Patent classifications
G21K2004/06
Scintillator array, method of manufacturing scintillator array, radiation detector, and radiation inspection device
A scintillator array includes a first scintillator element, a second scintillator element, and a reflector provided between the first and second scintillator elements and having a width of 80 m or less therebetween. Each scintillator element includes a polycrystal containing a rare earth oxysulfide phosphor, the polycrystal having a radiation incident surface of 1 mm or less1 mm or less in area. An average crystal grain diameter of the polycrystal is not less than 5 m nor more than 30 m, the average crystal grain diameter being defined by an average intercept length of crystal grains in an observation image of the polycrystal with a scanning electron microscope. A maximum length or a maximum diameter of defects on the polycrystal is 40 m or less.
SCINTILLATOR PANEL, AND RADIATION DETECTOR
A scintillator panel includes a substrate, a resin protective layer formed on the substrate and made of an organic material, a barrier layer formed on the resin protective layer and including thallium iodide as a main component, and a scintillator layer formed on the barrier layer and including cesium iodide with thallium added thereto as a main component. According to this scintillator panel, moisture resistance can be improved due to the barrier layer provided therein.
METHOD OF FORMING A SCINTILLATION CRYSTAL AND A RADIATION DETECTION APPARATUS INCLUDING A SCINTILLATION CRYSTAL INCLUDING A RARE EARTH HALIDE
A scintillation crystal can include Ln.sub.(1-y)RE.sub.yX.sub.3, wherein Ln represents a rare earth element, RE represents a different rare earth element, y has a value in a range of 0 to 1, and X represents a halogen. In an embodiment, the scintillation crystal is doped with a Group 1 element, a Group 2 element, or a mixture thereof, and the scintillation crystal is formed from a melt having a concentration of such elements or mixture thereof of at least approximately 0.02 wt. %. In another embodiment, the scintillation crystal can have unexpectedly improved proportionality and unexpectedly improved energy resolution properties. In a further embodiment, a radiation detection apparatus can include the scintillation crystal, a photosensor, and an electronics device. Such a radiation detection apparatus can be useful in a variety of applications.
Radiological image conversion panel, method of manufacturing the same, and radiological image detection apparatus
A radiological image conversion panel 2 is provided with a phosphor 18 containing a fluorescent material that emits fluorescence by radiation exposure, in which the phosphor includes, a columnar section 34 formed by a group of columnar crystals which are obtained through columnar growth of crystals of the fluorescent material, and a non-columnar section 36, the columnar section and the non-columnar section are integrally formed to overlap in a crystal growth direction of the columnar crystals, and a thickness of the non-columnar section along the crystal growth direction is non-uniform in a region of at least a part of the non-columnar section.
Radiological image conversion screen and flat panel detector
An object of the present invention is to provide a radiological image conversion screen where the flexibility and the storage stability of the radiological image conversion screen are sufficiently kept without phthalic acid ester while conventional sensitivity and sharpness being maintained, and another object thereof is to provide a radiological image conversion screen where a plasticizer in a phosphor layer is suppressed from volatilization and from transfer to other layers and/or films. The objects are solved by a radiological image conversion screen comprising a support substrate and a phosphor layer stacked on the support substrate, wherein the phosphor layer comprises phosphor particles, a polyvinyl acetal resin, and a carboxylic acid ester having an ether group.
RADIATION DETECTOR, RADIATION DETECTOR MANUFACTURING METHOD, AND SCINTILLATOR PANEL UNIT
A radiation detector includes a sensor panel having a light receiving surface, a first scintillator panel and a second scintillator panel disposed on the light receiving surface in a state of being adjacent to each other along the light receiving surface, and a moisture-proof layer. The first scintillator panel has a first substrate and a first scintillator layer including a plurality of columnar crystals. The second scintillator panel has a second substrate and a second scintillator layer including a plurality of columnar crystals. The first scintillator layer reaches at least a first portion of the first substrate. The second scintillator layer reaches at least a second portion of the second substrate. The moisture-proof layer is provided continuous over the first scintillator panel and the second scintillator panel.
Method of forming a scintillation crystal and a radiation detection apparatus including a scintillation crystal including a rare earth halide
A scintillation crystal can include Ln.sub.(1-y)RE.sub.yX.sub.3, wherein Ln represents a rare earth element, RE represents a different rare earth element, y has a value in a range of 0 to 1, and X represents a halogen. In an embodiment, the scintillation crystal is doped with a Group 1 element, a Group 2 element, or a mixture thereof, and the scintillation crystal is formed from a melt having a concentration of such elements or mixture thereof of at least approximately 0.02 wt. %. In another embodiment, the scintillation crystal can have unexpectedly improved proportionality and unexpectedly improved energy resolution properties. In a further embodiment, a radiation detection apparatus can include the scintillation crystal, a photosensor, and an electronics device. Such a radiation detection apparatus can be useful in a variety of applications.
DETECTOR ARRANGEMENT FOR AN X-RAY PHASE CONTRAST SYSTEM AND METHOD FOR X-RAY CONTRAST IMAGING
The present invention relates to a detector arrangement for an X-ray phase contrast system (5), the detector arrangement (1) comprising: a scintillator (11); an optical grating (12); and a detector (13); wherein the optical grating (12) is arranged between the scintillator (11) and the detector (13); wherein the scintillator (11) converts X-ray radiation (2) into optical radiation (3); wherein the IN optical grating (12) is configured to be an analyzer grating being adapted to a phase-grating (21) of an X-ray phase contrast system (5); wherein the optical path between the optical grating (12) and the scintillator (11) is free of focussing elements for optical radiation. The present invention further relates to a method (100) for performing X-ray phase contrast imaging with a detector arrangement (1) mentioned above. The invention avoids the use of an X-ray absorption grating as G2 grating in an X-ray phase contrast interferometer system.
Scintillator panel, and radiation detector
A scintillator panel includes a substrate made of an organic material, a barrier layer formed on the substrate and including thallium iodide as a main component, and a scintillator layer formed on the barrier layer and including cesium iodide as a main component. According to this scintillator panel, moisture resistance can be improved by providing the barrier layer between the substrate and the scintillator layer.
SCINTILLATOR ARRAY, METHOD OF MANUFACTURING SCINTILLATOR ARRAY, RADIATION DETECTOR, AND RADIATION INSPECTION DEVICE
A scintillator array comprises: a first scintillator element; a second scintillator element; and a reflector provided between the first and second scintillator elements and having a width of 80 gm or less therebetween. Each scintillator element includes a polycrystal containing a rare earth oxysulfide phosphor, the polycrystal having a radiation incident surface of 1 mm or less1 mm or less in area. An average crystal grain diameter of the polycrystal is not less than 5 m nor more than 30 m, the average crystal grain diameter being defined by an average intercept length of crystal grains in an observation image of the polycrystal with a scanning electron microscope. A maximum length or a maximum diameter of defects on the polycrystal is 40 m or less.