A test fixture for testing magnetic heads to be used in a magnetic data recording system. The test fixture includes a test fixture body that includes lead terminals. The lead terminals, which can be constructed of Si have a top surface and first and second laterally opposed sides. An electrically conductive material is formed over the lead terminal and extends down the sides of the lead terminal. Extending the lead terminal down the sides of the lead terminal as well as over the top surface provides improved adhesion of the electrically conductive lead material to the lead terminal. This improved adhesion is especially beneficial for use in such a test fixture, because the test fixture is designed to flex during use, which would otherwise contribute to de-lamination of the electrically conductive lead material from the lead terminal.

A test fixture for testing magnetic heads to be used in a magnetic data recording system. The test fixture includes a test fixture body that includes lead terminals. The lead terminals, which can be constructed of Si have a top surface and first and second laterally opposed sides. An electrically conductive material is formed over the lead terminal and extends down the sides of the lead terminal. Extending the lead terminal down the sides of the lead terminal as well as over the top surface provides improved adhesion of the electrically conductive lead material to the lead terminal. This improved adhesion is especially beneficial for use in such a test fixture, because the test fixture is designed to flex during use, which would otherwise contribute to de-lamination of the electrically conductive lead material from the lead terminal.

A test coupon includes a pseudo element circuit which is constituted of a main circuit section and an adjusting section. The main circuit section includes a first pattern conductor and second pattern conductors. The first pattern conductor and the second pattern conductors overlap one another with a dielectric layer interposed therebetween. The first pattern conductor electrically conducts to the second pattern conductors. The main circuit section represents the R-component and the L-component of an equivalent circuit, and is a dominant circuit element which determines a signal waveform. The adjusting section includes linear conductors. A peak of a voltage waveform is suppressed by the R- and L-components of the adjusting section.

A set of consecutive user data wedges are each located between consecutive servo wedges of a heat-assisted recording medium. Test data is written at least every other one of the consecutive data wedges using different laser power values. Based on reading the test data, a nominal laser power is selected for use by the read/write head.

A set of consecutive user data wedges are each located between consecutive servo wedges of a heat-assisted recording medium. Test data is written at least every other one of the consecutive data wedges using different laser power values. Based on reading the test data, a nominal laser power is selected for use by the read/write head.

The invention provides a method and apparatus for scanning a read/write head of a hard disk drive during manufacture. The method comprises: providing a magnetic sensor; moving the magnetic sensor relative to and in close proximity to the read/write head under test; obtaining measurements from the head under test or the sensor, representing a two-dimensional magnetic map; processing the map to obtain an accurate map of the head sensitivity of the head under test from which the key performance characteristics of the head can be obtained.

The invention provides a method and apparatus for scanning a read/write head of a hard disk drive during manufacture. The method comprises: providing a magnetic sensor; moving the magnetic sensor relative to and in close proximity to the read/write head under test; obtaining measurements from the head under test or the sensor, representing a two-dimensional magnetic map; processing the map to obtain an accurate map of the head sensitivity of the head under test from which the key performance characteristics of the head can be obtained.

According to an embodiment, a bonding strength test device measures bonding strength between a flexure of a suspension of a hard disk drive and microactuators mounted on a gimbal of the flexure. The bonding strength test device includes a clamp, dummy, and device body. The clamp fixes the flexure. The dummy is adhered to the microactuators. The probe is engaged in the dummy. The device body measures a tensile load applied to the probe while the probe is pulled toward a direction to be apart from the flexure.

According to an embodiment, a bonding strength test device measures bonding strength between a flexure of a suspension of a hard disk drive and microactuators mounted on a gimbal of the flexure. The bonding strength test device includes a clamp, dummy, and device body. The clamp fixes the flexure. The dummy is adhered to the microactuators. The probe is engaged in the dummy. The device body measures a tensile load applied to the probe while the probe is pulled toward a direction to be apart from the flexure.

A lumped-parameter function δ is determined that represents an average power dissipated by a write transducer when writing a signal to a magnetic recording medium. Temperatures of the write transducer are measured while varying the parameters to determine constants of the function δ. The function δ is used to adjust power applied to a clearance control heater when writing to the magnetic recording medium.