Patent classifications
G11C8/18
WORD LINE VOLTAGE DETECTION CIRCUIT FOR ENCHANCED READ OPERATION
Technology herein provides a performance-enhanced memory device including a memory array including a local word line circuit and a plurality of local word lines coupled to the local word line circuit, a word line (WL) sense circuit coupled to an access node in the local word line circuit, the WL sense circuit to sense a voltage level in the local word line circuit while bypassing a disturbance to operation of the local word lines and to provide an output signal that indicates when the voltage level has reached a high voltage threshold value to enable a read operation. The technology also provides read logic coupled to the WL sense circuit, the read logic to receive the output signal from the WL sense circuit, and trigger a read operation for one or more cells in the memory array when the output signal indicates that the voltage level has reached the high voltage threshold value.
MEMORY DEVICE PERFORMING SELF-CALIBRATION BY IDENTIFYING LOCATION INFORMATION AND MEMORY MODULE INCLUDING THE SAME
A memory device of a memory module includes a CA buffer that receives a command/address (CA) signal through a bus shared by a memory device different from the memory device of the memory module, and a calibration logic circuit that identifies location information of the memory device on the bus. The memory device recognizes its own location on a bus in a memory module to perform self-calibration, and thus, the memory device appropriately operates even under an operation condition varying depending on a location in the memory module.
MEMORY DEVICE PERFORMING SELF-CALIBRATION BY IDENTIFYING LOCATION INFORMATION AND MEMORY MODULE INCLUDING THE SAME
A memory device of a memory module includes a CA buffer that receives a command/address (CA) signal through a bus shared by a memory device different from the memory device of the memory module, and a calibration logic circuit that identifies location information of the memory device on the bus. The memory device recognizes its own location on a bus in a memory module to perform self-calibration, and thus, the memory device appropriately operates even under an operation condition varying depending on a location in the memory module.
MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME
A memory device includes a memory cell array configured to store data; and a data output circuit configured to transmit status data to an external device through at least one data line in a latency period in response to a read enable signal received from the external device and transmit the data read from the memory cell array to the external device through the at least one data line in a period subsequent to the latency period.
MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME
A memory device includes a memory cell array configured to store data; and a data output circuit configured to transmit status data to an external device through at least one data line in a latency period in response to a read enable signal received from the external device and transmit the data read from the memory cell array to the external device through the at least one data line in a period subsequent to the latency period.
APPARATUS INCLUDING PARALLEL PIPELINE CONTROL AND METHODS OF MANUFACTURING THE SAME
Methods, apparatuses, and systems related to coordinating a set of timing-critical operations across parallel processing pipelines are described. The coordination may include selectively using (1) circuitry associated with a corresponding pipeline to generate enable signals associated with the timing critical operations when a separation between the operations corresponds to a number of pipelines or (2) circuitry associated with a non-corresponding or another pipeline when the separation is not a factor of the number of pipelines.
POWER SUPPLY TRACKING CIRCUITRY FOR EMBEDDED MEMORIES
Tracking circuitry for a memory device is disclosed. The tracking circuitry includes an inverter, a level shifter, delay circuitry, and a logic gate. The inverter is configured to receive a first clock signal and generate an inverted clock signal. The level shifter is configured to receive the first clock signal and the inverted clock signal and generate a level shifted clock signal. The delay circuitry is configured to receive the level shifted clock signal and generate an inverted level shifted clock signal. The logic gate comprises a first input configured to receive the first clock signal and a second input configured to receive the inverted level shifted clock signal. The logic gate is configured to generate a second clock signal based on the first clock signal and the inverted level shifted clock signal.
ADDRESS LATCH, ADDRESS CONTROL CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE ADDRESS CONTROL CIRCUIT
An address latch includes a first address processing unit and a second address processing unit. The first address processing unit latches an external address signals to output first latched signals through an output node based on a read command and a write command. The second address processing unit latches the external address signals based on the read command with a burst length set to a first value and outputs second latched signals through the output node based on an internal read command.
DUAL-ADDRESS COMMAND MANAGEMENT USING CONTENT ADDRESSABLE MEMORY
A memory system includes a memory device and a processing device operatively coupled with the memory device. The processing device perform operations comprising: responsive to receiving a memory access command, determining that the memory access command is a dual-address command comprising a source address and a destination address; generating a first content addressable memory (CAM) entry associated with a read command of the dual-address command, wherein the first CAM entry references the source address; generating a second CAM entry associated with a write command of the dual-address command, wherein the second CAM entry references the destination address; inserting the first CAM entry and the second CAM entry into a CAM; and issuing, to the memory device, the read command associated with the first CAM entry.
DUAL-ADDRESS COMMAND MANAGEMENT USING CONTENT ADDRESSABLE MEMORY
A memory system includes a memory device and a processing device operatively coupled with the memory device. The processing device perform operations comprising: responsive to receiving a memory access command, determining that the memory access command is a dual-address command comprising a source address and a destination address; generating a first content addressable memory (CAM) entry associated with a read command of the dual-address command, wherein the first CAM entry references the source address; generating a second CAM entry associated with a write command of the dual-address command, wherein the second CAM entry references the destination address; inserting the first CAM entry and the second CAM entry into a CAM; and issuing, to the memory device, the read command associated with the first CAM entry.