Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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5/00
Measuring arrangements characterised by the use of mechanical techniques
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G01B5/0002
Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
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G01B5/0009
Guiding surfaces; Arrangements compensating for non-linearity there-of
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