The present invention relates to a power conversion device in the power electronics field. An object of the present invention is to provide a technique of determining whether a switching element operates normally or not from a gate monitor signal of a power conversion device, and predicting a sign of a failure by obtaining the temperature of the switching element from a transient state of the switching voltage of the power conversion circuit as a component of the power conversion device without using a new signal path.

A codeset having function-code combinations is provisioned on a controlling device to control functions of an intended target device. Input is provided to the controlling device which designates a function to be controlled on the intended target device. From a plurality of codes that are each associated with the designated function in a database stored in a memory of the controlling device a first code that is determined to be valid for use in controlling the designated function on the intended target device is selected. When the codeset is then provisioned on the controlling device, the provisioned codeset includes as a function-code combination thereof the designated function and the first code.

A codeset having function-code combinations is provisioned on a controlling device to control functions of an intended target device. Input is provided to the controlling device which designates a function to be controlled on the intended target device. From a plurality of codes that are each associated with the designated function in a database stored in a memory of the controlling device a first code that is determined to be valid for use in controlling the designated function on the intended target device is selected. When the codeset is then provisioned on the controlling device, the provisioned codeset includes as a function-code combination thereof the designated function and the first code.

A codeset having function-code combinations is provisioned on a controlling device to control functions of an intended target device. Input is provided to the controlling device which designates a function to be controlled on the intended target device. From a plurality of codes that are each associated with the designated function in a database stored in a memory of the controlling device a first code that is determined to be valid for use in controlling the designated function on the intended target device is selected. When the codeset is then provisioned on the controlling device, the provisioned codeset includes as a function-code combination thereof the designated function and the first code.

A codeset having function-code combinations is provisioned on a controlling device to control functions of an intended target device. Input is provided to the controlling device which designates a function to be controlled on the intended target device. From a plurality of codes that are each associated with the designated function in a database stored in a memory of the controlling device a first code that is determined to be valid for use in controlling the designated function on the intended target device is selected. When the codeset is then provisioned on the controlling device, the provisioned codeset includes as a function-code combination thereof the designated function and the first code.

To provide a novel semiconductor device or display device. The semiconductor device includes a decoder circuit, an amplifier circuit, and an arithmetic circuit. The amplifier circuit includes a first amplifier and a second amplifier. One of the first amplifier and the second amplifier has a function of inspecting an output of the other of the first amplifier and the second amplifier. The arithmetic circuit has a function of calculating an error of a potential output from the first amplifier or the second amplifier, on the basis of a result of the inspection. The decoder circuit has a function of correcting a video signal input to the decoder circuit by subtracting the error of the potential from the video signal.

To provide a novel semiconductor device or display device. The semiconductor device includes a decoder circuit, an amplifier circuit, and an arithmetic circuit. The amplifier circuit includes a first amplifier and a second amplifier. One of the first amplifier and the second amplifier has a function of inspecting an output of the other of the first amplifier and the second amplifier. The arithmetic circuit has a function of calculating an error of a potential output from the first amplifier or the second amplifier, on the basis of a result of the inspection. The decoder circuit has a function of correcting a video signal input to the decoder circuit by subtracting the error of the potential from the video signal.

A codeset having function-code combinations is provisioned on a controlling device to control functions of an intended target device. Input is provided to the controlling device which designates a function to be controlled on the intended target device. From a plurality of codes that are each associated with the designated function in a database stored in a memory of the controlling device a first code that is determined to be valid for use in controlling the designated function on the intended target device is selected. When the codeset is then provisioned on the controlling device, the provisioned codeset includes as a function-code combination thereof the designated function and the first code.

A codeset having function-code combinations is provisioned on a controlling device to control functions of an intended target device. Input is provided to the controlling device which designates a function to be controlled on the intended target device. From a plurality of codes that are each associated with the designated function in a database stored in a memory of the controlling device a first code that is determined to be valid for use in controlling the designated function on the intended target device is selected. When the codeset is then provisioned on the controlling device, the provisioned codeset includes as a function-code combination thereof the designated function and the first code.

The present invention relates to a system, a measurement probe and a method for measuring an electrical property of an electrical circuit, comprising measuring the electrical property by means of a measurement probe connected to the electrical circuit, converting the measured electrical property of the electrical circuit to an optical signal. The method further comprises sending the optical signal, and receiving the optical signal by means of an image sensor configured to record images comprising the measurement probe that transmits the optical signal. The method further comprises processing the recorded images in order to decode the measurement data from the received optical signal.