Patent classifications
G06F2111/08
DVD simulation using microcircuits
Methods, systems and media for simulating or analyzing voltage drops in a power distribution network can use an incremental approach to define a portion of a design around a victim to capture a sufficient collection of aggressors that cause appreciable voltage drop on the victim, and then an incremental simulation of just the portion can be performed rather than computing simulated voltage drops across the entire design. This approach can be both computationally efficient and can limit the size of the data used in simulating dynamic voltage drops in the power distribution network. Multiple different portions can be simulated separately in separate processing cores or elements. In one embodiment, a system can provide options of user selected constraints for the simulation to provide better accuracy or use less memory. Better accuracy will normally use a larger set of aggressors for each victim at the expense of using more memory.
System and methods for analyzing and estimating susceptibility of circuits to radiation-induced single-event-effects
Systems and methods for semiconductor design evaluation. IC layout information of a circuit design is received, and the circuit design is decomposed into smaller circuit pieces. Each circuit piece has IC layout information and a netlist. For each circuit piece, a set of strike models is selected based on the layout information and the net-list of the circuit piece and received radiation environment information. Each strike model has circuit components with voltage values corresponding to a respective particle strike. For each selected strike model of a circuit piece: a radiation susceptibility metric is determined by comparing functional results of simulation of the of the strike model with functional results of simulation of the circuit piece. For each circuit piece, a radiation susceptibility metric is determined based on the radiation susceptibility metrics generated for each selected strike model of the circuit piece.
Hardware in loop testing and generation of latency profiles for use in simulation
Systems, methods, tangible non-transitory computer-readable media, and devices associated with testing, simulation, or operation of an autonomous device including an autonomous vehicle are provided. For example, a service entity computing system can perform operations including obtaining operating software data associated with operating software of the autonomous vehicle. Log data associated with one or more real-world scenarios can also be obtained. One or more first simulations of the operating software can be performed based on the one or more real-world scenarios. A latency distribution profile associated with the operating software can be generated based on the one or more first simulations. One or more second simulations of the operating software can be performed based on the latency distribution profile and one or more artificially generated scenarios. Furthermore, a real-world behavior of the autonomous vehicle can be predicted based on the one or more second simulations.
Hardware deprocessing using voltage imaging for hardware assurance
Embodiments of the present disclosure provide methods, apparatus, systems, computing devices, computing entities for setting deprocessing parameters used in conducting hardware deprocessing on a hardware. In accordance with one embodiment, a method is provided that includes: receiving sample images using different E-beam voltages, wherein each image is captured from a backside of the hardware using a different E-beam voltage; generating thickness-based contour maps, wherein each map is generated for an image and includes contour lines indicating locations having a same thickness of remaining material; generating estimated E-beam penetration depths, wherein each depth is generated for an image and is based at least in part on the E-beam voltage used to capture the image; generating an estimated thickness measurement of the remaining material based at least in part on the contour maps and the penetration depths; and setting the deprocessing parameters based at least in part on the estimated thickness measurement.
System and Method for Calibrating a Model of Thermal Dynamics
A system and a method for calibrating a model of thermal dynamics of thermal state in an environment of a building conditioned by an operation of a heating, ventilating, and air-conditioning (HVAC) system is provided. The method includes receiving values of the control inputs to the actuators of the HVAC system and values of the thermal state at locations of the environment caused by the operation of the HVAC system according to the values of the control inputs, and computing a probabilistic surrogate model iteratively, using a Bayesian optimization, until a termination condition is met. The method further comprises outputting, when the termination condition is met, an optimal combination of the different parameters of the model of thermal dynamics having the largest likelihood of being a global minimum at the probabilistic surrogate model according to an acquisition function of the first two order moments of the calibration errors.
Scenario evaluation and projection using Monte Carlo simulation and machine learning
Described herein are improved systems and methods for overcoming technical problems associated with the use of Monte Carlo simulation methods, such as problems associated with applications of Monte Carlo simulation methods that are searching for more definite answers. In some embodiments described herein, improved systems and methods overcome the technical problem of the results of Monte Carlo simulations providing approximations and/or non-optimal results (or at least non-enhanced results). Thus, such embodiments can provide more enhanced answers to limiting risks; and in some cases, such embodiments can even provide optimal answers to limiting risks. In some embodiments, machine learning can be used to provide more enhanced answers to limiting risks; and in some cases, such embodiments can use machine learning to provide optimal answers to limiting risks discovered through Monte Carlo simulations.
Slew-load characterization
Various implementations described herein are related to a method for constructing integrated circuitry and identifying input signal paths, internal signal paths and output signal paths associated with the integrated circuitry. The method may include generating a timing table for slew-load characterization of the input signal paths, the internal signal paths and the output signal paths. The method may include simulating corner points for the timing table, building diagonal points for the timing table based on the simulated corner points, and building remaining points for the timing table based on the simulated corner points and the diagonal points.
Stochastic signal prediction in compact modeling
A method, includes, in part, defining a continuous signal, defining a threshold value, calibrating the continuous signal and the threshold value from measurements made on edges of one or more patterns on a mask and corresponding edges of the patterns on a wafer, convolving the continuous signal with a kernel to form a corrected signal, and establishing, by a processor, a probability of forming an edge at a point along the corrected signal in accordance with a difference between the value of the corrected signal at the point and the calibrated threshold value. The kernel is calibrated using the same measurements made on the patterns' edges.
System and method for filtering a data set and/or selecting at least one item of the data set
A computer-implemented method of generating a visual representation of items comprising selecting a pair of items m and n comprising parameters representing a property, selecting a pair of parameters p and q, being a.sub.mp the parameter p of item m, b.sub.mq the parameter q of item m, a.sub.np the parameter p of item n, and b.sub.nq the parameter q of item n, calculating a pair of weights w.sub.p and w.sub.q based on a.sub.mp, b.sub.mq, a.sub.np and b.sub.nq, and based on a.sub.mp, b.sub.mq, a.sub.np and b.sub.nq, storing, the pair of weights, determining a first vertex item comprising the greatest value for the parameter p, a second vertex item comprising the greatest value for the parameter q, and a third vertex comprising the greatest value for a parameter r, generating a plurality of points based on stored and determined values, and displaying a geometric shape comprising the plurality of points
SYSTEMS AND METHODS FOR MODELING RADIATION SOURCE
Systems and methods for determining a target multi-source model of a radiation source corresponding to an energy spectrum is provided. The systems may obtain an initial multi-source model of the radiation source, which includes an initial phase space file that includes information of a plurality of simulated particles of a plurality of energy levels. The systems may estimate, based on the initial phase space file, a plurality of component PDD curves corresponding to the plurality of energy levels. The systems may obtain a measured PDD curve corresponding to radiation of the energy spectrum. For each energy level, the systems may determine, based on the plurality of component PDD curves and the measured PDD curve, a weight for the each energy level. The systems may further determine the target multi-source model of the radiation source based at least in part on the initial multi-source model and the weights.