Systems and methods for assembling and developing a System-on-a-chip (SoC) by using templates and designer input data are described. One of the methods includes receiving a request for generating a design of the SoC. In response to the request, a template database is accessed to provide templates of a plurality of designs of systems-on-chips (SoCs). Each of the templates is for a technology application. The method includes receiving a selection of one of the templates. The one of the templates represents components of the SoC. The method also includes receiving a configuration file including configuration data input for the components of the SoC. The method includes compiling the configuration file and a definition file for the SoC to generate design files for the SoC.

The present disclosure presents systems and methods performing a simulation on a hybrid virtual system-on-chip (SoC) model. One such method comprises receiving a configuration file that identifies register transfer level (RTL) abstractions; virtual prototype abstractions; unit-level testbenches; place holder variables; and a shared interface among one or more hardware circuitry blocks designed as RTL abstractions and one or more hardware circuitry blocks designed as virtual prototype abstractions; creating the hybrid virtual SoC model based on the configuration file by instantiating the one or more hardware circuitry blocks designed as RTL abstractions and a stub hardware circuitry block for each of the one or more hardware circuitry blocks designed as virtual prototype abstractions; and integrating unit-level testbenches for the one or more hardware circuitry blocks represented as RTL abstractions.

A chip aka integrated circuit, the chip comprising configuration register/s, typically volatile, and/or at least one on-chip non-volatile memory m typically including at least one reserved memory location, which may be reserved for storing contents of at least one typically volatile configuration register r, from among the configuration registers; and/or apparatus configured for, at least once, storing values which may be indicative of content of at least one typically volatile configuration register r from among the registers, e.g. in the on-chip non-volatile memory m, e.g. at the at least one reserved memory location.

The disclosure provides using test processors to provide a more flexible solution compared to the existing DFX blocks that are used for controlling test networks in chips. The test processors provide a highly flexible solution since programming of the test processors can be changed at any time; even after manufacturing, and can support practically an unlimited number of core chips in any configuration. The high flexibility provided via the test processors can reduce engineering effort needed in design and verification, accelerate schedules, and may prevent additional tapeouts in case of DFX design bugs. By making debug and diagnosis easier by providing an opportunity to change debug behavior as needed, the time-to-market timeline can be accelerated. Accordingly, the disclosure provides a chip with a test processor, a multi-chip processing system with a test processor, and a method of designing a chip having a test processor.

Systems and methods are disclosed for generation and testing of integrated circuit designs with clock crossings between clock domains and reset crossings between reset domains. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. Clock crossings may be automatically generated between modules, inferring the values of design parameters, such as a signaling protocol (e.g. a bus protocol), directionality, and/or a clock crossing type (e.g., synchronous, rational divider, or asynchronous), of a clock crossing. Reset crossings may be automatically generated in a similar manner. For example, implicit classes may be used to generate clock crossings or reset crossings in a flexible manner. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

An integrated circuit including a plurality of standard cells is provided. The integrated circuit includes a first standard cell group including at least two first standard cells, a second standard cell group adjacent to the first standard cell group in a first direction, the second standard cell group including at least one second standard cell, and a first insulating gate bordered by one side of at least one of the first standard cells and one side of the at least one second standard cell, wherein each of the first and second standard cells includes a p-type transistor (pFET) and an n-type transistor (nFET) which are integrated, wherein each of the first and second standard cells has first wiring lines of different designs, and wherein each of the first and second standard cells has the same or different placement of an active region according to the corresponding design.

Systems and methods are disclosed for automated generation of integrated circuit designs and associated data. These allow the design of processors and SoCs by a single, non-expert who understands high-level requirements; allow the en masse exploration of the design-space through the generation processors across the design-space via simulation, or emulation; allow the easy integration of IP cores from multiple third parties into an SoC; allow for delivery of a multi-tenant service for producing processors and SoCs that are customized while also being pre-verified and delivered with a complete set of developer tools, documentation and related outputs. Some embodiments, provide direct delivery, or delivery into a cloud hosting environment, of finished integrated circuits embodying the processors and SoCs.

Technologies are provided for feature-based continuous integration. A feature manifest can be created that identifies versions of program/hardware definition assets (such as source code files and register-transfer-level (RTL) definition files) that are stored in separate source control repositories but are related to a particular application or hardware feature. The identified versions of the assets can be retrieved from the separate repositories and, optionally, built, deployed, and/or tested. For example, a hardware feature manifest can be defined that identifies a version of an RTL definition for a hardware component stored in a first repository and a version of a verification program stored in a second repository. The hardware feature manifest can be used to retrieve the identified RTL definition from the first repository and to deploy it. The identified version of the verification program can be retrieved from the second repository and used to test the deployed RTL definition.

Systems and methods generate the design of a tiled multi-core system-on-chip (SoC). Design specification defining a multitude of cores to be used in the tiled multi-core SoC is analyzed and a multitude of subsystems based on the plurality of cores is built. The subsystems are augmented with one or more network adapters to generate the design of the tiled multi-core SoC. To achieve this, a multitude of IP blocks defined by the specification are retrieved from a design library. Design metadata associated with the IP blocks are extracted. Next, a standardized interface is generated for each of the IP blocks using the design metadata. Thereafter, a bus interface is generated for the IP blocks. Next, a tiled synthesizable register-transfer level code for the SoC design is generated in accordance with received configuration information.

Methods, systems, and computer program products are described for generating synthesizable netlists from register transfer level (RTL) designs to aid with semiconductor device design. These netlists provide RTL design information corresponding to a portion of a semiconductor device. A configuration tracer generates behavior information associated with the RTL design. A register compiler compiles a set of semiconductor devices based on one or more technologies and power, performance, and area (PPA) information related to the semiconductor device. Semiconductor devices generated by the register compiler that meet predefined power, performance, and area conditions are identified. Structural information for aligning the input/output ports of the semiconductor device is generated. A set of one or more synthesizable semiconductor device configurations is created based on user defined parameters such that one of the synthesizable semiconductor device designs may by selected to generate a design netlist with structure-synthesizable input/output boundary compatible semiconductor device modules.