The present invention discloses a flexible method and apparatus for thickness measurement. The apparatus includes seven parts: a measurement host, an etalon, a tested piece, a test piece positioning support, a driver, and a digital controller. The measurement host includes a rack, a coding lead screw, and a dual-acting cantilever sensor. The coding lead screw includes a micro-metering lead screw and a tri-state encoder. The tri-state encoder includes a fluted disc and four pairs of cantilever sensors. The dual-acting cantilever sensor includes left and right mobile cantilever sensors with a pair of clipping pin. The digital controller contains system measurement software.

A sheet property measurement device includes: an insertion portion into which a sheet to be inserted; a reading sensor configured to read a surface of the sheet inserted into the insertion portion; and a controller. The controller is configured to: measure a property of the surface of the sheet based on a plurality of reading results given by the reading sensor; and output a measurement error in a case where all the plurality of reading results given by the reading sensor do not change from a reading result given at one location on the surface of the sheet in an insertion direction of inserting the sheet.

A sheet property measurement device includes: an insertion portion into which a sheet to be inserted; a reading sensor configured to read a surface of the sheet inserted into the insertion portion; and a controller. The controller is configured to: measure a property of the surface of the sheet based on a plurality of reading results given by the reading sensor; and output a measurement error in a case where all the plurality of reading results given by the reading sensor do not change from a reading result given at one location on the surface of the sheet in an insertion direction of inserting the sheet.

An apparatus to grade a surface is provided. The apparatus includes an elongated member with a straight edge to grade a surface. In addition, the apparatus includes a height gauge to attach to an end of the elongated member. The height gauge is to engage a border of the surface. Furthermore, the apparatus includes a connector to connect the height gauge to the elongated member. The apparatus also includes a first surface on the height gauge. The first surface is to engage a side wall of the border to grade the surface proximate to the side wall. The apparatus further includes a second surface on the height gauge offset from the straight edge by a distance. The second surface is to engage a top surface of the border such that the straight edge is to grade the surface at the distance below the top of the border.

An inspection system can include a handheld inspection device having a meter portion comprising at least two different paint meters, at least one display, at least one processor configured to present paint measuring locations on an inspected object on the at least one display, and communication circuits configured to transmit inspection data generated by meter portion. Based on inspection results, a value of the inspected object can be automatically adjusted. A database can store inspection data for large numbers of objects, and track locations of objects. Corresponding methods are also disclosed.

The invention relates to an apparatus for providing marks on extruded films, in particular on stretched films, which are exiting an extrusion lip of a film extruder and a respective method. The apparatus comprises at least one nozzle means for directing a gas stream, preferably an air stream to a surface of the film exiting the extrusion lip of the film extruder, wherein the nozzle means are configured and arranged in such a manner that the gas stream locally causes a cooling of the extruded film to create a local mark.

A method can include identifying an inspected object with an inspection device; viewing the inspected object through an augmented reality device to identify points; and measuring a thickness of a layer at the inspection points. In response to detecting a region of interest on the surface of the inspected object, an image of the region of interest can be taken. By operation of communication circuits, at least the thickness measurements and images can be transmitted to a server system. A value of the inspected object can be adjusted based on at least the thickness measurements and images from the at least one inspection device. Corresponding devices and systems are also disclosed.

A carrier measuring device includes a rotary table, a table drive motor, an upper thickness sensor, a lower thickness sensor and a slide unit. The rotary table includes a carrier receiver configured to horizontally house a carrier formed with a hole in which a semiconductor wafer is held, the hole being eccentric with respect to the carrier. The table drive motor rotates the rotary table around a center axis thereof as a rotation axis. The upper thickness sensor and the lower thickness sensor are positioned above and below the carrier, respectively, and measure a thickness of the carrier in a non-contact manner. The slide unit slides the rotary table in a horizontal direction. The carrier receiver is formed to be capable of housing the carrier in a manner that a center of the hole coincides with a center of the rotary table.

A carrier measuring device includes a rotary table, a table drive motor, an upper thickness sensor, a lower thickness sensor and a slide unit. The rotary table includes a carrier receiver configured to horizontally house a carrier formed with a hole in which a semiconductor wafer is held, the hole being eccentric with respect to the carrier. The table drive motor rotates the rotary table around a center axis thereof as a rotation axis. The upper thickness sensor and the lower thickness sensor are positioned above and below the carrier, respectively, and measure a thickness of the carrier in a non-contact manner. The slide unit slides the rotary table in a horizontal direction. The carrier receiver is formed to be capable of housing the carrier in a manner that a center of the hole coincides with a center of the rotary table.

Disclosed herein is a gauge for slurry coating thickness determination. The gauge includes a body and at least three probes extending from the body. The at least three probes provide a go-no-go indicator including a first demarcation that defines a minimum slurry coating thickness and a second demarcation that defines a maximum slurry coating thickness. A minimum no-go region is defined between the first demarcation and a probe tip, a maximum no-go region is defined between the second demarcation and the body, and a go region is defined between the first demarcation and the second demarcation.