G06F30/30

Passively cooling hardware components
11699016 · 2023-07-11 · ·

A system and a method are disclosed for placing hardware components on a printed circuit board (“PCB”) in a way that enables all hardware components on the PCB to be passively cooled without using active cooling systems. Components are selected to be placed onto the PCB and heat metrics for each component is obtained (e.g., from a server). The components are ranked based on the amount of heat that each component generates. A corresponding position for each of the hardware components is determined based on the ranking of the components and the orientation of the PCB. The placement is based on the concept that air having higher temperature rises while air having cooler temperature falls. A representation of the PCB according to corresponding positions of the hardware components may be generated for display.

Circuit arrangements having reduced dependency on layout environment

An integrated circuit includes a middle active-region structure between a group-one active-region structure and a group-two active-region structure. The integrated circuit also includes a main circuit, a group-one circuit, and a group-two circuit. The main circuit includes at least one boundary gate-conductor intersecting the middle active-region structure. The group-one circuit includes a group-one isolation structure separating the group-one active-region structure into a first part in the group-one circuit and a second part in a first adjacent circuit. The group-two circuit includes a group-two isolation structure separating the group-two active-region structure into a first part in the group-two circuit and a second part in a second adjacent circuit.

Circuit arrangements having reduced dependency on layout environment

An integrated circuit includes a middle active-region structure between a group-one active-region structure and a group-two active-region structure. The integrated circuit also includes a main circuit, a group-one circuit, and a group-two circuit. The main circuit includes at least one boundary gate-conductor intersecting the middle active-region structure. The group-one circuit includes a group-one isolation structure separating the group-one active-region structure into a first part in the group-one circuit and a second part in a first adjacent circuit. The group-two circuit includes a group-two isolation structure separating the group-two active-region structure into a first part in the group-two circuit and a second part in a second adjacent circuit.

Method for determining an electrical model of a string of photovoltaic modules, diagnostic method and device associated therewith

A method for determining an electrical model of a string of photovoltaic modules from a characteristic I(V) of the string includes detecting a first linear zone and a second linear zone of the characteristic I(V); initialising the parameters of a non-by-pass electrical model corresponding to a first operating condition, called a non-by-pass condition; optimising the parameters of the non-by-pass electrical model from a reference characteristic I(V.sub.ref) equal to I(V), determining the parameters of the electrical model corresponding to a second operating condition, called a by-pass condition, in order to obtain a by-pass electrical model from the characteristic determining, from the characteristic I(V) the best model among the non-by-pass model and the by-pass model.

Application specific integrated circuit interconnect

Systems and methods for providing Chronos Channel interconnects in an ASIC are provided. Chronos Channels rely on a reduced set of timing assumptions and are robust against delay variations. Chronos Channels transmit data using delay insensitive (DI) codes and quasi-delay-insensitive (QDI) logic. Chronos Channels are insensitive to all wire and gate delay variations, but for those belonging to a few specific forking logic paths called isochronic forks. Chronos Channels use temporal compression in internal paths to reduce the overheads of QDI logic and efficiently transmit data. Chronos Channels are defined by a combination of a DI code, a temporal compression ratio and hardware.

Application specific integrated circuit interconnect

Systems and methods for providing Chronos Channel interconnects in an ASIC are provided. Chronos Channels rely on a reduced set of timing assumptions and are robust against delay variations. Chronos Channels transmit data using delay insensitive (DI) codes and quasi-delay-insensitive (QDI) logic. Chronos Channels are insensitive to all wire and gate delay variations, but for those belonging to a few specific forking logic paths called isochronic forks. Chronos Channels use temporal compression in internal paths to reduce the overheads of QDI logic and efficiently transmit data. Chronos Channels are defined by a combination of a DI code, a temporal compression ratio and hardware.

Apparatus and method for quantum performance and/or error correction enhancement using multi-qubit gates

Apparatus and method for replacing portions of a quantum circuit with multi-qubit gates. For example, one embodiment of an apparatus comprises: a quantum circuit analyzer to evaluate an original quantum circuit specification including one or more sub-circuits of the original quantum circuit specification, the quantum circuit analyzer to generate results of the evaluation; a quantum circuit generator to generate a new quantum circuit specification based on the results of the evaluation generated by the quantum circuit analyzer, the quantum circuit generator to generate the new quantum circuit specification by, at least in part, replacing the one or more sub-circuits of the original quantum circuit specification with one or more multi-qubit gates.

Apparatus and method for quantum performance and/or error correction enhancement using multi-qubit gates

Apparatus and method for replacing portions of a quantum circuit with multi-qubit gates. For example, one embodiment of an apparatus comprises: a quantum circuit analyzer to evaluate an original quantum circuit specification including one or more sub-circuits of the original quantum circuit specification, the quantum circuit analyzer to generate results of the evaluation; a quantum circuit generator to generate a new quantum circuit specification based on the results of the evaluation generated by the quantum circuit analyzer, the quantum circuit generator to generate the new quantum circuit specification by, at least in part, replacing the one or more sub-circuits of the original quantum circuit specification with one or more multi-qubit gates.

Implementing and verifying safety measures in a system design based on safety specification generated from safety requirements
11550979 · 2023-01-10 · ·

A system enhances a system design to incorporate safety measures. The system receives a system design for processing through various stages of design using design tools, for example electronic design automation tools for introducing safety features in a circuit design. The system receives safety requirements for the system design, the safety requirements specifying safety measures for the system design. The system generates from the safety requirements, a safety specification storing a set of commands. The system generates a system design enhanced with safety measures. The enhanced system design it generated for at least a subset of the plurality of tools. A tool processes the generated safety specification to implement safety measures in the system design according to the received safety requirements.

Circuit health state prediction method and system based on integrated deep neural network
11694011 · 2023-07-04 · ·

A circuit health state prediction method and system based on an integrated deep neural network are provided and relates to a technique for predicting a power electronic circuit failure. The invention serves to identify and diagnose a health state of a simulation circuit based on historical data by using an integrated deep neural network, and the method includes: carrying out parameter aging simulation experiments for different devices; extracting a series of time domain features of output signals through a temporal transformation method, and establishing health indices of the devices based on an improved angular similarity; predicting a health state of the simulation circuit in degeneration by using CAE and LSTM-RNN; and predicting validity of the circuit health state prediction method by referring to relevant evaluation indices. The invention is capable of effectively predicting the health state of the simulation circuit and is highly accurate and easy to implement.