An integrated circuit may be provided. The integrated circuit may include a transmitter and a receiver. The transmitter outputs first transmission data to a first channel and outputs second transmission data to a second channel. The phase of the first transmission data transmitted through the first channel is different from a phase of the second transmission data transmitted through the second channel.

Techniques for reducing disturbance in a semiconductor memory device are disclosed. In one particular exemplary embodiment, the techniques may be realized as a semiconductor memory device having reduced disturbance. The semiconductor memory device may comprise a plurality of memory cells arranged in arrays of rows and columns. The semiconductor memory device may also comprise a plurality of data sense amplifiers, coupled to the plurality of memory cells, configured to perform one or more operations during an operation/access cycle, wherein the operation/access cycle may comprise an operation segment and a disturbance recovery segment.

Techniques for reducing disturbance in a semiconductor memory device are disclosed. In one particular exemplary embodiment, the techniques may be realized as a semiconductor memory device having reduced disturbance. The semiconductor memory device may comprise a plurality of memory cells arranged in arrays of rows and columns. The semiconductor memory device may also comprise a plurality of data sense amplifiers, coupled to the plurality of memory cells, configured to perform one or more operations during an operation/access cycle, wherein the operation/access cycle may comprise an operation segment and a disturbance recovery segment.

A semiconductor device may be provided. The semiconductor device may include an address input circuit and a target address generation circuit. The address input circuit may be configured to latch a bank address and an address to generate a bank active signal and a latch address based on the execution of an active operation. The target address generation circuit may be configured to generate the latch address as a target address.

A semiconductor integrated circuit is described. A transmitter-receiver transmits and receives data to and from outside by a first external terminal and transmits a first control signal by a second external terminal. When another data is transmitted after the data is transmitted and when a data transmission interval from a time when the data is transmitted to a time when the another data is transmitted is equal to or smaller than a first threshold, the transmitter-receiver continuously outputs, from the first external terminal, a potential level of about ½ of a potential level obtained by adding a first potential level and a second potential level, during the data transmission interval, and changes the second potential level of the first control signal to the first potential level when the data transmission interval exceeds the first threshold.

A semiconductor integrated circuit is described. A transmitter-receiver transmits and receives data to and from outside by a first external terminal and transmits a first control signal by a second external terminal. When another data is transmitted after the data is transmitted and when a data transmission interval from a time when the data is transmitted to a time when the another data is transmitted is equal to or smaller than a first threshold, the transmitter-receiver continuously outputs, from the first external terminal, a potential level of about ½ of a potential level obtained by adding a first potential level and a second potential level, during the data transmission interval, and changes the second potential level of the first control signal to the first potential level when the data transmission interval exceeds the first threshold.

The present disclosure provides a gate drive circuit including a plurality of cascaded shift register circuits, each shift register circuit include a signal transmission circuit and a nor gate latching circuit, wherein the signal transmission circuit includes a first signal transmission circuit and a second signal transmission circuit, the first signal transmission circuit transmits high part of a previous level transmission signal based on a first clock signal to the nor gate latching circuit, the second signal transmission circuit transmits low part of a previous level transmission signal based on the first clock signal to the nor gate latching circuit to perform latch, and a second clock signal triggers to output a current level gate drive pulse. In the above manner, the present disclosure is suitable for process of CMOS, low power consumption and noise margin width.

Techniques are described herein for mitigating parasitic signals induced by state transitions during an access operation of a selected memory cell in a memory device. Some memory devices may include a plate that is coupled with memory cells associated with a plurality of digit lines and/or a plurality of word lines. Because the plate is coupled with a plurality of digit lines and/or word lines, unintended coupling between various components of the memory device may occur during an access operation. To mitigate parasitic signals induced by the unintended coupling, the memory device may isolate the selected memory cell from a selected digit line during certain portions of the access operation. The memory device may isolate the selected memory cell when the plate transitions from a first voltage to a second, when the selected digit line transitions from a third voltage to a fourth voltage, or a combination thereof.

Techniques are described herein for mitigating parasitic signals induced by state transitions during an access operation of a selected memory cell in a memory device. Some memory devices may include a plate that is coupled with memory cells associated with a plurality of digit lines and/or a plurality of word lines. Because the plate is coupled with a plurality of digit lines and/or word lines, unintended coupling between various components of the memory device may occur during an access operation. To mitigate parasitic signals induced by the unintended coupling, the memory device may isolate the selected memory cell from a selected digit line during certain portions of the access operation. The memory device may isolate the selected memory cell when the plate transitions from a first voltage to a second, when the selected digit line transitions from a third voltage to a fourth voltage, or a combination thereof.

Methods of operating a memory device having embedded leak checks may mitigate data loss events due to access line defects, and may facilitate improved power consumption characteristics. Such methods might include applying a program pulse to a selected access line coupled to a memory cell selected for programming, verifying whether the selected memory cell has reached a desired data state, bringing the selected access line to a first voltage, applying a second voltage to an unselected access line, applying a reference current to the selected access line, and determining if a current flow between the selected access line and the unselected access line is greater than the reference current.