Disclosed are a display apparatus, a drive chip, and an electronic device. When determining that a disconnected signal line exists, a drive chip sends a control signal to a signal line repair module, so that a shift output end of a first shift unit corresponding to the disconnected signal line outputs an enable signal, so as to control a corresponding connection switch in a connection switch group to be turned on, to enable the disconnected signal line to be electrically connected to a repair line. The display apparatus may repair a disconnected signal line without being returned to a factory and a manual operation.

A display with integrated touch screen includes pixels distributed in an array of rows or pixels connected by row wires and columns of pixels connected by column wires defining a display area on a display substrate. The pixels can comprise mutually exclusive subarrays of pixels forming clusters. Each cluster can be independently controlled and can comprise a touch controller for sensing touches. Each pixel can include one or more micro-iLEDs. A first row wire can be driven with a display signal at the same time the touch controller senses one or more second row wires different from the first row wire. The touch controller can sense multiple row wires at a time or can receive a control signal at a frequency of no less than one MHz on a row wire. In some embodiments, the touch controller comprises a capacitance circuit in an integrated circuit separate from the display substrate.

A cabinet and a method for controlling a cabinet constituting a modular display apparatus are provided. The cabinet constituting a modular display apparatus includes a plurality of display modules; a first interface; a second interface configured to be connected to a first cabinet adjacent to the cabinet; a memory configured to store at least one test image; and a processor configured to, based on a detection that a test device is connected to the first interface, control the plurality of display modules to display the at least one test image, and control the second interface to transmit the at least one test image to the first cabinet to be displayed on the first cabinet.

Systems and methods are disclosed herein for monitoring light emissions in electronic devices. The disclosed techniques herein provide for determining a display duration of display devices for a user. Light emission profiles for each of the display devices are determined. A cumulative emissions exposure is determined that is based on the light emission profiles for the display devices and the display duration of the display devices for the user. A determination is made whether the cumulative emissions exposure exceeds a light emission exposure limit set for the user. In a positive determination, an instruction is transmitted to the display devices for execution of a remedial action based on predefined rules.

A display device includes: a display unit including pixels, wherein each of the pixels includes stacks connected in series and each of the stacks includes a light emitting element; a storage to store pieces of stack number information, wherein each of the pieces of the stack number information indicates the number of stacks constituting an effective light source from among the stacks for each of the pixels; a compensator to generate compensated data by compensating image data based on the pieces of the stack number information; and a data driver to generate data voltages based on the compensated data and to provide the data voltages to the display unit. The pixels are to emit light with luminances corresponding to the data voltages.

The application provides a display device and a driving method thereof, and an electronic device. The display device driving method obtains a first driving parameter and a first compensation value of the display device, determines an abnormal driving parameter of the display device based on the first driving parameter and the first compensation value of the display device, then determines a second compensation value of the display device based on the abnormal driving parameter of the display device, and drives the display device using the second compensation value and the first driving parameter.

A semiconductor device includes first to tenth transistors and first to fourth capacitors. Gates of the first and the fourth transistors are electrically connected to each other. First terminals of the first, second, fifth, and eighth transistors are electrically connected to a first terminal of the fourth capacitor. A second terminal of the fifth transistor is electrically connected to a gate of the sixth transistor and a first terminal of the second capacitor. A second terminal of the eighth transistor is electrically connected to a gate of the ninth transistor and a first terminal of the third capacitor. Gates of the second, seventh, and tenth transistors are electrically connected to first terminals of the third and fourth transistors and a first terminal of the first capacitor. First terminals of the sixth and seventh transistors are electrically connected to a second terminal of the second capacitor.

A chip on film (COF) package in which a predetermined driving integrated circuit (IC) is mounted includes a wiring structure connected to the driving IC, and a test pad connected to the wiring structure, wherein the test pad includes a base film divided into a first region and a second region, and a conductive layer located in the first region, and the second region is surrounded by the first region in a plan view.

Methods, apparatus, and systems for mitigating pinhole defects in optical devices such as electrochromic windows. One method mitigates a pinhole defect in an electrochromic device by identifying the site of the pinhole defect and obscuring the pinhole to make it less visually discernible. In some cases, the pinhole defect may be the result of mitigating a short-related defect.

An organic light-emitting diode (OLED) display panel and an OLED display device have a display region and a non-display region surrounding the display region. The non-display region includes a bonding region, a first fan-out line region, a bending region, and a second fan-out line region. A bonding test region is arranged between the bonding region and the first fan-out line region, a bonding test circuit is arranged in the bonding test region, and the bonding test circuit is used to detect whether a fan-out data line passing through the bonding region is abnormal.