Patent classifications
G03F7/26
Radiation Conditioning System, Illumination System And Metrology Apparatus, Device Manufacturing Method
Disclosed are an optical system for conditioning a beam of radiation, and an illumination system and metrology apparatus comprising such an optical system. The optical system comprises one or more optical mixing elements in an optical system. The optical system defines at least a first optical mixing stage, at least a second optical mixing stage, and at least one transformation stage, configured such that radiation entering the second optical mixing stage includes a transformed version of radiation exiting the first optical mixing stage. The first and second optical mixing stages can be provided using separate optical mixing elements, or by multiple passes through the same optical mixing element. The transformation stage can be a Fourier transformation stage. Both spatial distribution and angular distribution of illumination can be homogenized as desired.
MASKLESS PHOTOLITHOGRAPHY DEVICES, METHODS, AND SYSTEMS
A device includes a light source and a light guide. The light source is configured to emit photoresist-curative electromagnetic radiation. The light guide is arranged to receive the photoresist-curative electromagnetic radiation from the light source and to guide the received radiation by total internal reflection, the light guide including a pattern of emission points on at least one surface of the light guide, the emission points emitting the photoresist-curative electromagnetic radiation out of the light guide by frustration of total internal reflection caused by the emission points.
MASKLESS PHOTOLITHOGRAPHY DEVICES, METHODS, AND SYSTEMS
A device includes a light source and a light guide. The light source is configured to emit photoresist-curative electromagnetic radiation. The light guide is arranged to receive the photoresist-curative electromagnetic radiation from the light source and to guide the received radiation by total internal reflection, the light guide including a pattern of emission points on at least one surface of the light guide, the emission points emitting the photoresist-curative electromagnetic radiation out of the light guide by frustration of total internal reflection caused by the emission points.
METHOD FOR MANUFACTURING LIGHTING BUTTON KEY
A method for manufacturing a lighting button key is provided. The method includes forming a button body by processing a metal plate, attaching a thin film to the button body and performing double etching on a rear surface of the button body to process a symbol pattern. Additionally, the method includes press-forming the rear surface of the button body and an injection material of a transparent or translucent material into the rear surface of the button body to perform injection molding.
METHOD FOR MANUFACTURING LIGHTING BUTTON KEY
A method for manufacturing a lighting button key is provided. The method includes forming a button body by processing a metal plate, attaching a thin film to the button body and performing double etching on a rear surface of the button body to process a symbol pattern. Additionally, the method includes press-forming the rear surface of the button body and an injection material of a transparent or translucent material into the rear surface of the button body to perform injection molding.
LAYOUT METHOD OF MASK PATTERN, MANUFACTURING METHOD OF A SEMICONDUCTOR DEVICE AND EXPOSURE MASK
According to one embodiment, a layout region of a mask pattern is divided into N (N is an integer of 2 or larger) units, a main pattern resolved by exposure light is arranged and sub patterns not resolved by the exposure light are arranged outside the main pattern such that distributions of attenuation amount of the exposure light in the divided layout regions are different.
APPARATUS FOR TREATING SUBSTRATE AND METHOD FOR TREATING A SUBSTRATE
The inventive concept provides a substrate treating apparatus. The substrate treating apparatus includes a housing having a treating space; a support unit configured to support and rotate a substrate at the treating space; a liquid supply unit configured to supply a liquid to a substrate supported on the support unit; a post-treating unit configured to perform a post-treatment on the substrate supported on the support unit; and a monitoring unit configured to inspect a state of a liquid film formed of the liquid supplied onto the substrate.
Method for creating topographical patterns in polymers via surface energy patterned films and the marangoni effect
Using a broadband light source and a photomask, surface energy gradients can be directly transferred into polymer films. The Marangoni effect causes high surface energy regions to rise upon heating the film. This leads to the formation of three-dimensional topography that can be locked in by quenching the polymer by cooling.
Method for creating topographical patterns in polymers via surface energy patterned films and the marangoni effect
Using a broadband light source and a photomask, surface energy gradients can be directly transferred into polymer films. The Marangoni effect causes high surface energy regions to rise upon heating the film. This leads to the formation of three-dimensional topography that can be locked in by quenching the polymer by cooling.
CLEANING SOLUTION, METHOD OF REMOVING A REMOVAL TARGET AND METHOD OF ETCHING A SUBSTRATE USING SAID CLEANING SOLUTION
A cleaning liquid which includes 3-alkoxy-3-methyl-1-butanol represented by the following general formula (1); at least one of diethylene glycol monomethyl ether and triethylene glycol monomethyl ether; and quaternary ammonium hydroxide:
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in which R.sup.1 represents an alkyl group having 1 to 5 carbon atoms.