An integrated circuit (IC) device includes at least one delay circuit having an input and an output, and an output connector electrically coupled to the output. The delay circuit further includes a plurality of transistors electrically coupled with each other between the input and the output. The plurality of transistors is configured to delay an input signal received at the input to generate a delayed signal at the output. The output is in a first metal layer. The output connector includes a first conductive pattern in the first metal layer, and a second conductive pattern in a second metal layer different from the first metal layer. The second conductive pattern electrically couples the output to the first conductive pattern.

A method includes acquiring a vector data signal associated with a circuit design, performing a timing update to determine timing information for the circuit design, and identifying a glitch in the circuit design based on a shifted vector waveform. The timing information includes a signal delay associated with a cell of the circuit design. The shifted vector waveform is generated by shifting the vector data signal based on the timing information.

This disclosure relates to signal observability rating. In an example, a method can include propagating a clock signal through a respective module of a circuit design in a forward and backward direction, evaluating clock signal propagation results for the respective module based on a forward and backward clock signal propagation of the clock signal to compute an observability rating for a data signal to be processed by the respective module during formal verification, and updating a current observability rating of the respective property for the data signal to the computed observability rating.

Systems and methods for improving design performance of a layout design through placement of functional and spare cells by leveraging layout dependent effect(LDE) is disclosed. The method includes the steps of: importing a plurality of technology files associated with the layout design into an EDA system; importing a netlist associated with the layout design into the EDA system; importing a standard cell library containing pattern-S timing information of the functional cells and the spare cells; performing floorplan and spare cell insertion, wherein the spare cells are distributed uniformly across the floorplan; and conducting placement and optimization through re-placement of the at least one functional cells and the spare cells to form pattern-S with at least one timing critical cells to improve an overall timing performance of the layout design. According to some embodiments, conducting placement and optimization further includes: moving the at least one spare cells to locations to abut the at least one timing critical cells to form pattern-S for each of the at least one timing critical cells.

Methods and systems for circuit design are described. A tool may detect a timing violation on a signal path connected to a local clock buffer in a circuit model. The local clock buffer may be configured to generate a first clock signal having a first pulse width. The tool may determine a first metric associated with a first type of timing violation, and may determine a second metric associated with a second type of timing violation different from the first type of timing violation. The detected timing violation may be one of the first type and second type of timing violations. The tool may, based on the first metric and the second metric, determine whether to retain the generation of the first clock signal or to configure the local clock buffer to generate a second clock signal having a second pulse width different from the first pulse width.

To increase the efficiency of electronic design automation, at an end point of physical design synthesis optimization flow for a putative integrated circuit design having a plurality of nets, identify at least one congested region in the putative integrated circuit design. Identify those of the nets of the putative integrated circuit design traversing through the at least one congested region, to obtain a plurality of candidate nets for demotion. Demote a plurality of selected nets, selected from the plurality of candidate nets for demotion, from an upper routing layer of the putative integrated circuit design to a lower routing layer of the putative integrated circuit design. At least some of the plurality of selected nets experience a loss of timing quality of result after the demoting.

Example implementations involve systems and methods which can involve storing interface (I/F) communication activity records of a plurality of simulation engines during execution of a co-simulation, and for a subsequent execution of the co-simulation, replacing one or more of the plurality of simulation engines with a simulation engine repeater configured to reproduce I/F communication activity from the stored I/F communication activity records corresponding to the replaced one or more of the plurality of simulation engines during the subsequent execution of the co-simulation and to log a real time consumed for execution of the reproduced I/F communication activity in the subsequent execution and a simulation time consumed for execution of the reproduced I/F communication activity for each simulation step, the real time determined based on a real time difference between a start of each simulation step and completion of synchronization with a co-simulator bus at an end of each simulation step.

An improved system for monitoring clock duty cycles, comprising: a first monitoring circuit configured to record a first quantity of high levels of the monitored clock signal sampled by a first random clock signal; a second monitoring circuit configured to record a second quantity of high levels of the monitored clock signal sampled by a second random clock signal, wherein the phase of the second random clock is adjusted by a second adjustment degree based on a first clock; a third monitoring circuit configured to record a third quantity of high levels of the monitored clock signal sampled by a third random clock signal, wherein the phase of the third random clock is the reverse of that of the first random clock; and a calculation module configured to determine a duty cycle of the monitored clock based on the first quantity, the second quantity, and the third quantity.

A semiconductor device and a method of manufacturing the same are provided. The semiconductor device includes a first conductive pattern on a substrate, a second conductive pattern above the first conductive pattern, and a third conductive pattern above the first conductive pattern, all extending along a first direction. The first conductive pattern is electrically connected in parallel to the second conductive pattern and the third conductive pattern.

A method for simulating a control unit. In the method, relationships between inputs and outputs of software component are modeled for at least one software component of the control unit, and a propagation time behavior of the control unit is simulated on the basis of the relationships.