The present disclosure includes apparatuses and methods related to memory topologies. An apparatus may include a first plurality of clam-shell paired memory devices arranged in a star connection topology, each clam-shelled pair of the first plurality of memory devices being coupled by a respective matched branch to a first common command address signal trace. The apparatus may include a second plurality of memory devices coupled to a second common command address signal trace.

An example method may be used to perform concurrent compensation in a memory array. The example method may include decoding a prime row address corresponding to a respective prime memory cell row of a first row section of a memory array mat to provide a prime section signal, and in response to a determination that the prime row address matches a defective prime row address, providing a redundant section signal corresponding to a respective redundant memory cell row of a second row section of the memory array mat. In response to the prime section signal, initiating a first threshold voltage compensation operation on first sensing circuitry coupled to the first row section; and in response to the redundant section signal indicating a defective prime row, initiating a second threshold voltage compensation operation on second sensing circuitry coupled to the second row section concurrent with the first threshold voltage compensation operation.

An example method may be used to perform concurrent compensation in a memory array. The example method may include decoding a prime row address corresponding to a respective prime memory cell row of a first row section of a memory array mat to provide a prime section signal, and in response to a determination that the prime row address matches a defective prime row address, providing a redundant section signal corresponding to a respective redundant memory cell row of a second row section of the memory array mat. In response to the prime section signal, initiating a first threshold voltage compensation operation on first sensing circuitry coupled to the first row section; and in response to the redundant section signal indicating a defective prime row, initiating a second threshold voltage compensation operation on second sensing circuitry coupled to the second row section concurrent with the first threshold voltage compensation operation.

There is provided a storage apparatus that includes an address obtaining section, and a write processing section. The address obtaining section is configured to obtain a normal write address and an alternative write address before data writing to the normal write address, the normal write address being designated as a destination of the data writing, the alternative write address being used when the data writing is failed. The write processing section is configured to perform the data writing to the normal write address when instructed for the data writing, and perform the data writing to the alternative write address when the data writing to the normal write address is failed.

There is provided a storage apparatus that includes an address obtaining section, and a write processing section. The address obtaining section is configured to obtain a normal write address and an alternative write address before data writing to the normal write address, the normal write address being designated as a destination of the data writing, the alternative write address being used when the data writing is failed. The write processing section is configured to perform the data writing to the normal write address when instructed for the data writing, and perform the data writing to the alternative write address when the data writing to the normal write address is failed.

A multiport memory includes an address control circuit, a memory array, a data input-output circuit and a control circuit and first and second address signals and a clock signal are input through two ports. The address control circuit includes first and second latch circuits, a selection circuit, a decode circuit and a word line drive circuit. The first address signal input through one port is input into the first latch circuit and the second address signal input through the other port is input into the selection circuit. The selection circuit selects one of the first and second address signals, the second latch circuit latches and outputs the selected address signal to the decode circuit. The word line drive circuit drives a word line on the basis of an output signal from the decode circuit.

A memory controller includes logic circuitry to generate a first data address identifying a location in a first external memory array for storing first data, a first tag address identifying a location in a second external memory array for storing a first tag, a second data address identifying a location in the second external memory array for storing second data, and a second tag address identifying a location in the first external memory array for storing a second tag. The memory controller includes an interface that transfers the first data address and the first tag address for a first set of memory operations in the first and the second external memory arrays. The interface transfers the second data address and the second tag address for a second set of memory operations in the first and the second external memory arrays.

A memory controller includes logic circuitry to generate a first data address identifying a location in a first external memory array for storing first data, a first tag address identifying a location in a second external memory array for storing a first tag, a second data address identifying a location in the second external memory array for storing second data, and a second tag address identifying a location in the first external memory array for storing a second tag. The memory controller includes an interface that transfers the first data address and the first tag address for a first set of memory operations in the first and the second external memory arrays. The interface transfers the second data address and the second tag address for a second set of memory operations in the first and the second external memory arrays.

One aspect of this description relates to a memory array. The memory array includes a plurality of N-stack pass gates, a plurality of enable lines, a plurality of NMOS stacks, a plurality of word lines, and a matrix of resistive elements. Each N-stack pass gate includes a stage-1 PMOS core device and a stage-N PMOS core device in series. Each stage-1 PMOS is coupled to a voltage supply. Each enable line drives a stack pass gate. Each N-stack selector includes a plurality of NMOS stacks. Each NMOS stack includes a stage-1 NMOS core device and a stage-N N MOS core device in series. Each stage-1 NMOS core device is coupled to a ground rail. Each word line is driving a stack selector. Each resistive element is coupled between a stack pass gate and a stack selector. Each voltage supply is greater than a breakdown voltage for each of the core devices.

The present disclosure includes apparatuses and methods related to memory topologies. An apparatus may include a first plurality of clam-shell paired memory devices arranged in a star connection topology, each clam-shelled pair of the first plurality of memory devices being coupled by a respective matched branch to a first common command address signal trace. The apparatus may include a second plurality of memory devices coupled to a second common command address signal trace.