In some embodiments, a system for synchronizing content with client devices receives a request from a client device to synchronize operations pertaining to content items associated with a user account registered at the system. The request can include the operations and a cursor identifying a current position of the client in a journal of revisions on the system. Based on the operations, the system generates linearized operations associated with the content items. The linearized operations can include a respective operation derived for each of the content items from one or more of the operations. The system converts each respective operation in the linearized operations to a respective revision for the journal of revisions and, based on the cursor, determines whether the respective revision conflicts with revisions in the journal. When the respective revision does not conflict with revisions in the journal, the system adds the respective revision to the journal.

A clock generator can include a Fin Field Effect Transistor (FinFET) oscillator and a phased-locked loop (PLL). The FinFET oscillator can generate a FinFET signal. The PLL can generate an output clock signal based on a reference clock signal and the FinFET signal.

A clock generator can include a Fin Field Effect Transistor (FinFET) oscillator and a phased-locked loop (PLL). The FinFET oscillator can generate a FinFET signal. The PLL can generate an output clock signal based on a reference clock signal and the FinFET signal.

Devices and techniques are disclosed herein to extend a range of an effective delay of a delay circuit having a configurable delay limited to a first range of delay values with respect to a first edge of a clock signal. A selection circuit can selectively apply the configurable delay to a subsequent, second edge of the clock signal to extend the range of the effective delay of the delay circuit beyond the first range of delay values.

A system-on-a-chip (“SoC”) in a computing device may be provided with a power delivery network (“PDN”) self-test to detect marginal PDN performance. In the self-test, a current surge may be generated on power supply connections of logic circuit blocks. Voltage monitors may measure voltage droop on the power supply connections responsive to the current surge. Voltage droop measurements may be compared with thresholds. An action, such as generation of an alert, may be performed if a voltage droop measurement exceeds a threshold.

A system-on-a-chip (“SoC”) in a computing device may be provided with a power delivery network (“PDN”) self-test to detect marginal PDN performance. In the self-test, a current surge may be generated on power supply connections of logic circuit blocks. Voltage monitors may measure voltage droop on the power supply connections responsive to the current surge. Voltage droop measurements may be compared with thresholds. An action, such as generation of an alert, may be performed if a voltage droop measurement exceeds a threshold.

A circuit apparatus includes an oscillation circuit that generates an oscillation signal, a first buffer circuit that outputs a first clock signal based on the oscillation signal, a second buffer circuit that outputs a second clock signal based on the first clock signal, a first terminal electrically couplable to a first node via which the first buffer circuit outputs the first clock signal, and a second terminal electrically coupled to a second node via which the second buffer circuit outputs the second clock signal, and the rise period of the first clock signal is shorter than the rise period of the second clock signal.

A circuit apparatus includes an oscillation circuit that generates an oscillation signal, a first buffer circuit that outputs a first clock signal based on the oscillation signal, a second buffer circuit that outputs a second clock signal based on the first clock signal, a first terminal electrically couplable to a first node via which the first buffer circuit outputs the first clock signal, and a second terminal electrically coupled to a second node via which the second buffer circuit outputs the second clock signal, and the rise period of the first clock signal is shorter than the rise period of the second clock signal.

A method and system for generating a clock distribution circuit for each macro circuit in an ASIC design are disclosed herein. In some embodiments, a method for generating a clock distribution circuit receives the ASIC design specified in a hardware description language (HDL), places each macro circuit in allocated locations on a semiconductor substrate, generates a custom clock skew information for each macro circuit based on a macro clock delay model, generates a clock distribution circuit for each macro circuit placed on the semiconductor substrate based on the generated custom clock skew information, modifies the clock distribution circuit if the generated clock distribution circuit does not meet timing requirements of the ASIC design, and outputs a physical layout of the ASIC design for manufacturing under a semiconductor fabrication process.

A system and method for docking a processing unit provided. According to the method, the system dithers between the two signals provided by the two clock generators so as to clock the processing unit at an average clock frequency having a value between the frequencies of the two signals. The average clock frequency is adjusted by modifying the proportion of time spent on one clock signal vs the other clock signal.