One application of deep learning methods and labelled data is for industrial production or work applications. For such applications implemented with machine learning applications, massive amounts of data are required to train, validate, and/or tune models for better fitting the requirements. However, obtaining such data has typically be costly and difficult. Embodiments provide adaptable processes that provide data labelling methods for work settings. Embodiments take advantage of the work or production processes to label and collect data, which save time and money and improves accuracy. Embodiments prevent or reduce the need for worker training costs and human mistake-triggered data labelling problems. Embodiments also improve data labelling quality and speed-up of the development cycle.

This invention provides a system and method for displaying color match information on an acquired image of an object. A model/pattern having a plurality of color test points at locations of stable color is provided. A display process generates visible geometric shapes with respect to the color test points in a predetermined color. An alignment process aligns features of the object with respect to features on the model so that the geometric shapes appear in locations on the object that correspond to locations on the model. The geometric shapes can comprise closed shapes that surround a region expected to be stable color on the object. Such shapes can define circles, squares, diamonds or any other acceptable closed or open shape that is visible to the user on the display.

A method for detecting boxes includes receiving a plurality of image frame pairs for an area of interest including at least one target box. Each image frame pair includes a monocular image frame and a respective depth image frame. For each image frame pair, the method includes determining corners for a rectangle associated with the at least one target box within the respective monocular image frame. Based on the determined corners, the method includes the following: performing edge detection and determining faces within the respective monocular image frame; and extracting planes corresponding to the at least one target box from the respective depth image frame. The method includes matching the determined faces to the extracted planes and generating a box estimation based on the determined corners, the performed edge detection, and the matched faces of the at least one target box.

A method for checking samples for defects is provided, in which image data of the samples are recorded and classified into predeterminable defect categories by a defect detection algorithm, and the samples classified into a defect category are represented in a multi-dimensional confusion matrix as a classification result of the defect detection algorithm, characterized in that—miniature images which reproduce the image data are assigned according to the classified defect categories of the image data to segments of the confusion matrix which represent the defect categories, and these miniature images are displayed visually, —the miniature image is assigned by an interaction with a user or a software robot to a different segment from the assigned segment of the confusion matrix, and is either provided as training image data for the defect detection algorithm or is output as training image data for the defect detection algorithm.

A secondary detection system for integrating automated optical inspection and neural network and a method thereof are disclosed. In the secondary detection system, an automated optical inspection apparatus performs automated optical inspection for pin solder joints on circuit board, and when a detection result indicates abnormal condition, the secondary detection device calculates a detection image probability value based on the component image feature and the template image feature, and calculate pin solder joint image probability values based on the component pin solder joint image feature and the template pin solder joint image feature through siamese neural network, to obtain a minimum probability value among the detection image probability value and pin solder joint image probability values. The minimum probability value is used to determine whether to change the detection result, thereby providing accurate detection result of automated optical inspection and increasing a first pass yield.

Methods and systems for determining information for a specimen are provided. One system includes a computer subsystem configured for removing one or more patterns in a specimen image that do not touch a defect detected in the specimen image thereby generating a modified specimen image. The computer subsystem is also configured for generating one or more hash codes for the modified specimen image. In addition, the computer subsystem is configured for assigning the specimen image to one of multiple groups based on a distance between the one or more hash codes and one or more other hash codes generated for a second modified specimen image generated for a second specimen image.

In a learning phase, a processor of a sample observation device: stores design data on a sample in a storage resource; creates a first learning image as a plurality of input images; creates a second learning image as a target image; and learns a model related to image quality conversion with the first and second learning images. In a sample observation phase, the processor obtains, as an observation image, a second captured image output by inputting a first captured image obtained by imaging the sample with an imaging device to the model. The processor creates at least one of the first and second learning images based on the design data.

According to one embodiment, a detection apparatus includes a processor. The processor acquires height information at a plurality of points in a subject. The processor determines whether or not one or more steps are present at a height equal to or higher than a predetermined height from a reference in the subject based on the height information. The processor detects that the subject is in a state in which a plurality of objects are overlapped, if the number of the steps is equal to or greater than a first threshold value.

A method for analyzing 2D material thin film and a system for analyzing 2D material thin film are disclosed. The detection method includes the following steps: capturing sample images of 2D material thin films; measuring the 2D material thin films by a Raman spectrometer; performing a visible light hyperspectral algorithm on the sample images by a processor to generate a plurality of visible light hyperspectral images; performing a training and validation procedure, performing an image feature algorithm on the visible light hyperspectral images, and establishing a thin film prediction model based on a validation; and capturing a thin-film image to be measured by the optical microscope, performing the visible light hyperspectral algorithm, and then generating a distribution result of the thin-film image to be measured according to an analysis of the thin film prediction model.

A computer-implemented method for surface modeling includes: receiving one or more polarization raw frames of a surface of a physical object, the polarization raw frames being captured with a polarizing filter at different linear polarization angles; extracting one or more first tensors in one or more polarization representation spaces from the polarization raw frames; and detecting a surface characteristic of the surface of the physical object based on the one or more first tensors in the one or more polarization representation spaces.