An apparatus for performing thermal testing of a memory device and a method of thermally testing the memory device. The apparatus includes a tester; an interface board disposed over the tester and configured to receive the semiconductor device and connect the semiconductor device to the tester; a shield disposed over the interface board and including a recess; a gas-supplying unit including a conduit extending through the shield and accessible to the recess; a temperature-sensing device disposed within the recess; and a controller configured to control and communicate with the tester, the gas-supplying unit and the temperature-sensing device.

A semiconductor memory training method includes: selecting two adjacent reference voltages from a plurality of reference voltages as a first reference voltage and a second reference voltage; obtaining a first minimum margin value for the plurality of target signal lines under the first reference voltage; obtaining a second minimum margin value for the plurality of target signal lines under the second reference voltage, according to a minimum margin value for each target signal line under the second reference voltage; determining a target interval for an expected margin value according to the first minimum margin value and the second minimum margin value, the expected margin value being the maximum one among the minimum margin values for the plurality of target signal lines under the plurality of reference voltages; and searching for the expected margin value in the target interval.

An improved chip interface circuit and chip are disclosed. The circuit includes: a voltage divider circuit, including a first resistor, a second resistor and a switch; an input gate circuit, including a MOS transistor P1 and a MOS transistor N1; one end of the first resistor is connected to the input terminal, and the drains of P1 and N1 are connected to the first terminal, wherein the first terminal is used to connect the main circuit of the chip, and the switch is turned on when the input terminal receives a high-voltage input voltage. The circuit uses low-voltage transistors combined with a voltage divider circuit to realize the chip interface circuit, thereby achieving good interface speed characteristics, and avoiding the problem that the chip cannot work normally when the operating voltage is low due to the high threshold voltage of the high-voltage transistor.

An improved chip interface circuit and chip are disclosed. The circuit includes: a voltage divider circuit, including a first resistor, a second resistor and a switch; an input gate circuit, including a MOS transistor P1 and a MOS transistor N1; one end of the first resistor is connected to the input terminal, and the drains of P1 and N1 are connected to the first terminal, wherein the first terminal is used to connect the main circuit of the chip, and the switch is turned on when the input terminal receives a high-voltage input voltage. The circuit uses low-voltage transistors combined with a voltage divider circuit to realize the chip interface circuit, thereby achieving good interface speed characteristics, and avoiding the problem that the chip cannot work normally when the operating voltage is low due to the high threshold voltage of the high-voltage transistor.

Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a multiple-name-space testing system comprises a load board, testing electronics, and a namespace testing tracker. The load board is configured to couple with a plurality of devices under test (DUTs). The testing electronics are configured to test the plurality of DUTs, wherein the testing electronics are coupled to the load board. The controller is configured to direct testing of multiple-name-spaces across the plurality of DUTs at least in part in parallel. The controller can be coupled to the testing electronics. The namespace testing tracker is configured to track testing of the plurality of DUTs, including the testing of the multiple-name-spaces across the plurality of DUTs at least in part in parallel. In one embodiment, the DUTs are NVMe SSD devices.

A system for outputting test data from cores to one communication interface. The system includes shared memories corresponding to the cores. Each shared memory includes a ring buffer and an array of slots. Each core generates a diagnostic message, and stores the generated diagnostic message in a select memory region of the ring buffer corresponding to a first empty slot of the array of slots. A selected core finds a first diagnostic message among diagnostic messages stored in the shared memories, and outputs the first diagnostic message to a personal computer through the communication interface.

A testing apparatus comprises a tester comprising a plurality of racks, wherein each rack comprises a plurality of slots, wherein each slot comprises: (a) an interface board affixed in a slot of a rack, wherein the interface board comprises test circuitry and a plurality of sockets, each socket operable to receive a device under test (DUT); and (b) a carrier comprising an array of DUTs, wherein the carrier is operable to displace into the slot of the rack; and (c) an array of POP memory devices, wherein each POP memory device is disposed adjacent to a respective DUT in the array of DUTs. Further, the testing apparatus comprises a pick-and-place mechanism for loading the array of DUTs into the carrier and an elevator for transporting the carrier to the slot of the rack.

Methods, systems, and devices for testing of multi-level signaling associated with a memory device are described. A tester may be used to test one or more operations of a memory device. The memory device may be configured to communicate data using a modulation scheme that includes three or more symbols. The tester may be configured to communicate data using a modulation scheme that includes three or fewer symbols. Techniques for testing the memory device using such a tester are described.

A memory controller may include: a request checker identifying memory devices corresponding to requests received from a host among the plurality of memory devices and generating device information on the identified memory devices to perform operations corresponding to the requests; a dummy manager outputting a request for controlling a dummy pulse to be applied to channels of selected memory devices according to the device information among the plurality of channels; and a dummy pulse generator sequentially applying the dummy pulse to the channels coupled to the selected memory devices, based on the request for controlling the dummy pulse. A memory controller may include an idle time monitor outputting an idle time interval of the memory device and a clock signal generator generating a clock signal based on the idle time interval and outputting the clock signal to the memory device through the channel to perform a current operation.

A communication apparatus comprises a CAM, an action determination unit, and a CAM diagnosis unit. The CAM includes, a plurality of entries each storing therein at least a portion of header information of frame, and a search circuit for each entry configured to determine whether or not a search key matches data stored at the entry. The search key is correlated with information indicating whether or not an entry matching the search key and an expected value of a search result including identification information of an entry matching the search key. The CAM diagnosis unit causes the CAM to search for an entry matching the search key. The CAM diagnosis unit diagnoses a failure occurring at the search circuit of an entry to be the test object when the result of the search does not match the expected value of a search result correlated to the search key.