Patent classifications
G06F2119/12
Block level design method for heterogeneous PG-structure cells
A partitioning method for partitioning a group of power-ground (PG) cells is disclosed. The method includes: placing at least one out-boundary PG cell on a substrate, wherein power strips of the at least one out-boundary PG cell are aligned with corresponding power rails on the substrate; and placing at least one in-boundary PG cell on the substrate, wherein power strips of the at least one in-boundary PG cell are aligned with corresponding power rails on the substrate.
Data Hazard Generation
Implementations are directed to methods, systems, and computer-readable media for data hazard generation for instruction sequence generation. In one aspect, a computer-implemented method includes: obtaining data hazard information defining a data hazard to be generated during computer instruction generation, the data hazard specifying a data dependency between a first instruction and a second instruction occurring after the first instruction, and generating, based on the data hazard information and register usage data of a plurality of registers, an instruction for execution in a current processing cycle that satisfies the data dependency specified by the data hazard. The register usage data specifies, for each register of the plurality of registers, whether data was read from or written into the register in a plurality of processing cycles preceding the current processing cycle.
Techniques for providing optimizations based on categories of slack in timing paths
Systems and methods are provided for using an integrated circuit design tool to analyze timing requirements of a circuit design for an integrated circuit. A slack is calculated for a timing path in the circuit design that fails to satisfy a timing constraint. The slack is decomposed into multiple categories of delays in the timing path. The categories of delays for the slack may include intrinsic margin, clock skew, logic delay, and fabric interconnect delay. The logic delay may include local interconnect delay and logic circuit delay. The fabric interconnect delay may include delays in interconnect elements that are used to make connections between larger blocks of the logic circuits. Different optimization strategies are provided to solve the timing constraint failure for each of the different categories of slack breakdown. Slack profiles of the entire design in each of the four categories of slack are also provided.
MACHINE LEARNING-BASED INTEGRATED CIRCUIT TEST CASE SELECTION FOR TIMING ANALYSIS
Certain aspects of the present disclosure provide techniques for testing integrated circuit designs based on test cases selected using machine learning models. An example method generally includes receiving a plurality of test cases for an integrated circuit. An embedding data set is generated from the plurality of test cases. A respective embedding for a respective test case of the plurality of test cases generally includes a mapping of the respective test case into a multidimensional space. A plurality of test case clusters is generated based on a clustering model and the embedding data set. A plurality of critical test cases for testing the integrated circuit is selected based on the plurality of test case clusters. The integrated circuit is timed based on the plurality of critical test cases and a hard macro defining the integrated circuit.
SYSTEM AND METHOD FOR AREA AND TIMING ASSESSMENT OF A NETWORK-ON-CHIP (NoC) IMPLEMENTATION
A system and method for implementing and generating a network-on-chip (NoC) topology based on area and timing assessment. A topology of the NoC is defined, approximations of area and timing of the topology without optimization are performed; and an exact, complete register transfer level (RTL) description of the topology is generated if the approximated area and timing satisfy constraints.
System and method for generating and using a context block based on system parameters
A system and method for generating a context block using system parameters. The system parameters include objective parameters, functionality parameters, and interface definitions. Context field definitions are received. The system parameters and context fields definitions may be used to determine context fields and context entries. The system parameters may be used to determine context fields and number of context entries. The context module hardware description may be created using context fields, number of context entries, and context field definitions.
APPARATUS AND METHOD FOR ADVANCED MACRO CLOCK SKEWING
A method and system for generating a clock distribution circuit for each macro circuit in an ASIC design are disclosed herein. In some embodiments, a method for generating a clock distribution circuit receives the ASIC design specified in a hardware description language (HDL), places each macro circuit in allocated locations on a semiconductor substrate, generates a custom clock skew information for each macro circuit based on a macro clock delay model, generates a clock distribution circuit for each macro circuit placed on the semiconductor substrate based on the generated custom clock skew information, modifies the clock distribution circuit if the generated clock distribution circuit does not meet timing requirements of the ASIC design, and outputs a physical layout of the ASIC design for manufacturing under a semiconductor fabrication process.
Method, system, and computer program product for implementing electronic design closure with reduction techniques
Disclosed are methods, systems, and articles of manufacture for implementing electronic design closure with reduction techniques. A timing graph and compact timing data for an analysis view of a set of analysis views may be determined for an electronic design. A reduced set of dominant analysis views may be determined based at least in part upon a result of a timing dominance analysis. Timing data may be loaded for at least the reduced set of dominant analysis views; and a design closure task may be performed on the electronic design using at least the timing data and the reduced set of dominance analysis views.
AUTOMATED TIMING CLOSURE ON CIRCUIT DESIGNS
Processing a circuit design includes stabilizing the circuit design by a design tool that performs one or more iterations of implementation, optimization assessment, optimization, and stability assessment until a threshold stability level is achieved. The design tool determines, in response to satisfaction of the threshold stability level, different strategies based on features of the circuit design and likelihood that use of the strategies would improve timing. Each strategy includes parameter settings for the design tool. The design tool executes multiple implementation flows using different sets of strategies to generate alternative implementations. One implementation of the alternative implementations nearest to satisfying a timing requirement is selected. The selected implementation is iteratively optimized to satisfy the timing requirement, while restricting changes to placement of cells and nets on a critical path of the one implementation to less than a threshold portion of cells and nets on the critical path.
Integrated circuit with a dynamics-based reconfigurable logic block
A system can include a nonlinear circuit and a voltage decoder. The nonlinear circuit can perform an operation on an input voltage. The operation can be changed. A voltage decoder can be communicatively coupled to the nonlinear circuit for receiving an output voltage from the nonlinear circuit that results from the operation performed on the input voltage. The voltage decoder can compare the output voltage to a threshold voltage and determine a result of the operation.