A codeset having function-code combinations is provisioned on a controlling device to control functions of an intended target device. Input is provided to the controlling device which designates a function to be controlled on the intended target device. From a plurality of codes that are each associated with the designated function in a database stored in a memory of the controlling device a first code that is determined to be valid for use in controlling the designated function on the intended target device is selected. When the codeset is then provisioned on the controlling device, the provisioned codeset includes as a function-code combination thereof the designated function and the first code.

According to one embodiment, a reading support system includes a processing device. The processing device includes an extractor and a type determiner. The extractor extracts a plurality of regions from a candidate region. The candidate region is a candidate of a region in which a meter is imaged. The regions respectively include a plurality of characters of the meter. The type determiner determines a type of the meter based on positions of the regions.

According to one embodiment, a reading support system includes a processing device. The processing device includes an extractor and a type determiner. The extractor extracts a plurality of regions from a candidate region. The candidate region is a candidate of a region in which a meter is imaged. The regions respectively include a plurality of characters of the meter. The type determiner determines a type of the meter based on positions of the regions.

There are provided an automatic inspection system and an automatic inspection method capable of suppressing power consumption of a measurement device. A measurement device includes a sensor unit 11 that measures an inspection target 3, a parameter management unit 13 that determines a predetermined parameter set for the sensor unit based on parameter determination information received from a data collection device 2, and a measurement data generation unit 12 that generates measurement data by analyzing data obtained by the sensor unit measuring the inspection target by using the predetermined parameter. The data collection device includes a parameter determination information generation unit 23 that generates parameter determination information, and a measurement data acquisition unit 21 that specifies the parameter determination information for the measurement device, requests the measurement device to acquire the measurement data, and stores the measurement data acquired from the measurement device.

There are provided an automatic inspection system and an automatic inspection method capable of suppressing power consumption of a measurement device. A measurement device includes a sensor unit 11 that measures an inspection target 3, a parameter management unit 13 that determines a predetermined parameter set for the sensor unit based on parameter determination information received from a data collection device 2, and a measurement data generation unit 12 that generates measurement data by analyzing data obtained by the sensor unit measuring the inspection target by using the predetermined parameter. The data collection device includes a parameter determination information generation unit 23 that generates parameter determination information, and a measurement data acquisition unit 21 that specifies the parameter determination information for the measurement device, requests the measurement device to acquire the measurement data, and stores the measurement data acquired from the measurement device.

To provide a novel semiconductor device or display device. The semiconductor device includes a decoder circuit, an amplifier circuit, and an arithmetic circuit. The amplifier circuit includes a first amplifier and a second amplifier. One of the first amplifier and the second amplifier has a function of inspecting an output of the other of the first amplifier and the second amplifier. The arithmetic circuit has a function of calculating an error of a potential output from the first amplifier or the second amplifier, on the basis of a result of the inspection. The decoder circuit has a function of correcting a video signal input to the decoder circuit by subtracting the error of the potential from the video signal.

To provide a novel semiconductor device or display device. The semiconductor device includes a decoder circuit, an amplifier circuit, and an arithmetic circuit. The amplifier circuit includes a first amplifier and a second amplifier. One of the first amplifier and the second amplifier has a function of inspecting an output of the other of the first amplifier and the second amplifier. The arithmetic circuit has a function of calculating an error of a potential output from the first amplifier or the second amplifier, on the basis of a result of the inspection. The decoder circuit has a function of correcting a video signal input to the decoder circuit by subtracting the error of the potential from the video signal.

The present invention relates to a system, a measurement probe and a method for measuring an electrical property of an electrical circuit, comprising measuring the electrical property by means of a measurement probe connected to the electrical circuit, converting the measured electrical property of the electrical circuit to an optical signal. The method further comprises sending the optical signal, and receiving the optical signal by means of an image sensor configured to record images comprising the measurement probe that transmits the optical signal. The method further comprises processing the recorded images in order to decode the measurement data from the received optical signal.

The present invention relates to a system, a measurement probe and a method for measuring an electrical property of an electrical circuit, comprising measuring the electrical property by means of a measurement probe connected to the electrical circuit, converting the measured electrical property of the electrical circuit to an optical signal. The method further comprises sending the optical signal, and receiving the optical signal by means of an image sensor configured to record images comprising the measurement probe that transmits the optical signal. The method further comprises processing the recorded images in order to decode the measurement data from the received optical signal.

A codeset having function-code combinations is provisioned on a controlling device to control functions of an intended target device. Input is provided to the controlling device which designates a function to be controlled on the intended target device. From a plurality of codes that are each associated with the designated function in a database stored in a memory of the controlling device a first code that is determined to be valid for use in controlling the designated function on the intended target device is selected. When the codeset is then provisioned on the controlling device, the provisioned codeset includes as a function-code combination thereof the designated function and the first code.