Various embodiments of the present technology provide for the ultra-high density heterogenous integration, enabled by nano-precise pick-and-place assembly. For example, some embodiments provide for the integration of modular assembly techniques with the use of prefabricated blocks (PFBs). These PFBs can be created on one or more sources wafers. Then using pick-and-place technologies, the PFBs can be selectively arranged on a destination wafer thereby allowing Nanoscale-aligned 3D Stacked Integrated Circuit (N3-SI) and the Microscale Modular Assembled ASIC (M2A2) to be efficiently created. Some embodiments include systems and techniques for the construction of construct semiconductor devices which are arbitrarily larger than the standard photolithography field size of 26×33 mm, using pick-and-place assembly.

A system-in-package technology-based process design method and system, a computer readable storage medium, and a device. The system-in-package technology-based process design method includes: acquiring design data of a layout and three-dimensional model data associated with the layout; associating and matching the design data with the three-dimensional model data according to the designed components' attribute information in the design data, and assembling the design data and the three-dimensional model data into an integrated package model; and performing assembly process analysis on the integrated package model to identify unreasonable design points used for design modifications and references, or directly exporting, from the integrated package model, a packaging process manufacturing program for fabrication.

Systems and methods that may be implemented to automatically sense and verify proper mated orientation of a removable BGA package relative to a mating pad array (e.g., of a BGA socket) prior to supplying power to the BGA package. A removable BGA package may be provided with first and second symmetric pins so as to present different respective circuit states on opposing sides of a center point of its BGA package pin array, such that proper orientation of the BGA package occurs only when a designated one of the first and second symmetric pins is mated with a designated pad of the mating pad array. A programmable integrated circuit may in turn sense the circuit state presented at the designated pad to verify proper orientation of the mated BGA package based on the sensed circuit state presented at the designated pad, and may take one or more designated actions based on whether or not proper orientation of the mated BGA package is verified.

Systems and methods are provided for a turnkey modular printed circuit board enclosure that is generated using a template generator. The template generator accepts a user input comprising an enclosure parameter, based on which a manufacturing file may be generated. The manufacturing file may be provided to a fabricator for fabricating the enclosure or the manufacturing file may be modified in a printed circuit board design environment to incorporate a printed circuit board into the enclosure. The printed circuit board may be a separate printed circuit board that is inserted into the enclosure or it may be embedded in a face of the enclosure.

A data storage device including, in one implementation, a number of memory die packages disposed on a substrate within the data storage device. Each memory die package has a die density that includes one or more memory dies. The die density of each memory die package is configured to provide an even thermal distribution across the number of memory die packages. The respective die densities of two memory of the die packages are different from each other.

Machine assisted systems and methods for enhancing the resolution of an IC thermal profile from a system analysis are described. These systems and methods can use a neural network based predictor, that has been trained to determine a temperature rise across an entire IC. The training of the predictor can include generating a representation of two or more templates identifying different portions of an integrated circuit (IC), each template associated with location parameters to position the template in the IC; performing thermal simulations for each respective template of the IC, each thermal simulation determining an output based on a power pattern of tiles of the respective template, the output indicating a change in temperature of a center tile of the respective template relative to a base temperature of the integrated circuit; and training a neural network. The trained predictor can be used to determine a temperature rise and then can be appended to a system level thermal profile of the IC to generate a detailed thermal profile of the IC.

A method for path routing according to an embodiment of the present disclosure may include selecting a first start point and a first end point with which path routing is performed in a circular frame generated by connecting all points included in one or more start point sets included in a layer, one or more end point sets paired with the start point set, and one or more edge point pair sets to one closed curve, generating a connectivity graph by connecting edge points included in one or more nodes corresponding to segments obtained by dividing the circular frame into one or more regions, and connecting the first start point and the first end point based on a cost for connecting the first start point and the first end point calculated using the connectivity graph.

Systems and methods that may be implemented to automatically sense and verify proper mated orientation of a removable BGA package relative to a mating pad array (e.g., of a BGA socket) prior to supplying power to the BGA package. A removable BGA package may be provided with first and second symmetric pins so as to present different respective circuit states on opposing sides of a center point of its BGA package pin array, such that proper orientation of the BGA package occurs only when a designated one of the first and second symmetric pins is mated with a designated pad of the mating pad array. A programmable integrated circuit may in turn sense the circuit state presented at the designated pad to verify proper orientation of the mated BGA package based on the sensed circuit state presented at the designated pad, and may take one or more designated actions based on whether or not proper orientation of the mated BGA package is verified.

Methods, machine readable media and systems for simulating the leakage of sensitive data in an integrated circuit, such as cryptographic data or keys, are described. In one embodiment, a method can include the following operations: performing a first dynamic voltage drop (DVD) simulation on a plurality of locations, distributed across an integrated circuit (IC), based on a physical model that specifies physical layout of components on the IC, the IC storing sensitive data in locations of the layout; performing an IC level side channel correlation analysis between each of the locations and the sensitive data based on the results of the first DVD simulation; and selecting, based upon the IC level side channel correlation analysis, a subset of the locations for further simulations to simulate leakage of the sensitive data. Other methods, media and systems are disclosed.

The current disclosure describes techniques for managing planarization of features formed on a semiconductor wafer. The disclosed techniques achieve relative planarization of micro bump structures formed on a wafer surface by adjusting the pattern density of the micro bumps formed within various regions on the wafer surface. The surface area size of a micro bump formed within a given wafer surface region may be enlarged or reduced to change the pattern density. A dummy micro bump may be inserted into a given wafer surface region to increase the pattern density.