G01B5/0014

Structured light projector

A structured light projector and a method for structured light projection are disclosed. The structured light projector includes a projection module, a processor. The projection module is configured to project an optical pattern onto a region of space, and includes a light source, a diffractive optical element and a liquid crystal lens. The light source is configured to generate a light beam. The diffractive optical element is configured to convert the light beam into the optical pattern. The liquid crystal lens is interposed between the light source and the diffractive optical element, and is configured to collimate the light beam. The processor is configured to generate a control signal depending on an environment temperature of the projection module for controlling the liquid crystal lens.

Measurement system with heat measurement
11835335 · 2023-12-05 · ·

A measurement system using heat compensation profiles for compensating inaccuracies caused by heat distortion is disclosed. Measurement of objects with different heat distribution involves use of heat compensation profiles with corresponding heat distribution. The heat compensation profile comprises a set of compensation coefficients that represent the deviation of the object having a heat distribution according to the heat compensation profile and the cooled down object. When the compensation coefficients are applied to the measured object the resulting measures correspond with the measurement results of the object after the object has been cooled.

Defect judging unit of measuring probe and defect judging method thereof

Provided is a defect judging unit for a measuring probe including: a stylus; four detection elements; and a signal processing part. The defect judging unit includes a defect judging part configured to compare four judged signals corresponding to the generated signals with predetermined thresholds when the object to be measured and the contact part are out of contact with each other and judge that a defect exists if any of the judged signals is greater than the predetermined threshold, and a judged result output part configured to output a judged result of the defect judging part. According to this configuration, the defect judging unit of the measuring probe and the defect judging method thereof capable of ensuring measurement reliability with a simple configuration are provided.

OUTPUT SIGNAL PROCESSING APPARATUS FOR EDDY CURRENT SENSOR

An eddy current sensor has an exciting coil and a detection coil. A holding circuit holds reference data indicating a characteristic of an output signal output from the detection coil at a reference state and outputs the reference data at a state other than the reference state. A pseudo signal generating circuit generates and outputs a balance coil pseudo signal corresponding to the output signal output from the detection coil at the reference state from the reference data output from the holding circuit. A bridge circuit, at the state other than the reference state, receives the output signal output from the detection coil and the balance coil pseudo signal and outputs a bridge output signal corresponding to a difference between the output signal and the balance coil pseudo signal as a bridge output signal.

Methods and apparatus for optimizing image acquisition of objects subject to illumination patterns

The techniques described herein relate to methods, apparatus, and computer readable media configured to determine parameters for image acquisition. One or more image sensors are each arranged to capture a set of images of a scene, and each image sensor comprises a set of adjustable imaging parameters. A projector is configured to project a moving pattern on the scene, wherein the projector comprises a set of adjustable projector parameters. The set of adjustable projector parameters and the set of adjustable imaging parameters are determined, based on a set of one or more constraints, to reduce noise in 3D data generated based on the set of images.

METHODS AND APPARATUS FOR COMPENSATING FOR THERMAL EXPANSION DURING ADDITIVE MANUFACTURING
20210331460 · 2021-10-28 · ·

Embodiments of the present disclosure are drawn to additive manufacturing apparatus and methods. An exemplary additive manufacturing method may include forming a part using additive manufacturing. The method may also include bringing the part to a first temperature, measuring the part along at least three axes at the first temperature, bringing the part to a second temperature, different than the first temperature, and measuring the part along the at least three axes at the second temperature. The method may further include comparing the size of the part at the first and second temperatures to calculate a coefficient of thermal expansion, generating a tool path that compensates for the coefficient of thermal expansion, bringing the part to the first temperature, and trimming the part while the part is at the first temperature using the tool path.

COMPONENT FOR HUMAN-POWERED VEHICLE
20210331760 · 2021-10-28 ·

A component is provided for a human-powered vehicle. The component includes a component body, a single substrate, a resistor, an electric wire, a signal processing unit, a signal output, and an electric power input. The single substrate is provided on the component body. The resistor is formed on the single substrate and forms a strain gauge with part of the single substrate. The electric wire is formed on the single substrate and electrically connected to the resistor. The signal processing unit is formed or directly mounted on the single substrate and electrically connected to the electric wire. The signal output outputs a signal from the signal processing unit. The electric power input is electrically connected to the signal processing unit and supplied with electric power from a power supply provided on at least one of the human-powered vehicle and the component body.

ASSEMBLY FOR POSITION MEASUREMENT
20210318109 · 2021-10-14 ·

An assembly comprises a support including a plurality of individual sections. A scale is disposed on the support. The scale extends in a longitudinal direction and has a measuring graduation for position measurement at least in the longitudinal direction. A plurality of fastening devices are configured to fasten the scale to the support. The fastening devices are disposed on the individual sections of the support.

OPTICAL MEASURING METHOD AND OPTICAL MEASURING DEVICE
20210298884 · 2021-09-30 · ·

The invention relates to an optical measuring method for three-dimensionally capturing the surface of an object by means of an optical capturing unit, wherein the optical capturing unit is moved relative to the object during a first measurement time period, the object is illuminated by the capturing unit with an illumination beam having a light intensity, height images are captured by the capturing unit in succession at a capturing frequency, at least some of the captured height images during the measurement tune period are added to form a total height image and the total height image is displayed, and the light intensity and/or the capturing frequency are controlled during the measurement time period by control signals, the control signals being produced at time intervals during the measurement time period and each control signal being produced on the basis of at least one sensor signal of a temperature sensor.

OPTICAL MEASURING METHOD AND OPTICAL MEASURING APPARATUS
20210267461 · 2021-09-02 · ·

The invention relates to an optical measuring method for the three-dimensional detection of the surface of an object using an optical recording unit. The optical recording unit is moved relative to the object during a first measurement time interval, height maps are successively detected by the recording unit at a recording frequency, and at least some of the detected height maps are each added to an overall height map and displayed. The recording frequency is regulated by control signals during the measurement time interval. The control signals are generated spaced apart in time and for the purposes of producing each control signal, a statistic for the quality of the height map is determined for the respectively last detected height image and used for producing the control signal. The statistic is the overall intensity and/or the maximum intensity and/or the contrast and/or the number of extracted data points and/or a quality of extracted data points and/or the signal-to-noise ratio and/or the contrast of an additionally generated color image.