Patent classifications
G21K5/10
Contactless infernal measurement device, contactless internal measurement method, and internal measurement result display system
Provided is a contactless internal measurement device including an electromagnetic wave irradiation unit that irradiates an electromagnetic wave to a measurement subject, and an electromagnetic wave receiver that detects the electromagnetic wave reflected by the measurement subject. The electromagnetic wave irradiation unit is disposed to reduce a polarization component of the electromagnetic wave detected by the electromagnetic wave receiver, the polarization component being the same as a polarization component of the electromagnetic wave irradiated by the electromagnetic wave irradiation unit.
COATING METHOD AND COATING FILM CURING APPARATUS
A coating method includes a coating step of applying coating material to a workpiece, and a curing step of curing the coating material by irradiating the applied coating material with an electron beam emitted from an electron beam irradiation unit, wherein in the curing step, a potential of the workpiece is higher than a potential of the electron beam irradiation unit.
ELECTRON BEAM STERILIZATION APPARATUS
One object is to provide an electron beam sterilization apparatus including: an inner-surface sterilization chamber (5) including an inner-surface electron beam application device; and a blocking chamber (6) for receiving a preform product (P) from the inner-surface sterilization chamber (5) and blocking X-rays produced by application of the electron beam. The blocking chamber (6) includes an upstream opening (62) and a downstream opening (63) formed therein, the preform product (P) being received through the upstream opening (62) and transferred through the downstream opening (63). The blocking chamber (6) includes: a gripper (74) for gripping the preform product (P); a sterilized rotation table (71) for conveying the gripped preform product (P) in a circular path; and a blocking wall (81) not in contact with the sterilized rotation table (71) and configured to block the X-rays.
ELECTRON BEAM STERILIZATION APPARATUS
One object is to provide an electron beam sterilization apparatus including: an inner-surface sterilization chamber (5) including an inner-surface electron beam application device; and a blocking chamber (6) for receiving a preform product (P) from the inner-surface sterilization chamber (5) and blocking X-rays produced by application of the electron beam. The blocking chamber (6) includes an upstream opening (62) and a downstream opening (63) formed therein, the preform product (P) being received through the upstream opening (62) and transferred through the downstream opening (63). The blocking chamber (6) includes: a gripper (74) for gripping the preform product (P); a sterilized rotation table (71) for conveying the gripped preform product (P) in a circular path; and a blocking wall (81) not in contact with the sterilized rotation table (71) and configured to block the X-rays.
Testing assembly including a multiple degree of freedom stage
A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
Testing assembly including a multiple degree of freedom stage
A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
Particle beam transport apparatus
The present invention is related to an apparatus for transporting a charged particle beam. The apparatus may include means for scanning the charged particle beam on a target, a dipole magnet arranged upstream of the means for scanning, at least three quadrupole lenses arranged between the dipole magnet and the means for scanning and means for adjusting the field strength of said at least three quadrupole lenses in function of the scanning angle of the charged particle beam. The apparatus can be made at least single achromatic.
Particle beam transport apparatus
The present invention is related to an apparatus for transporting a charged particle beam. The apparatus may include means for scanning the charged particle beam on a target, a dipole magnet arranged upstream of the means for scanning, at least three quadrupole lenses arranged between the dipole magnet and the means for scanning and means for adjusting the field strength of said at least three quadrupole lenses in function of the scanning angle of the charged particle beam. The apparatus can be made at least single achromatic.
Sample holder, charged particle beam apparatus, and observation method
An object of the present invention is to provide a sample holder that can carry out a series of observations in which a rotational series image at arbitrary angles, namely, from −180° to +180° around the x-axis of an observation region and a rotational series image at arbitrary angles, namely, from −180° to +180° around the y-axis are obtained without taking a sample out of a sample chamber. A sample holder includes a power unit, a power separator, a rotational movement transmission mechanism, and a linear movement transmission mechanism. The power separator separates one movement of the power unit to be distributed to the rotational movement transmission mechanism and the linear movement transmission mechanism. The rotational movement transmission mechanism provides a rotational movement around a second rotational axis. The linear movement transmission mechanism provides a linear movement around the second rotational axis.
Method and device for sterilizing packaging material
The invention relates to a method for sterilizing packaging material, comprising an emitter that is adapted to emit charge carriers, in particular electrons, wherein the charge carriers form at least one cloud, and wherein the emitter and the packaging material are moved relative to each other so that a flow of a gaseous medium is established in between the emitter and the packaging material. The method comprises the steps of: controlling a movement profile between the emitter and the packaging material; sterilizing the flow of the medium in between the emitter and the packaging material by adjusting the movement profile so that the flow of the medium in between the emitter and the packaging material is sterilized. Also disclosed is a device for sterilizing packaging material.