Patent classifications
G06F2115/06
Post-Routing Congestion Optimization
A method includes: identifying a first design rule check (DRC) violation in a cluster box on an integrated circuit layout; locating a first target cell at a first original location in the cluster box, the first target cell being connected to the first DRC violation; detecting a first plurality of candidate locations for the first target cell in the cluster box; calculating resource costs associated with the first plurality of candidate locations; determining a first relocation location, among the first plurality of candidate locations, associated with a minimum resource cost for the first target cell; and relocating the first target cell from the first original location to the first relocation location.
System and method for application specific integrated circuit design
Systems and methods for application specific integrated circuit design using Chronos Links are disclosed. A Chronos Link is an ASIC on-chip and off-chip interconnect communication protocol that allows interfaces to transmit and receive information. The protocol may utilize messages or signals to indicate the availability and/or readiness of information to be exchanged between a producer and a consumer allowing the communication to be placed on hold and to be resumed seamlessly. A method includes inserting gaskets and channel repeaters connected to interfaces of multiple intellectual property (IP) blocks in order to replace traditional links with Chronos Links; performing simplified floorplanning; performing simplified placement; performing simplified clock tree synthesis (CTS) and routing; and performing simplified timing closure.
Method and apparatus for performing register retiming by utilizing native timing-driven constraints
A method for designing a system on a target device includes synthesizing the system. The system is placed on the target device. The system is routed on the target device. Register retiming is performed on the system by applying timing analysis constraints, retiming constraints, bound constraints, and ordering constraints when solving for retiming labels that represent a number and direction of register movement along a path between nodes in the system, and arrival times on all nodes in the system to reflect the maximum delay in the system, to improve timing and meet target delay constraints.
Tapped inductor voltage controlled oscillator
A voltage controlled oscillator includes a resonator and an amplifier. The resonator includes a capacitive element and an inductive element. The inductive element has a plurality of conductive segments forming a physical loop. The inductive element has electrical connections on the physical loop to the plurality of conductive segments forming at least one electrical loop disposed within an interior space formed by the physical loop. The amplifier has an input and an output, the input coupled to a first conductive segment forming a first impedance and the output coupled to a second conductive segment forming a second impedance.
MULTIBODY SIMULATION
Improvements in a molecular-dynamic simulator provide ways to save energy during computation and reduce die area consumed on an integrated circuit. Examples of such improvements include different interaction modules for different ranges, the use of streaming along rows while multicasting along columns in an array of interaction modules, the selection of computation units based on balancing computational costs and communication costs, the use of fences in networks that connect computation units, and the use of bond calculators to carry out specialized bond calculations.
PHOTORESIST DESIGN LAYOUT PATTERN PROXIMITY CORRECTION THROUGH FAST EDGE PLACEMENT ERROR PREDICTION VIA A PHYSICS-BASED ETCH PROFILE MODELING FRAMEWORK
Disclosed are methods of generating a proximity-corrected design layout for photoresist to be used in an etch operation. The methods may include identifying a feature in an initial design layout, and estimating one or more quantities characteristic of an in-feature plasma flux (IFPF) within the feature during the etch operation. The methods may further include estimating a quantity characteristic of an edge placement error (EPE) of the feature by comparing the one or more quantities characteristic of the IFPF to those in a look-up table (LUT, and/or through application of a multivariate model trained on the LUT, e.g., constructed through machine learning methods (MLM)) which associates values of the quantity characteristic of EPE with values of the one or more quantities characteristics of the IFPF. Thereafter, the initial design layout may be modified based on at the determined quantity characteristic of EPE.
Systems and methods for finite difference time domain simulation of an electronic design
The present disclosure relates to a computer-implemented method for use in an electronic design. Embodiments may include receiving, using at least one processor, an electronic design and linking a printed circuit board (PCB) block to a physical layout associated with the electronic design. Embodiments may further include receiving, at a layout environment, at least one simulation parameter and performing, using a finite difference time domain (FDTD) simulator, a time-domain simulation, based upon, at least in part, the at least one simulation parameter.
Effective substitution of global distributed head switch cells with cluster head switch cells
An IC includes a first IC portion and a second IC portion. The IC includes a first set of standard cells in the first IC portion. The IC includes a plurality of memory cells and a second set of standard cells in the second IC portion. The second set of standard cells is located in channels between the memory cells. The IC further includes a plurality of GDHS cells in the first IC portion. The GDHS cells are configured to switch power on and to switch power off to the first set of standard cells. The IC further includes a plurality of CHS cells in the first IC portion. The CHS cells are configured to switch power on and to switch power off to the second set of standard cells in the second IC portion.
Semiconductor LSI design device and design method
Provided is a technology capable of reducing the number of resources necessary for logic implementation in a control device. A semiconductor LSI design device generates a combinational circuit configured with functional blocks defined by a functional block library from an application specification, allocates an operation order of each functional block in the combinational circuit under a condition for starting an operation of a functional block connected to an input pin after ending the operation, converts into a sequence circuit which uses the functional block twice or more in a time division manner, extracts the operation order at a time of execution of the sequential circuit, and determines whether the operation order allocated to the combinational circuit coincide with the extracted operation execution order.
ASIC design methodology for converting RTL HDL to a light netlist
This application discloses the implementation of a self-timed IP with optional clock-less compression and decompression at the boundaries. It also discloses system and methods for application specific integrated circuits to convert RTL code and timing constraints to self-timed circuitry with optional clock-less compression and decompression at the boundaries.