Systems and methods are disclosed for generation and testing of integrated circuit designs with clock crossings between clock domains and reset crossings between reset domains. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. Clock crossings may be automatically generated between modules, inferring the values of design parameters, such as a signaling protocol (e.g. a bus protocol), directionality, and/or a clock crossing type (e.g., synchronous, rational divider, or asynchronous), of a clock crossing. Reset crossings may be automatically generated in a similar manner. For example, implicit classes may be used to generate clock crossings or reset crossings in a flexible manner. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

The embodiments herein discloses a system and method for designing SoC using AI and Reinforcement Learning (RL) techniques. Reinforcement Learning is done either hierarchically in several steps or in a single-step comprising environment, tasks, agents and experiments, to have access to SoC (System on a Chip) related information. The AI agent is configured to learn from the interaction and plan the implementation of a SoC circuit design. Q values generated for each domain and sub domain are stored in a hierarchical SMDP structure in a form of SMDP Q table in a big data database. An optimal chip architecture corresponding to a maximum Q value of a top level in the SMDP Q table is acquired and stored in a database for learning and inference. Desired SoC configuration is optimized and generated based on the optimal chip architecture and the generated chip specific graph library.

A method includes: extracting a first current profile model corresponding to a System on Chip (SOC) at a first design stage of the SOC; determining that a first design data of an Integrated Voltage Regulator (IVR) and the SOC pass a first co-simulation based on the extracted first current profile model; extracting a second current profile model corresponding to the SOC at a second design stage of the SOC, the second design stage being subsequent to the first design stage; refining the first design data of the IVR to generate a second design data of the IVR; determining that the second design data of the IVR and the SOC pass a second co-simulation based on the extracted second current profile model.

Systems and methods are disclosed for automated generation of integrated circuit designs and associated data. These allow the design of processors and SoCs by a single, non-expert who understands high-level requirements; allow the en masse exploration of the design-space through the generation processors across the design-space via simulation, or emulation; allow the easy integration of IP cores from multiple third parties into an SoC; allow for delivery of a multi-tenant service for producing processors and SoCs that are customized while also being pre-verified and delivered with a complete set of developer tools, documentation and related outputs. Some embodiments, provide direct delivery, or delivery into a cloud hosting environment, of finished integrated circuits embodying the processors and SoCs.

This disclosure describes efficient communication of surface texture data between system on a chip (SOC) integrated circuits. An example system includes a first integrated circuit, and at least one second integrated circuit communicatively coupled to the first integrated circuit by a communication interface. The first integrated circuit, upon determining that surface texture data of a frame to be rendered for display by the second SoC integrated circuit is to be updated, (a) transmits the surface texture data in one or more update packets to the second integrated circuit using the communication interface, and (b) transmits a command to the second integrated circuit indicating that the surface texture data of the frame has been updated using the communication interface. The second integrated circuit, upon receipt of the command, (a) sets a pointer to a location in the display buffer storing the surface texture data of the frame, and (b) renders the surface texture data of the frame for display on a display device.

Various embodiments may include integrated circuits (ICs) and methods for designing an integrated circuit (IC), such as a system-on-chip (SOC). Embodiments include methods for planning and producing ICs without communication channels, also referred to as channel-less ICs. Embodiments may include overlay hard macros that support routing and communication design without dedicated communication channels being needed between functional hard macros, such as cores of a SOC. Various embodiments may include an IC in which one or more interconnect hard macros and wires connecting a first functional hard macro, a second functional hard macro and the one or more interconnect hard macros are located within a third functional hard macro. In some embodiments, no communication channel may be present between the first functional hard macro, the second functional hard macro, and the third functional hard macro.

A development support apparatus includes: an estimation unit that estimates behavior of an energy storage device by using an equivalent circuit model reflecting a state of charge (SOC)-operating voltage characteristic in a high change-amount region where an amount of change in an operating voltage with respect to an amount of change in the SOC is relatively higher than in other regions among SOC-operating voltage characteristics during constant current charge and discharge of the energy storage device; and an output unit that outputs a result of an estimation by the estimation unit.

Disclosed herein are related to a method, a device, and a non-transitory computer readable medium for testing a circuit model in an integrated circuit. In one aspect, to each of a plurality of sets of input conditions of a circuit model, a corresponding virtual defect is assigned. The virtual defect may be generated irrespective of a physical characteristic of an integrated circuit formed according to the circuit model. Each virtual defect may be associated with a corresponding set of input conditions. In one aspect, a table of the circuit model including a plurality of logic behavioral models of the circuit model is generated. Each of the plurality of logic behavioral models may include a corresponding set of the plurality of sets of input conditions, a corresponding output result, and the corresponding virtual defect. Based at least in part on the table of the circuit model, a test pattern for the circuit model can be generated.

A programmable operation and control chip, comprising: at least one controller with a control flow operation mode; at least one bus; at least one programmable operation structure with data stream flow operation mode which communicates with the controller via the bus and the data buffering structure to control and schedule the programmable operation structure and/or the data buffering structure, and allocate and process serial and parallel operation of data and/or dynamically reconfigure internal structure of the chip.

Systems and methods are disclosed for synthesis of a network, such as a network-on-chip (NoC), to generate a network description. The system generates a NoC description from a set of physical constraints and performance constraints as well as a set of inputs to a sequencer. The system produces the NoC with all its elements. The resulting network description output includes placement of elements on a floorplan of a chip that represents the network, such as the NoC.