G11C7/06

Sense Amplifier Mapping and Control Scheme for Non-Volatile Memory
20220406342 · 2022-12-22 · ·

A data storage includes a memory array including a plurality of memory cells, and peripheral circuitry disposed underneath the memory array. The peripheral circuitry includes an M-tier sense amplifier (SA) circuit including X stacks of SA latches, wherein each SA latch is respectively coupled to a bit line of a memory cell of the plurality of memory cells; and an N-tier memory cache data (XDL) circuit including Y stacks of XDL latches, wherein M is less than N, and X is greater than Y. The peripheral circuitry further includes data path circuitry coupling (i) each SA latch of the X stacks of SA latches to (ii) a respective XDL latch of the Y stacks of XDL latches.

COMPUTING MEMORY SYSTEMS
20220399060 · 2022-12-15 · ·

Memories, memory controllers, and computing systems and their methods of operation are disclosed. In some embodiments, a method of accessing a memory includes accessing a first bit line corresponding to a sense amplifier and accessing a second bit line corresponding to the sense amplifier. In some embodiments, a memory controller includes a second memory configured to store data of a second data type. In some embodiments, a method includes operating a memory in a second mode in response to receiving an input to change the operation of the memory from a first mode to the second mode.

SUB-SENSE AMPLIFIER AND SEMICONDUCTOR MEMORY DEVICE

A sub-sense amplifier includes a semiconductor substrate, a first pair of complementary transistors, a second pair of complementary transistors, and at least one ground transistor. The first pair and second pair of complementary transistors and the ground transistor are formed on the semiconductor substrate. The first pair of complementary transistors are disposed in line symmetry with a center line of the sub-sense amplifier as a symmetry axis, and gates of the first pair of complementary transistors are coupled to a node. The second pair of complementary transistors are also disposed in line symmetry with the center line, wherein the current directions of the second pair of complementary transistors are the same. Sources and drains of the first pair of complementary transistors are coupled to gates and sources of the second pair of complementary transistors, respectively. The ground transistor connects in series with the second pair of complementary transistors.

Data caching for ferroelectric memory
11520485 · 2022-12-06 · ·

Methods, systems, and devices for operating a memory device are described. One method includes caching data of a memory cell at a sense amplifier of a row buffer upon performing a first read of the memory cell; determining to perform at least a second read of the memory cell after performing the first read of the memory cell; and reading the data of the memory cell from the sense amplifier for at least the second read of the memory cell.

MEMORY REFRESH
20220383915 · 2022-12-01 ·

Performing refresh operation in a memory device is provided. A refresh operation without address rotation is performed in a cell array of the memory device. Performing the refresh operation without address rotation is repeated for a predetermined number of times. After repeating performing the refresh operation with address rotation for the predetermined number of times, a refresh operation with address rotation is performed in the cell array.

MEMORY REFRESH
20220383915 · 2022-12-01 ·

Performing refresh operation in a memory device is provided. A refresh operation without address rotation is performed in a cell array of the memory device. Performing the refresh operation without address rotation is repeated for a predetermined number of times. After repeating performing the refresh operation with address rotation for the predetermined number of times, a refresh operation with address rotation is performed in the cell array.

STORAGE DEVICE
20220383971 · 2022-12-01 · ·

A storage device includes a storage circuit, a reading circuit, a first check circuit, and a second check circuit. The storage circuit includes a plurality of sense amplifier arrays and a plurality of storage unit arrays which are arranged alternately. A first data wire is electrically connected to each of the sense amplifier arrays. The reading circuit is configured to read data on the first data wire. Both the first check circuit and the second check circuit are electrically connected to the reading circuit. The reading circuit is configured to transmit a part of the read data to the first check circuit for error checking and/or correcting, and transmit another part of the read data to the second check circuit for error checking and/or correcting. The data transmitted to the first check circuit and the data transmitted to the second check circuit are respectively from adjacent sense amplifier arrays.

STORAGE DEVICE
20220383971 · 2022-12-01 · ·

A storage device includes a storage circuit, a reading circuit, a first check circuit, and a second check circuit. The storage circuit includes a plurality of sense amplifier arrays and a plurality of storage unit arrays which are arranged alternately. A first data wire is electrically connected to each of the sense amplifier arrays. The reading circuit is configured to read data on the first data wire. Both the first check circuit and the second check circuit are electrically connected to the reading circuit. The reading circuit is configured to transmit a part of the read data to the first check circuit for error checking and/or correcting, and transmit another part of the read data to the second check circuit for error checking and/or correcting. The data transmitted to the first check circuit and the data transmitted to the second check circuit are respectively from adjacent sense amplifier arrays.

Storage circuit provided with variable resistance elements, reference voltage circuit and sense amplifier
11514964 · 2022-11-29 · ·

A storage circuit (11) includes memory cells (MCij), each of which includes an MTJ element, and reference cells (RCi), each of which includes a series circuit of an MTJ element set to a low-resistance state and a linear resistor (FR). A RW circuit (23j) that includes a sense amplifier is provided in each column of a memory cell array (21), and compares a data voltage on a corresponding bit line (BLj) with a reference voltage. The sense amplifier includes a pair of PMOS transistors to which the data voltage and the reference voltage are applied, a CMOS sense latch that is connected to a current path of the PMOS transistors.

METHODS FOR INCREASING INTRACELLULAR ACTIVITY OF HSP70
20220374361 · 2022-11-24 ·

The present invention relates to a bioactive agent capable of increasing the intracellular concentration and/or activity of Hsp70 for use in the treatment of a lysosomal storage disease which arise from a defect in an enzyme whose activity is not directly associated with the presence of lysosomal BMP as a co-factor; such as glycogen storage diseases, gangliosidoses, neuronal ceroid lipofuscinoses, cerebrotendinous cholesterosis, Wolman's disease, cholesteryl ester storage disease, disorders of glycosaminoglycan metabolism, mucopolysaccharidoses, disorders of glycoprotein metabolism, mucolipidoses, aspartylglucosaminuria, fucosidosis, mannosidoses, and sialidosis type II.