A semiconductor device of an embodiment includes first and second couplers, an encoding circuit, and a demodulating circuit. The encoding circuit executes differential Manchester encoding on digital data based on a clock inputted thereto via the first coupler and outputs an encoded data. The demodulating circuit includes a first sampling circuit which samples the encoded data inputted via the second coupler based on a sampling frequency set to be two times higher than that of the encoded data and which outputs first sample data, a second sampling circuit which samples the encoded data at a timing earlier than that in the first sampling circuit and which outputs second sample data, a determination circuit which determines whether or not the first and the second sample data match each other, and a selection circuit which selects first phase data or second phase data from the first sample data.

A semiconductor device of an embodiment includes first and second couplers, an encoding circuit, and a demodulating circuit. The encoding circuit executes differential Manchester encoding on digital data based on a clock inputted thereto via the first coupler and outputs an encoded data. The demodulating circuit includes a first sampling circuit which samples the encoded data inputted via the second coupler based on a sampling frequency set to be two times higher than that of the encoded data and which outputs first sample data, a second sampling circuit which samples the encoded data at a timing earlier than that in the first sampling circuit and which outputs second sample data, a determination circuit which determines whether or not the first and the second sample data match each other, and a selection circuit which selects first phase data or second phase data from the first sample data.

A semiconductor device of an embodiment includes first and second couplers, an encoding circuit, and a demodulating circuit. The encoding circuit executes differential Manchester encoding on digital data based on a clock inputted thereto via the first coupler and outputs an encoded data. The demodulating circuit includes a first sampling circuit which samples the encoded data inputted via the second coupler based on a sampling frequency set to be two times higher than that of the encoded data and which outputs first sample data, a second sampling circuit which samples the encoded data at a timing earlier than that in the first sampling circuit and which outputs second sample data, a determination circuit which determines whether or not the first and the second sample data match each other, and a selection circuit which selects first phase data or second phase data from the first sample data.

System and method related to photonic computing are provided. A photonic computing system may include an optical interference region and an input waveguide configured to couple an optical input signal to the optical interference region and to create an optical interference pattern in the optical interference region. The interference pattern has an optical power distribution. The photonic computing system may further include a readout unit that is arranged in an inner area of the optical interference region. The readout unit is configured to detect an optical readout signal of the optical power distribution at a readout position of the inner area of the optical interference region. A method is also provided for performing photonic computing.

System and method related to photonic computing are provided. A photonic computing system may include an optical interference region and an input waveguide configured to couple an optical input signal to the optical interference region and to create an optical interference pattern in the optical interference region. The interference pattern has an optical power distribution. The photonic computing system may further include a readout unit that is arranged in an inner area of the optical interference region. The readout unit is configured to detect an optical readout signal of the optical power distribution at a readout position of the inner area of the optical interference region. A method is also provided for performing photonic computing.

A semiconductor device of an embodiment includes first and second couplers, an encoding circuit, and a demodulating circuit. The encoding circuit executes differential Manchester encoding on digital data based on a clock inputted thereto via the first coupler and outputs an encoded data. The demodulating circuit includes a first sampling circuit which samples the encoded data inputted via the second coupler based on a sampling frequency set to be two times higher than that of the encoded data and which outputs first sample data, a second sampling circuit which samples the encoded data at a timing earlier than that in the first sampling circuit and which outputs second sample data, a determination circuit which determines whether or not the first and the second sample data match each other, and a selection circuit which selects first phase data or second phase data from the first sample data.

A semiconductor device of an embodiment includes first and second couplers, an encoding circuit, and a demodulating circuit. The encoding circuit executes differential Manchester encoding on digital data based on a clock inputted thereto via the first coupler and outputs an encoded data. The demodulating circuit includes a first sampling circuit which samples the encoded data inputted via the second coupler based on a sampling frequency set to be two times higher than that of the encoded data and which outputs first sample data, a second sampling circuit which samples the encoded data at a timing earlier than that in the first sampling circuit and which outputs second sample data, a determination circuit which determines whether or not the first and the second sample data match each other, and a selection circuit which selects first phase data or second phase data from the first sample data.

A system for analyzing wound status is provided. The system includes an image obtaining device and an image analyzing device. The image obtaining device is configured to obtain a plurality of infrared (IR) images which are photographed from a wound of a user's body portion, wherein the plurality of IR images are photographed at different time. The image analyzing device is configured to align the plurality of IR images based on features of non-wound regions from the plurality of IR images, and then analyze wound image regions from the plurality of IR images for finding out variations of the wound.

A system for analyzing wound status is provided. The system includes an image obtaining device and an image analyzing device. The image obtaining device is configured to obtain a plurality of infrared (IR) images which are photographed from a wound of a user's body portion, wherein the plurality of IR images are photographed at different time. The image analyzing device is configured to align the plurality of IR images based on features of non-wound regions from the plurality of IR images, and then analyze wound image regions from the plurality of IR images for finding out variations of the wound.

A system for analyzing wound status is provided. The system includes an image obtaining device and an image analyzing device. The image obtaining device is configured to obtain a plurality of infrared (IR) images which are photographed from a wound of a user's body portion, wherein the plurality of IR images are photographed at different time. The image analyzing device is configured to align the plurality of IR images based on features of non-wound regions from the plurality of IR images, and then analyze wound image regions from the plurality of IR images for finding out variations of the wound.