the nested Mach-Zehnder device; determine that the performance parameter does not satisfy a threshold, and cause a phase of at least one pre-stage interferometer, of the parent pre-stage interferometer, the first child pre-stage interferometer, or the second child pre-stage interferometer, to be electrically adjusted to cause the performance parameter to satisfy the threshold.

DISPLAY DEVICE
20210287587 · 2021-09-16 ·

A display device includes a substrate, a plurality of pixel columns, and a lighting test circuit unit. The lighting test circuit unit is disposed in a non-display area on the substrate, includes a plurality of lighting test transistors, and provides a lighting test voltage to the pixel columns. Each of the lighting test transistors includes an active pattern including a source area, a drain area, and a channel area, a gate electrode disposed in the channel area, an interlayer insulating layer including a first contact hole spaced apart from a first side of the gate electrode by about 7 um or more, and a source electrode contacting the source area of the active pattern through the first contact hole.

Calibration of electrical parameters in optically switchable windows
11030929 · 2021-06-08 · ·

The embodiments herein relate to methods for controlling an optical transition and the ending tint state of an optically switchable device, and optically switchable devices configured to perform such methods. In various embodiments, non-optical (e.g., electrical) feedback is used to help control an optical transition. The feedback may be used for a number of different purposes. In many implementations, the feedback is used to control an ongoing optical transition. In some embodiments a transfer function is used calibrate optical drive parameters to control the tinting state of optically switching devices.

Display defect detection method, apparatus, and device for display screen
10928331 · 2021-02-23 · ·

The present invention discloses a display defect detection method, apparatus, and device for a display screen. The method includes: identifying a suspected defective pixel from a first image of a front side of a tested display screen, where the first image is shot when the tested display screen is in a solid-color display state; identifying an external smudgy pixel from a second image of the front side of the tested display screen, where the second image is shot when the tested display screen is in a die-out state and the front side is illuminated by a diffuse reflection light source; detecting, for each suspected defective pixel identified from the first image, whether a pixel at a same location in the second image is the external smudgy pixel; and if no, determining the suspected defective pixel as a display defective pixel.

Display device including an adhesive layer

A display device includes a display panel having a display area and a non-display area. A window is disposed on the display panel. A bezel portion is disposed on the window. The bezel portion at least partially overlaps the non-display area. An adhesive layer is disposed between the display panel and the window. An interlayer is disposed between the bezel portion and the adhesive layer. The interlayer has at least one ultrasound transmitting area overlapping the bezel portion.

DISPLAY DEVICE INCLUDING AN ADHESIVE LAYER
20210210394 · 2021-07-08 ·

A display device includes a display panel having a display area and a non-display area. A window is disposed on the display panel. A bezel portion is disposed on the window. The bezel portion at least partially overlaps the non-display area. An adhesive layer is disposed between the display panel and the window. An interlayer is disposed between the bezel portion and the adhesive layer. The interlayer has at least one ultrasound transmitting area overlapping the bezel portion.

Display panel with a fluorescent probe layer between a first electrode layer and light emitting layer

The present disclosure provides a display panel and a method for manufacturing the same, a detection method and a display device, and relates to the field of display technology. The display panel includes one or more detection units located on a substrate, wherein at least one of the one or more detection units comprises: a first electrode layer and a second electrode layer opposite to the first electrode layer; a light emitting layer located between the first electrode layer and the second electrode layer; and a fluorescent probe layer located between the first electrode layer and the light emitting layer.

Image sensor and methods of fabricating and measuring image sensor

A method of measuring an image sensor is disclosed. The method includes connecting a measurement unit to an image sensor, producing an electric current, which sequentially flows through a second connection line, second lower electrodes, an upper electrode, first lower electrodes, and a first connection line of the image sensor, using the measurement unit, and measuring an alignment state of the lower electrodes, the photoelectric conversion layer, and the upper electrode.

Substrate detection device and method

A substrate detection device and method are provided. The substrate detection device includes: a base platform; and a birefringence structure; the base platform comprising a light source and a bearing platform; the bearing platform being configured to place the substrate to be detected; the light source being configured to illuminate the substrate to be detected from one side, close to the bearing platform, of the substrate to be detected. The phase difference of the lights is increased by a birefringence structure layer, such that interfere may happen with some lights having a relatively smaller phase difference. The difference in brightness of different regions on the light-outgoing side of the birefringence structure layer increases, such that the non-uniformity on the substrate manifests more easily. Therefore, the effect of avoiding the missed detection is achieved.