Characterizing virgin tape cartridges in a characterization tape library and then sending the characterized tape cartridges to an end-user's library saves time and effort at the end-user's site. A characterized tape cartridge can be universally used in any compatible tape library if the virgin tape cartridge is characterized in a target calibration window that is within a specific range of heat and humidity. A calibration library can act as a ‘middleman’ receiving a virgin tape cartridge directly from an OEM. The virgin tape cartridge can be characterized followed by storing a record of the calibration in the tape cartridge's MAM while in the calibration library. The now post-characterized tape cartridge is then on to a user's tape library for use instead of just simply sending a virgin tape cartridge to the end user's library. The record in the MAM effectively changes the designation of the virgin tape cartridge to a post-calibrated tape cartridge.

Characterizing virgin tape cartridges in a characterization tape library and then sending the characterized tape cartridges to an end-user's library saves time and effort at the end-user's site. A characterized tape cartridge can be universally used in any compatible tape library if the virgin tape cartridge is characterized in a target calibration window that is within a specific range of heat and humidity. A calibration library can act as a ‘middleman’ receiving a virgin tape cartridge directly from an OEM. The virgin tape cartridge can be characterized followed by storing a record of the calibration in the tape cartridge's MAM while in the calibration library. The now post-characterized tape cartridge is then on to a user's tape library for use instead of just simply sending a virgin tape cartridge to the end user's library. The record in the MAM effectively changes the designation of the virgin tape cartridge to a post-calibrated tape cartridge.

According to one embodiment, an evaluation method of a magnetic head is disclosed. The method can include acquiring an electrical signal obtained from a magnetic element when supplying a first alternating current to a coil of a magnetic head and supplying a second current to the magnetic element. The magnetic head includes a first magnetic pole, a second magnetic pole, and a coil. The magnetic element is provided between the first magnetic pole and the second magnetic pole, and includes a first magnetic layer. The method can include detecting a time required for a change of an electrical resistance of the magnetic element based on a time when a polarity of the first alternating current is reversed based on the electrical signal.

According to one embodiment, an evaluation method of a magnetic head is disclosed. The method can include acquiring an electrical signal obtained from a magnetic element when supplying a first alternating current to a coil of a magnetic head and supplying a second current to the magnetic element. The magnetic head includes a first magnetic pole, a second magnetic pole, and a coil. The magnetic element is provided between the first magnetic pole and the second magnetic pole, and includes a first magnetic layer. The method can include detecting a time required for a change of an electrical resistance of the magnetic element based on a time when a polarity of the first alternating current is reversed based on the electrical signal.

A heat generating component of a slider is energized at a predetermined frequency. The heat generating component changes a spacing between a medium and the slider. A temperature response proximate a media-facing surface of the slider is measured while the heating element is energized. Based on the measured temperature response, a determination is made as to whether the media-facing surface is contaminated. In response to determining that the media-facing surface is contaminated, remedial action is taken.

A slider of a heat-assisted recording head comprises electrical bond pads coupled to bias sources and a ground pad, an air bearing surface, and a waveguide configured to receive light from a laser source. A contact sensor proximate the air bearing surface is coupled between a first bond pad and a second bond pad. A bolometer is coupled to a reference thermal sensor. The bolometer is situated at a slider location that receives at least some of the light communicated along the waveguide. The reference thermal sensor is situated at a slider location unexposed to the light communicated along the waveguide. The bolometer and reference thermal sensor are coupled between the first and second bond pads and in parallel with the contact sensor. A ground connection is coupled to the ground pad and at a connection between the bolometer and the reference thermal sensor.

A data storage device is disclosed comprising a head actuated over a disk, wherein the head comprises a laser configured to heat the disk while writing data to the disk. At least four different laser powers are applied to the laser and a fly height of the head over the disk is measured at each laser power. A lasing threshold power for the laser is detected based on the measured fly heights.

A diamond probe is suitable to be attached to an Atomic Force Microscope and is created with a tip that incorporates a one or more Nitrogen Vacancy (NV) centers located near the end of the tip. The probe arm acts as an optical waveguide to propagate the emission from the NV center with high efficiency and a beveled end directs excitation light to the NV center and directs photoluminescence light emanating from the NV center into the probe arm. The light source (or a portion of the light source), a detector, as well as an RF antenna, if used, may be mounted to the probe arm. The probe with integrated components enable excitation of photoluminescence in the NV center as well as optically detected Electron Spin Resonance (ODMR) and temperature measurements, and may further serve as a light probe utilizing the physical effect of Stimulated Emission Depletion (STED).

A diamond probe is suitable to be attached to an Atomic Force Microscope and is created with a tip that incorporates a one or more Nitrogen Vacancy (NV) centers located near the end of the tip. The probe arm acts as an optical waveguide to propagate the emission from the NV center with high efficiency and a beveled end directs excitation light to the NV center and directs photoluminescence light emanating from the NV center into the probe arm. The light source (or a portion of the light source), a detector, as well as an RF antenna, if used, may be mounted to the probe arm. The probe with integrated components enable excitation of photoluminescence in the NV center as well as optically detected Electron Spin Resonance (ODMR) and temperature measurements, and may further serve as a light probe utilizing the physical effect of Stimulated Emission Depletion (STED).

A diamond probe is suitable to be attached to an Atomic Force Microscope and is created with a tip that incorporates a one or more Nitrogen Vacancy (NV) centers located near the end of the tip. The probe arm acts as an optical waveguide to propagate the emission from the NV center with high efficiency and a beveled end directs excitation light to the NV center and directs photoluminescence light emanating from the NV center into the probe arm. The probe tip is scanned over an area of a sample with an electric charge, such as a field effect transistor or flash memory. Optically Detected Spin Resonance (ODMR) is measured as the probe tip is scanned over the area of the sample, from which a characteristic of the area of the sample with the electric charge may be determined.